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Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516), 2004, p.273-277
2004
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- Applied Sciences
- Capacitance
- Circuit Properties
- Circuits
- Design. Technologies. Operation Analysis. Testing
- Diodes
- Electric, Optical And Optoelectronic Circuits
- Electronic Circuits
- Electronics
- Engineering
- Engineering, Electrical & Electronic
- Exact Sciences And Technology
- Inductance
- Instruments & Instrumentation
- Integrated Circuits
- Materials Science
- Materials Science, Characterization & Testing
- Oscillators, Resonators, Synthetizers
- Q Factor
- Radio Frequency