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Profiling of deep traps in silicon oxide–nitride–oxide structures

Thin solid films, 2005, Vol.471 (1), p.166-169

2005

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Geminate and distant-pair radiative recombination in porous silicon

Journal of physics. Condensed matter, 1999-06, Vol.11 (24), p.4783-4800

1999

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Comparison of some properties of nanosized silicon clusters in porous glasses

Applied physics letters, 1998-06, Vol.72 (23), p.3005-3007

1998

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Properties of laser ablated porous silicon

Applied physics letters, 1996-11, Vol.69 (20), p.3048-3050

1996

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WITHDRAWN: Re-charging effects in silicon quantum dots

Journal of materials processing technology, 2007-11

2007

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Application of porous glasses for humidity control

Optical materials, 1996-03, Vol.5 (3), p.217-220

1996

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Diffraction gratings on porous silicon

Solid state communications, 1996-02, Vol.97 (7), p.591-593

1996

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Deep traps in oxide-nitride-oxide stacks fabricated from hydrogen and deuterium containing precursors

Journal of applied physics, 2006-01, Vol.99 (2), p.023702-023702-5

2006

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Radiation-stimulated diffusion in single memory cells

Radiation effects and defects in solids, 2011-07, Vol.166 (7), p.469-475

2011

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Exoelectron emission studies of trap spectrum in ultrathin amorphous Si3N4 films

Solid-state electronics, 2004-03, Vol.48 (3), p.477-482

2004

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Porous glasses for optical application

Optical materials, 1993, Vol.2 (4), p.249-255

1993

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Water Absorption and Mechanical Properties of Silica Porous Glasses

Journal of porous materials, 1997-09, Vol.4 (3), p.151-155

1997

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Exoelectron emission studies of trap spectrum in ultrathin amorphous Si 3N 4 films

Solid-state electronics, 2004, Vol.48 (3), p.477-482

2004

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Computer simulations and experimental study of retention of SONOS device

Journal of computational electronics, 2006-03, Vol.5 (1), p.49-52

2006

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Trap Spectroscopy in Si3N4 Ultrathin Films Using Exoelectron Emission Method

MRS proceedings, 2002, Vol.745, Article N5.21

2002

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Physical Properties of Organosilicate Porous Glasses

Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 1993-05, Vol.230 (1), p.197-201

1993

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On the 1/f noise in mis transistors

Physica status solidi. A, Applied research, 1970-10, Vol.3 (2), p.K97-K99

1970

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Thin insulating films [investigated] using the surface ionic charge technique

Thin solid films, 1992-01, Vol.207 (1-2), p.185-192

1992

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Investigation of thin insulating films using the surface ionic charge technique

Thin solid films, 1992-01, Vol.207 (1), p.185-192

1992

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Novel techniques of charge centroid evaluation in dielectric layers

Journal of electrostatics, 1993-05, Vol.30, p.355-361

1993

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Effect of heat treatment on the parameters of an interface in Si-SiO2 structures after irradiation

Semiconductors (Woodbury, N.Y.), 1993-08, Vol.27 (8), p.745-747

1993

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Structure, chemistry, and electrical performance of silicon oxide-nitride-oxide stacks on silicon

International Semiconductor Device Research Symposium, 2003, 2003, p.248-249

2003

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The conduction channels on MIS and MIM structure splits

Thin solid films, 1978-12, Vol.55 (2), p.169-178

1978

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Solid state electret microphones

Proceedings of 8th International Symposium on Electrets (ISE 8), 1994, p.997-1003

1994

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Acetyldigitoxin in clinical practice

La Semana medica, 1962-09, Vol.121, p.1288

1962

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Profiling of deep traps in silicon oxide–nitride–oxide structures

Geminate and distant-pair radiative recombination in porous silicon

Comparison of some properties of nanosized silicon clusters in porous glasses

Properties of laser ablated porous silicon

WITHDRAWN: Re-charging effects in silicon quantum dots

Application of porous glasses for humidity control

Diffraction gratings on porous silicon

Deep traps in oxide-nitride-oxide stacks fabricated from hydrogen and deuterium containing precursors

Radiation-stimulated diffusion in single memory cells

Exoelectron emission studies of trap spectrum in ultrathin amorphous Si3N4 films

Porous glasses for optical application

Water Absorption and Mechanical Properties of Silica Porous Glasses

Exoelectron emission studies of trap spectrum in ultrathin amorphous Si 3N 4 films

Computer simulations and experimental study of retention of SONOS device

Trap Spectroscopy in Si3N4 Ultrathin Films Using Exoelectron Emission Method

Physical Properties of Organosilicate Porous Glasses

On the 1/f noise in mis transistors

Thin insulating films [investigated] using the surface ionic charge technique

Investigation of thin insulating films using the surface ionic charge technique

Novel techniques of charge centroid evaluation in dielectric layers

Effect of heat treatment on the parameters of an interface in Si-SiO2 structures after irradiation

Structure, chemistry, and electrical performance of silicon oxide-nitride-oxide stacks on silicon

The conduction channels on MIS and MIM structure splits

Solid state electret microphones

Acetyldigitoxin in clinical practice

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