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Obésite, 2019-12, Vol.14 (4), p.163-177
2019
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Médecine des maladies métaboliques, 2019-12, Vol.13 (8), p.691-702
2019
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Perfectionnement en Pédiatrie, 2019-12, Vol.2 (4), p.263-269
2019
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Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET
2008
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IEEE electron device letters, 2008-08, Vol.29 (8), p.913-915
2008
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Leptospira exposure in the human environment in France: A survey in feral rodents and in fresh water
2009
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Retrovirology, 2012-09, Vol.9 (S2), p.P194-P194, Article P194
2012
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Retrovirology, 2009-10, Vol.6 (S3), p.P353-P353, Article P353
2009
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Comparative immunology, microbiology and infectious diseases, 2010-09, Vol.33 (5), p.375-387
2010
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Veterinary and comparative orthopaedics and traumatology, 2012-01, Vol.25 (5), p.359
2012
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IEEE electron device letters, 2008-06, Vol.29 (6), p.609-611
2008
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Comparative immunology, microbiology and infectious diseases, 2010, Vol.33 (5), p.375-387
2010
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2021 IEEE International Electron Devices Meeting (IEDM), 2021, p.23.4.1-23.4.4
- Steckel, J. S.
- Josse, E.
- Pattantyus-Abraham, A. G.
- Bidaud, M.
- Mortini, B.
- Bilgen, H.
- Arnaud, O.
- Allegret-Maret, S.
- Saguin, F.
- Mazet, L.
- Lhostis, S.
- Berger, T.
- Haxaire, K.
- Chapelon, L. L.
- Parmigiani, L.
- Gouraud, P.
- Brihoum, M.
- Bar, P.
- Guillermet, M.
- Favreau, S.
- Duru, R.
- Fantuz, J.
- Ricq, S.
- Ney, D.
- Hammad, I.
- Roy, D.
- Arnaud, A.
- Vianne, B.
- Nayak, G.
- Virollet, N.
- Farys, V.
- Malinge, P.
- Tournier, A.
- Lalanne, F.
- Crocherie, A.
- Galvier, J.
- Rabary, S.
- Noblanc, O.
- Wehbe-Alause, H.
- Acharya, S.
- Singh, A.
- Meitzner, J.
- Aher, D.
- Yang, H.
- Romero, J.
- Chen, B.
- Hsu, C.
- Cheng, K. C.
- Chang, Y.
- Sarmiento, M.
- Grange, C.
- Mazaleyrat, E.
- Rochereau, K.
2021
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Solid-state electronics, 2006-04, Vol.50 (4), p.573-578
- Tavel, B.
- Duriez, B.
- Gwoziecki, R.
- Basso, M.T.
- Julien, C.
- Ortolland, C.
- Laplanche, Y.
- Fox, R.
- Sabouret, E.
- Detcheverry, C.
- Boeuf, F.
- Morin, P.
- Barge, D.
- Bidaud, M.
- Biénacel, J.
- Garnier, P.
- Cooper, K.
- Chapon, J.D.
- Trouiller, Y.
- Belledent, J.
- Broekaart, M.
- Gouraud, P.
- Denais, M.
- Huard, V.
- Rochereau, K.
- Difrenza, R.
- Planes, N.
- Marin, M.
- Boret, S.
- Gloria, D.
- Vanbergue, S.
- Abramowitz, P.
- Vishnubhotla, L.
- Reber, D.
- Stolk, P.
- Woo, M.
- Arnaud, F.
2006
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Veterinary and comparative orthopaedics and traumatology, 2007-01, Vol.20 (2), p.136
2007
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Journal of epidemiology and community health (1979), 1994-06, Vol.48 (3), p.270-275
1994
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Solid-state electronics, 2006-04, Vol.50 (4), p.573-578
- Tavel, B.
- Duriez, B.
- Gwoziecki, R.
- Basso, M.T.
- Julien, C.
- Ortolland, C.
- Laplanche, Y.
- Fox, R.
- Sabouret, E.
- Detcheverry, C.
- Boeuf, F.
- Morin, P.
- Barge, D.
- Bidaud, M.
- Biénacel, J.
- Garnier, P.
- Cooper, K.
- Chapon, J.D.
- Trouiller, Y.
- Belledent, J.
- Broekaart, M.
- Gouraud, P.
- Denais, M.
- Huard, V.
- Rochereau, K.
- Difrenza, R.
- Planes, N.
- Marin, M.
- Boret, S.
- Gloria, D.
- Vanbergue, S.
- Abramowitz, P.
- Vishnubhotla, L.
- Reber, D.
- Stolk, P.
- Woo, M.
- Arnaud, F.
2006
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Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005, 2005, p.423-426
- Tavel, B.
- Duriez, B.
- Gwoziecki, R.
- Basso, M.T.
- Julien, C.
- Ortolland, C.
- Laplanche, Y.
- Fox, R.
- Saboure, E.
- Detcheverry, C.
- Boeuf, F.
- Morin, P.
- Barge, D.
- Bidaud, M.
- Bienacel, J.
- Garnier, P.
- Cooper, K.
- Chapon, J.D.
- Trouille, Y.
- Belledent, J.
- Broekaart, M.
- Gouraud, P.
- Denais, M.
- Huard, V.
- Rochereau, K.
- Difrenza, R.
- Planes, N.
- Marin, M.
- Boret, S.
- Gloria, D.
- Vanbergue, S.
- Abramowitz, P.
- Vishnubhotla, L.
- Reber, D.
- Stolk, P.
- Woo, M.
- Arnaud, F.
2005
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AIDS (London), 1993, Vol.7 (1), p.103-108
1993
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Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005, 2005, p.137-142
2005
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Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850), 2004, p.197-200
2004
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2006 International Electron Devices Meeting, 2006, p.1-4
- Josse, E.
- Parihar, S.
- Callen, O.
- Ferreira, P.
- Monget, C.
- Farcy, A.
- Zaleski, M.
- Villanueva, D.
- Ranica, R.
- Bidaud, M.
- Barge, D.
- Laviron, C.
- Auriac, N.
- Le Cam, C.
- Harrison, S.
- Warrick, S.
- Leverd, F.
- Gouraud, P.
- Zoll, S.
- Guyader, F.
- Perrin, E.
- Baylac, E.
- Belledent, J.
- Icard, B.
- Minghetti, B.
- Manakli, S.
- Pain, L.
- Huard, V.
- Ribes, G.
- Rochereau, K.
- Bordez, S.
- Blanc, C.
- Margain, A.
- Delille, D.
- Pantel, R.
- Barla, K.
- Cave, N.
- Haond, M.
2006
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2004
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IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, 2004, p.847-850
2004
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- ARNAUD, F
- DURIEZ, B
- REYNARD, J. P
- WACQUANT, F
- MORIN, P
- EMONET, N
- BARGE, D
- BIDAUD, M
- CECCARELLI, D
- VANNIER, P
- LOQUET, Y
- LENINGER, H
- TAVEL, B
- JUDONG, F
- PERROT, C
- GUILMEAU, I
- PALLA, R
- BEVERINA, A
- DEJONGHE, V
- BROEKAART, M
- VACHELLERIE, V
- BIANCHI, R. A
- BOROT, B
- PAIN, L
- DEVOIVRE, T
- BICAÏS, N
- ROY, D
- DENAIS, M
- ROCHEREAU, K
- DIFRENZA, R
- PLANES, N
- BRUT, H
- VISHNOBULTA, L
- REBER, D
- TODESCHINI, J
- STALK, P
- WOE, M
- JURDIT, M
- LAPLANCHE, Y
- BOEUF, F
- SALVETTI, F
- LENOBLE, D
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