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Two-dimensional charge carrier distribution in MoS2 monolayer and multilayers

Applied physics letters, 2019-03, Vol.114 (10)

2019

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Negative space charge effects in photon-enhanced thermionic emission solar converters

Applied physics letters, 2015-07, Vol.107 (1)

2015

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High-Temperature Sensitivity of a Depletion-Mode AlGaN/GaN MIS-HEMT

IEEE transactions on electron devices, 2021-11, Vol.68 (11), p.5695-5700

2021

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Fermi level pinning by gap states in organic semiconductors

Physical review letters, 2013-01, Vol.110 (3), p.036803-036803, Article 036803

2013

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Kelvin probe force microscopy of semiconductor surface defects

Physical review. B, Condensed matter and materials physics, 2004-08, Vol.70 (8), p.085320.1-085320.7, Article 085320

2004

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Efficient Temperature Sensor Based on SOI Gate-All-Around Electrostatically Formed Nanowire Transistor

IEEE transactions on electron devices, 2019-08, Vol.66 (8), p.3549-3553

2019

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Dynamic and Power Performance of Multiple State Electrostatically Formed Nanowire Transistors

IEEE transactions on electron devices, 2017-02, Vol.64 (2), p.571-578

2017

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Direct measurement of density of states in pentacene thin film transistors

Physical review. B, Condensed matter and materials physics, 2011-10, Vol.84 (16), Article 165124

2011

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Reconstruction of electrostatic force microscopy images

Review of scientific instruments, 2005-08, Vol.76 (8), p.083705-083705-5

2005

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Fabrication of a Photoelectronic Device by Direct Chemical Binding of the Photosynthetic Reaction Center Protein to Metal Surfaces

Advanced materials (Weinheim), 2005-10, Vol.17 (20), p.2434-2437

2005

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Multiple State Electrostatically Formed Nanowire Transistors

IEEE electron device letters, 2015-07, Vol.36 (7), p.651-653

2015

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Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

Applied physics letters, 2009-08, Vol.95 (9), p.092105-092105-3

2009

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Obtaining Uniform Dopant Distributions in VLS-Grown Si Nanowires

Nano letters, 2011-01, Vol.11 (1), p.183-187

2011

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Minority carrier recombination of ordered Ga0.51In0.49P at high temperatures

Applied physics letters, 2016-11, Vol.109 (22)

2016

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Reconstruction of surface potential from Kelvin probe force microscopy images

Nanotechnology, 2013-07, Vol.24 (29), p.295702-295702

2013

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Ferroelectric domain inversion: The role of humidity

Applied physics letters, 2006-10, Vol.89 (15), p.152902-152902-3

2006

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Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution

Physical review letters, 2005-12, Vol.95 (25), p.256405.1-256405.4, Article 256405

2005

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Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

Applied physics letters, 2003-01, Vol.82 (1), p.103-105

2003

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Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2

Thin solid films, 2011-08, Vol.519 (21), p.7341-7346

2011

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Direct Measurement of Individual Deep Traps in Single Silicon Nanowires

Nano letters, 2011-06, Vol.11 (6), p.2499-2502

2011

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Electronic Properties of Doped Molecular Thin Films Measured by Kelvin Probe Force Microscopy

The journal of physical chemistry. B, 2006-12, Vol.110 (50), p.25521-25524

2006

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Secondary electron doping contrast: Theory based on scanning electron microscope and Kelvin probe force microscopy measurements

Journal of applied physics, 2010-01, Vol.107 (1), p.014510-014510-7

2010

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Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy

Surface science, 2005-01, Vol.574 (2), p.L35-L39

2005

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Electrical depth profiling in thin SiON layers

Applied physics letters, 2009-02, Vol.94 (5), p.053116-053116-3

2009

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Electronic Characterization of Si(100)-Bound Alkyl Monolayers Using Kelvin Probe Force Microscopy

Journal of physical chemistry. C, 2008-05, Vol.112 (18), p.7145-7150

2008

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Two-dimensional charge carrier distribution in MoS2 monolayer and multilayers

Negative space charge effects in photon-enhanced thermionic emission solar converters

High-Temperature Sensitivity of a Depletion-Mode AlGaN/GaN MIS-HEMT

Fermi level pinning by gap states in organic semiconductors

Kelvin probe force microscopy of semiconductor surface defects

Efficient Temperature Sensor Based on SOI Gate-All-Around Electrostatically Formed Nanowire Transistor

Dynamic and Power Performance of Multiple State Electrostatically Formed Nanowire Transistors

Direct measurement of density of states in pentacene thin film transistors

Reconstruction of electrostatic force microscopy images

Fabrication of a Photoelectronic Device by Direct Chemical Binding of the Photosynthetic Reaction Center Protein to Metal Surfaces

Multiple State Electrostatically Formed Nanowire Transistors

Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

Obtaining Uniform Dopant Distributions in VLS-Grown Si Nanowires

Minority carrier recombination of ordered Ga0.51In0.49P at high temperatures

Reconstruction of surface potential from Kelvin probe force microscopy images

Ferroelectric domain inversion: The role of humidity

Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution

Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2

Direct Measurement of Individual Deep Traps in Single Silicon Nanowires

Electronic Properties of Doped Molecular Thin Films Measured by Kelvin Probe Force Microscopy

Secondary electron doping contrast: Theory based on scanning electron microscope and Kelvin probe force microscopy measurements

Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy

Electrical depth profiling in thin SiON layers

Electronic Characterization of Si(100)-Bound Alkyl Monolayers Using Kelvin Probe Force Microscopy

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