UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 28

Sortiert nach

In situ surface and interface study of crystalline (3×1)-O on InAs

Applied physics letters, 2016-07, Vol.109 (4)

2016

Link zum Volltext

Verfügbarkeit prüfen

A crystalline oxide passivation on In0.53Ga0.47As (100)

Journal of applied physics, 2017-03, Vol.121 (12)

2017

Link zum Volltext

Verfügbarkeit prüfen

A Multi-Bit Neuromorphic Weight Cell Using Ferroelectric FETs, suitable for SoC Integration

IEEE journal of the Electron Devices Society, 2018, Vol.6, p.438-448

2018

Link zum Volltext

Verfügbarkeit prüfen

Modeling Transient Negative Capacitance in Steep-Slope FeFETs

IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5157-5164

2018

Link zum Volltext
IEEE_Xplore

Lower limits of line resistance in nanocrystalline back end of line Cu interconnects

Applied physics letters, 2016-11, Vol.109 (19)

2016

Link zum Volltext

Verfügbarkeit prüfen

Band-to-Band Tunneling in Ge-Rich SiGe Devices

IEEE electron device letters, 2014-04, Vol.35 (4), p.473-475

2014

Link zum Volltext
IEEE_Xplore

Modulation of the Schottky Barrier Height for CMOS advanced contacts

Microelectronic engineering, 2016-04, Vol.156, p.82-85

2016

Link zum Volltext

Verfügbarkeit prüfen

A Variation Robust Inference Engine Based on STT-MRAM with Parallel Read-Out

2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020, p.1-5

2020

Link zum Volltext
IEEE_Xplore

Is electron transport in nanocrystalline Cu interconnects surface dominated or grain boundary dominated?

2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.114-116

2016

Link zum Volltext
IEEE_Xplore

Modulation of the Schottky barrier height for advanced contact schemes

2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.39-42

2015

Link zum Volltext
IEEE_Xplore

A novel tensile Si (n) and compressive SiGe (p) dual-channel CMOS FinFET co-integration scheme for 5nm logic applications and beyond

2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.28.1.1-28.1.4

2016

Link zum Volltext
IEEE_Xplore

Hot-carrier effects in Hydrogen-passivated p-channel polycrystalline-Si MOSFET's

IEEE transactions on electron devices, 1987-05, Vol.34 (5), p.1079-1083

1987

Link zum Volltext
IEEE_Xplore

On the Temperature Dependence of Resistivity of Polycrystalline Silicon Films

MRS proceedings, 1987, Vol.106, Article 77

1987

Link zum Volltext

Verfügbarkeit prüfen

Social studies of scholarly life with sensor-based ethnographic observations

Scientometrics, 2019-06, Vol.119 (3), p.1387-1428

2019

Link zum Volltext

Verfügbarkeit prüfen

A transistor performance figure-of-merit including the effect of gate resistance and its application to scaling to sub-0.25-μm CMOS logic technologies

IEEE transactions on electron devices, 1998-06, Vol.45 (6), p.1246-1252

1998

Link zum Volltext

Verfügbarkeit prüfen

On/off current ratio in P-channel poly-Si MOSFETs: dependence on hot-carrier stress conditions

IEEE electron device letters, 1990-08, Vol.11 (8), p.346-348

Rodder, M.

1990

Link zum Volltext
IEEE_Xplore

Integration of ALD high-k dipole layers into CMOS SOI nanowire FETs for bi-directional threshold voltage engineering

2020 IEEE Silicon Nanoelectronics Workshop (SNW), 2020, p.15-16

2020

Link zum Volltext
IEEE_Xplore

Raised source/drain MOSFET with dual sidewall spacers

IEEE electron device letters, 1991-03, Vol.12 (3), p.89-91

1991

Link zum Volltext
IEEE_Xplore

Increased resistance in p-type poly-Si resistors by thermal anneal reduction interface charge

IEEE electron device letters, 1991-04, Vol.12 (4), p.160-162

Rodder, M.

1991

Link zum Volltext
IEEE_Xplore

Modeling of nonhyperbolic sine I-V characteristics in poly-Si resistors

IEEE electron device letters, 1992-02, Vol.13 (2), p.74-76

Rodder, M.

1992

Link zum Volltext
IEEE_Xplore

Leakage-current-induced hot-carrier degradation of p-channel MOSFETs

IEEE electron device letters, 1988-11, Vol.9 (11), p.573-575

Rodder, M.

1988

Link zum Volltext
IEEE_Xplore

Effects of channel width and parasitic bipolar action on p-type poly-Si resistor characteristics

IEEE electron device letters, 1991-05, Vol.12 (5), p.241-243

Rodder, M.

1991

Link zum Volltext
IEEE_Xplore

Utilization of plasma hydrogenation in stacked SRAM's with poly-Si PMOSFET's and bulk-Si NMOSFET's

IEEE electron device letters, 1991-05, Vol.12 (5), p.233-235

1991

Link zum Volltext
IEEE_Xplore

Extraction of channel length and junction voltage in n+/n/n+ or n+/p/n+ polysilicon resistors

IEEE transactions on electron devices, 1992-08, Vol.39 (8), p.1968-1970

1992

Link zum Volltext

Verfügbarkeit prüfen

Rapid thermal hydrogen passivation of polysilicon MOSFETs

IEEE electron device letters, 1990-05, Vol.11 (5), p.194-196

1990

Link zum Volltext
IEEE_Xplore

1 – 25 von 28

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(19)
Mit Volltextzugriff
(26)

Publikationsform

Sprache

Englisch
(28)
Japanisch
(4)

Erscheinungsjahr

n.n

Thema

Science & Technology
(24)
Technology
(21)
Engineering
(20)
Engineering, Electrical & Electronic
(20)
Electronics
(11)
Applied Sciences
(10)
Exact Sciences And Technology
(10)
Transistors
(10)
Physical Sciences
(9)
Physics
(9)
Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
(9)
Physics, Applied
(8)
Silicon
(8)
Mosfets
(5)
Mos Devices
(4)
Mosfet Circuits
(4)
Random Access Memory
(4)
Resistors
(4)
Annealing
(3)
Crystal Structure
(3)

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

Ieee Electron Device Letters
(9)
Ieee Transactions On Electron Devices
(4)
Applied Physics Letters
(2)
Ieee Journal Of The Electron Devices Society
(1)
Journal Of Applied Physics
(1)
Microelectronic Engineering
(1)
Mrs Proceedings
(1)
Scientometrics
(1)

3 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

In situ surface and interface study of crystalline (3×1)-O on InAs

A crystalline oxide passivation on In0.53Ga0.47As (100)

A Multi-Bit Neuromorphic Weight Cell Using Ferroelectric FETs, suitable for SoC Integration

Modeling Transient Negative Capacitance in Steep-Slope FeFETs

Lower limits of line resistance in nanocrystalline back end of line Cu interconnects

Band-to-Band Tunneling in Ge-Rich SiGe Devices

Modulation of the Schottky Barrier Height for CMOS advanced contacts

A Variation Robust Inference Engine Based on STT-MRAM with Parallel Read-Out

Is electron transport in nanocrystalline Cu interconnects surface dominated or grain boundary dominated?

Modulation of the Schottky barrier height for advanced contact schemes

A novel tensile Si (n) and compressive SiGe (p) dual-channel CMOS FinFET co-integration scheme for 5nm logic applications and beyond

Hot-carrier effects in Hydrogen-passivated p-channel polycrystalline-Si MOSFET's

On the Temperature Dependence of Resistivity of Polycrystalline Silicon Films

Social studies of scholarly life with sensor-based ethnographic observations

A transistor performance figure-of-merit including the effect of gate resistance and its application to scaling to sub-0.25-μm CMOS logic technologies

On/off current ratio in P-channel poly-Si MOSFETs: dependence on hot-carrier stress conditions

Integration of ALD high-k dipole layers into CMOS SOI nanowire FETs for bi-directional threshold voltage engineering

Raised source/drain MOSFET with dual sidewall spacers

Increased resistance in p-type poly-Si resistors by thermal anneal reduction interface charge

Modeling of nonhyperbolic sine I-V characteristics in poly-Si resistors

Leakage-current-induced hot-carrier degradation of p-channel MOSFETs

Effects of channel width and parasitic bipolar action on p-type poly-Si resistor characteristics

Utilization of plasma hydrogenation in stacked SRAM's with poly-Si PMOSFET's and bulk-Si NMOSFET's

Extraction of channel length and junction voltage in n+/n/n+ or n+/p/n+ polysilicon resistors

Rapid thermal hydrogen passivation of polysilicon MOSFETs

Suchergebnisse filtern