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Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits

Applied physics letters, 2022-02, Vol.120 (7)

2022

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Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3427-3434

2004

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Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits

npj quantum information, 2022-03, Vol.8 (1), p.1-8, Article 31

2022

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Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

Journal of applied physics, 1999-09, Vol.86 (5), p.2516-2525

1999

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Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.2904-2914

2014

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New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2822-2829

2015

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Porosity in plasma enhanced chemical vapor deposited SiCOH dielectrics: A comparative study

Journal of applied physics, 2003-09, Vol.94 (5), p.3427-3435

2003

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An Evaluation of An Ultralow Background Alpha-Particle Detector

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3381-3386

2009

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Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3145-3151

2009

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Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3512-3517

2006

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Resistivity of copper interconnects beyond the 7 nm node

2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T120-T121

2015

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Underlayer effects on texture evolution in copper films

Thin solid films, 2006-05, Vol.503 (1-2), p.207-211

2006

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Studies of deformation-induced texture development in sheet materials using diffraction techniques

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2004-08, Vol.380 (1), p.155-170

2004

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Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2474-2479

2007

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The role of texture in the electromigration behavior of pure aluminum lines

Journal of applied physics, 1996-03, Vol.79 (5), p.2409-2417

1996

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Positron Annihilation Techniques Suited for Porosity Characterization of Thin Films

The journal of physical chemistry. B, 2003-03, Vol.107 (12), p.2725-2734

2003

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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3394-3400

2008

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Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001)

Thin solid films, 2004-11, Vol.466 (1), p.238-249

2004

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Detection of current-induced vacancies in thin aluminum–copper lines using positrons

Applied physics letters, 1996-01, Vol.68 (3), p.406-408

1996

Volltextzugriff (PDF)

Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node

IEEE electron device letters, 2013-06, Vol.34 (6), p.723-725

2013

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Single-Event Upsets in Microelectronics: Fundamental Physics and Issues

MRS bulletin, 2003-02, Vol.28 (2), p.111-116

2003

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32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2702-2710

2011

Volltextzugriff (PDF)

Texture in multilayer metallization structures

Journal of applied physics, 1994-09, Vol.76 (5), p.2671-2680

1994

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Nanometer-scale pores in low- k dielectric films probed by positron annihilation lifetime spectroscopy

Applied physics letters, 2002-12, Vol.81 (23), p.4413-4415

2002

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Texture in Ti/Al and Nb/Al multilayer thin films: Role of Cu

Journal of materials research, 2001-05, Vol.16 (5), p.1449-1459

2001

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Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits

Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground

Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits

Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

Porosity in plasma enhanced chemical vapor deposited SiCOH dielectrics: A comparative study

An Evaluation of An Ultralow Background Alpha-Particle Detector

Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

Resistivity of copper interconnects beyond the 7 nm node

Underlayer effects on texture evolution in copper films

Studies of deformation-induced texture development in sheet materials using diffraction techniques

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

The role of texture in the electromigration behavior of pure aluminum lines

Positron Annihilation Techniques Suited for Porosity Characterization of Thin Films

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001)

Detection of current-induced vacancies in thin aluminum–copper lines using positrons

Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node

Single-Event Upsets in Microelectronics: Fundamental Physics and Issues

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

Texture in multilayer metallization structures

Nanometer-scale pores in low- k dielectric films probed by positron annihilation lifetime spectroscopy

Texture in Ti/Al and Nb/Al multilayer thin films: Role of Cu

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