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Lattice-resolution contrast from a focused coherent electron probe. Part I

Ultramicroscopy, 2003-07, Vol.96 (1), p.47-63

2003

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Determining the site occupancy of Ru in the L12 phase of a Ni-base superalloy using ALCHEMI

Acta materialia, 2005-01, Vol.53 (1), p.97-110

2005

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Lattice-resolution contrast from a focused coherent electron probe. Part II

Ultramicroscopy, 2003-07, Vol.96 (1), p.65-81

2003

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Channelling and atomic resolution STEM using X-ray emissions with absorption

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1077-1078

Rossouw, C.J.

2015

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Imaging elastic strains in high-angle annular dark field scanning transmission electron microscopy

Ultramicroscopy, 1993-12, Vol.52 (3), p.353-359

1993

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Determining the site occupancy of Ru in the L1{sub 2} phase of a Ni-base superalloy using ALCHEMI

Acta materialia, 2005-01, Vol.53 (1)

2005

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Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions

Micron (Oxford, England : 1993), 1997-04, Vol.28 (2), p.125-137

1997

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Channelling effects in atomic resolution STEM

Ultramicroscopy, 2003-09, Vol.96 (3), p.299-312

2003

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HOLZ line analysis of lattice parameters in magnesium alloys

Journal of Electron Microscopy, 2001-01, Vol.50 (5), p.391-404

2001

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Determining the site occupancy of Ru in the L1 2 phase of a Ni-base superalloy using ALCHEMI

Acta materialia, 2005, Vol.53 (1), p.97-110

2005

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Dynamical LACBED analysis of Si/SiGe and Si/SiB multilayer structures

Ultramicroscopy, 1993, Vol.48 (1), p.49-61

1993

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CBED contrast in the lower order Laue zone

Ultramicroscopy, 2006-03, Vol.106 (4), p.439-448

2006

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A treatment of dynamical diffraction for multiply layered structures

Ultramicroscopy, 1991-06, Vol.35 (3), p.229-236

1991

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Location of interstitial Cr in mullite by incoherent channeling patterns from characteristic X-ray emission

The American mineralogist, 1999-05, Vol.84 (5), p.965-969

1999

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Polarity determination of epitaxial structures of CdTe on GaAs by channeling techniques

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-01, Vol.45 (1), p.459-463

1990

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Correction terms and approximations for atom location by channelling enhanced microanalysis

Ultramicroscopy, 1999-10, Vol.80 (2), p.109-124

1999

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Diffraction contrast retained by plasmon and K-loss electrons

Ultramicroscopy, 1981, Vol.6 (1), p.53-66

1981

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Incoherent contrast under dynamical diffraction conditions

Ultramicroscopy, 1995-05, Vol.58 (2), p.211-222

Rossouw, C.J.

1995

Volltextzugriff (PDF)

Characterization of a GaAs/HgCdTe interface formed by MOCVD

Journal of crystal growth, 1988, Vol.93 (1-4), p.937-938

1988

Volltextzugriff (PDF)

Detection of Au precipitates in a Mg-based alloy using electronically simulated hollow cone illumination

Micron (Oxford, England : 1993), 2000-12, Vol.31 (6), p.651-657

2000

Volltextzugriff (PDF)

Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys

Ultramicroscopy, 1996-12, Vol.66 (3-4), p.193-209

1996

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Transmission resonance diffraction and low impact parameter inelastic scattering of high-energy electrons

Ultramicroscopy, 1998-04, Vol.72 (1), p.17-29

1998

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Interaction delocalization in characteristic X-ray emission from light elements

Ultramicroscopy, 1994, Vol.55 (3), p.258-267

1994

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Crystal potential determination by inversion for centrosymmetric crystals

Ultramicroscopy, 1993-03, Vol.48 (3), p.341-346

1993

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Effects of energy filtering in LACBED patterns

Ultramicroscopy, 1991, Vol.35 (3), p.237-243

1991

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Lattice-resolution contrast from a focused coherent electron probe. Part I

Determining the site occupancy of Ru in the L12 phase of a Ni-base superalloy using ALCHEMI

Lattice-resolution contrast from a focused coherent electron probe. Part II

Channelling and atomic resolution STEM using X-ray emissions with absorption

Imaging elastic strains in high-angle annular dark field scanning transmission electron microscopy

Determining the site occupancy of Ru in the L1{sub 2} phase of a Ni-base superalloy using ALCHEMI

Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions

Channelling effects in atomic resolution STEM

HOLZ line analysis of lattice parameters in magnesium alloys

Determining the site occupancy of Ru in the L1 2 phase of a Ni-base superalloy using ALCHEMI

Dynamical LACBED analysis of Si/SiGe and Si/SiB multilayer structures

CBED contrast in the lower order Laue zone

A treatment of dynamical diffraction for multiply layered structures

Location of interstitial Cr in mullite by incoherent channeling patterns from characteristic X-ray emission

Polarity determination of epitaxial structures of CdTe on GaAs by channeling techniques

Correction terms and approximations for atom location by channelling enhanced microanalysis

Diffraction contrast retained by plasmon and K-loss electrons

Incoherent contrast under dynamical diffraction conditions

Characterization of a GaAs/HgCdTe interface formed by MOCVD

Detection of Au precipitates in a Mg-based alloy using electronically simulated hollow cone illumination

Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys

Transmission resonance diffraction and low impact parameter inelastic scattering of high-energy electrons

Interaction delocalization in characteristic X-ray emission from light elements

Crystal potential determination by inversion for centrosymmetric crystals

Effects of energy filtering in LACBED patterns

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