UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 72

Sortiert nach

Adaptive geometric optics derived from nonlinear acoustic effects

Applied physics letters, 2004-02, Vol.84 (6), p.843-845

2004

Volltextzugriff (PDF)

Bulk superconductivity at 36 K in La1.8Sr0.2CuO4

Physical review letters, 1987-01, Vol.58 (4), p.408-410

1987

Volltextzugriff (PDF)

Bulk superconductivity at 91 K in single-phase oxygen-deficient perovskite Ba2YCu3O9-δ

Physical review letters, 1987-04, Vol.58 (16), p.1676-1679

1987

Volltextzugriff (PDF)

Tunable optics derived from nonlinear acoustic effects

Journal of applied physics, 2004-05, Vol.95 (10), p.5896-5904

2004

Volltextzugriff (PDF)

Analog computation with rings of quasiperiodic oscillators: the microdynamics of cognition in living machines

Robotics and autonomous systems, 2003-12, Vol.45 (3), p.249-263

2003

Volltextzugriff (PDF)

Oxygen stoichiometry, superconductivity and normal-state properties of YBa2Cu3O7–δ

Nature (London), 1987-10, Vol.329 (6138), p.423-425

1987

Volltextzugriff (PDF)

A study on failure prediction in a plasma reactor

IEEE transactions on semiconductor manufacturing, 1998-11, Vol.11 (4), p.670-680

1998

Volltextzugriff (PDF)

Isotope effect in the high-Tc superconductors Ba2YCu3O7 and Ba2EuCu3O7

Physical review letters, 1987-06, Vol.58 (22), p.2333-2336

1987

Volltextzugriff (PDF)

A neural network model of a contact plasma etch process for VLSI production

IEEE transactions on semiconductor manufacturing, 1996-02, Vol.9 (1), p.95-100

Rietman, E.A.

1996

Volltextzugriff (PDF)

Nonzero isotope effect in La1.85Sr0.15CuO4

Physical review letters, 1987-08, Vol.59 (8), p.912-914

1987

Volltextzugriff (PDF)

Structural anomalies at the disappearance of superconductivity in Ba2YCu3O7−δ: Evidence for charge transfer from chains to planes

Physica. C, Superconductivity, 1988-11, Vol.156 (4), p.523-527

1988

Volltextzugriff (PDF)

Use of neural networks in modeling semiconductor manufacturing processes: an example for plasma etch modeling

IEEE transactions on semiconductor manufacturing, 1993-11, Vol.6 (4), p.343-347

1993

Volltextzugriff (PDF)

A system model for feedback control and analysis of yield: A multistep process model of effective gate length, poly line width, and IV parameters

IEEE transactions on semiconductor manufacturing, 2001-02, Vol.14 (1), p.32-47

2001

Volltextzugriff (PDF)

A new algorithm for real-time thin film thickness estimation given in situ multiwavelength ellipsometry using an extended Kalman filter

Thin solid films, 1998-02, Vol.313 (1-2), p.156-160

1998

Volltextzugriff (PDF)

Mapping of wafer profile to plasma processing conditions: Forward and reverse maps

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-01, Vol.18 (1), p.299-302

2000

Volltextzugriff (PDF)

Mapping the rule table of a 2-D probabilistic cellular automaton to the chemical physics of etching and deposition

Journal of alloys and compounds, 1999, Vol.290 (1), p.216-229

1999

Volltextzugriff (PDF)

Evidence for a Peierls distortion in La2CuO4 from vibrational spectroscopy

Physical review letters, 1987-04, Vol.58 (15), p.1571-1573

1987

Volltextzugriff (PDF)

A genetic algorithm for low variance control in semiconductor device manufacturing: some early results

IEEE transactions on semiconductor manufacturing, 1996-05, Vol.9 (2), p.223-229

1996

Volltextzugriff (PDF)

Modeling and control of a semiconductor manufacturing process with an automata network: An example in plasma etch processing

Computers & operations research, 1996-06, Vol.23 (6), p.573-585

1996

Volltextzugriff (PDF)

Phase relationships and conductivity of the polymer electrolytes poly(ethylene oxide)/lithium tetrafluoroborate and poly(ethylene oxide)/lithium trifluoromethanesulfonate

Macromolecules, 1988-05, Vol.21 (3), p.654-660

1988

Volltextzugriff (PDF)

Pre-production results demonstrating multiple-system models for yield analysis

IEEE transactions on semiconductor manufacturing, 1997-11, Vol.10 (4), p.469-481

1997

Volltextzugriff (PDF)

A production demonstration of wafer-to-wafer plasma gate etch control by adaptive real-time computation of the over-etch time from in situ process signals

IEEE transactions on semiconductor manufacturing, 1995-08, Vol.8 (3), p.304-308

1995

Volltextzugriff (PDF)

Crown ether enhancement of ionic conductivity in a polymer-salt system

Solid state ionics, 1987-10, Vol.25 (1), p.37-40

1987

Volltextzugriff (PDF)

Electrical properties of alpha-cyclodextrin metal iodide inclusion compounds

Materials research bulletin, 1990-05, Vol.25 (5), p.649-655

Rietman, E.A.

1990

Volltextzugriff (PDF)

Using a neural network to proximity correct patterns written with a Cambridge electron beam microfabricator 10.5 lithography system

Applied physics letters, 1990-10, Vol.57 (14), p.1431-1433

1990

Volltextzugriff (PDF)

1 – 25 von 72

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(38)
Mit Volltextzugriff
(72)

Publikationsform

Artikel
(69)
Tagungsberichte
(3)

Sprache

Englisch
(72)
Japanisch
(8)

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Adaptive geometric optics derived from nonlinear acoustic effects

Bulk superconductivity at 36 K in La1.8Sr0.2CuO4

Bulk superconductivity at 91 K in single-phase oxygen-deficient perovskite Ba2YCu3O9-δ

Tunable optics derived from nonlinear acoustic effects

Analog computation with rings of quasiperiodic oscillators: the microdynamics of cognition in living machines

Oxygen stoichiometry, superconductivity and normal-state properties of YBa2Cu3O7–δ

A study on failure prediction in a plasma reactor

Isotope effect in the high-Tc superconductors Ba2YCu3O7 and Ba2EuCu3O7

A neural network model of a contact plasma etch process for VLSI production

Nonzero isotope effect in La1.85Sr0.15CuO4

Structural anomalies at the disappearance of superconductivity in Ba2YCu3O7−δ: Evidence for charge transfer from chains to planes

Use of neural networks in modeling semiconductor manufacturing processes: an example for plasma etch modeling

A system model for feedback control and analysis of yield: A multistep process model of effective gate length, poly line width, and IV parameters

A new algorithm for real-time thin film thickness estimation given in situ multiwavelength ellipsometry using an extended Kalman filter

Mapping of wafer profile to plasma processing conditions: Forward and reverse maps

Mapping the rule table of a 2-D probabilistic cellular automaton to the chemical physics of etching and deposition

Evidence for a Peierls distortion in La2CuO4 from vibrational spectroscopy

A genetic algorithm for low variance control in semiconductor device manufacturing: some early results

Modeling and control of a semiconductor manufacturing process with an automata network: An example in plasma etch processing

Phase relationships and conductivity of the polymer electrolytes poly(ethylene oxide)/lithium tetrafluoroborate and poly(ethylene oxide)/lithium trifluoromethanesulfonate

Pre-production results demonstrating multiple-system models for yield analysis

A production demonstration of wafer-to-wafer plasma gate etch control by adaptive real-time computation of the over-etch time from in situ process signals

Crown ether enhancement of ionic conductivity in a polymer-salt system

Electrical properties of alpha-cyclodextrin metal iodide inclusion compounds

Using a neural network to proximity correct patterns written with a Cambridge electron beam microfabricator 10.5 lithography system

Suchergebnisse filtern