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3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented Nanocrystal

Nano letters, 2017-11, Vol.17 (11), p.6696-6701

2017

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Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction study

Microelectronic engineering, 2021-05, Vol.244-246, p.111573, Article 111573

2021

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Bragg coherent diffraction imaging of single 20 nm Pt particles at the ID01‐EBS beamline of ESRF

Journal of applied crystallography, 2022-06, Vol.55 (3), p.621-625

2022

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Evolution of Crystal Structure During the Initial Stages of ZnO Atomic Layer Deposition

Chemistry of materials, 2016-01, Vol.28 (2), p.592-600

2016

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In situ Bragg coherent X‐ray diffraction during tensile testing of an individual Au nanowire

Journal of applied crystallography, 2018-06, Vol.51 (3), p.781-788

2018

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Continuous and Collective Grain Rotation in Nanoscale Thin Films during Silicidation

Physical review letters, 2015-12, Vol.115 (26), p.266101-266101, Article 266101

2015

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Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements

Thin solid films, 2016-10, Vol.617 (A), p.44-47

2016

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Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(0 0 1) substrates

Applied surface science, 2019-02, Vol.466, p.801-807

2019

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Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditions

Review of scientific instruments, 2017-09, Vol.88 (9)

2017

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Interfacial charge and strain effects on the ferroelectric behavior of epitaxial (001) PbTiO3 films on (110) DyScO3 substrates

Applied physics letters, 2014-03, Vol.104 (13)

2014

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In situ three-dimensional reciprocal-space mapping during mechanical deformation

Journal of synchrotron radiation, 2012-09, Vol.19 (5), p.688-694

2012

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Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy

Applied physics letters, 2015-02, Vol.106 (7)

2015

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Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements

Thin solid films, 2013-03, Vol.530, p.100-104

2013

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Strain inhomogeneity in copper islands probed by coherent X-ray diffraction

Thin solid films, 2013-03, Vol.530, p.120-124

2013

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Anomalous coherent diffraction of core-shell nano-objects: A methodology for determination of composition and strain fields

Physical review. B, Condensed matter and materials physics, 2013-01, Vol.87 (3), Article 035408

2013

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Through-silicon via-induced strain distribution in silicon interposer

Applied physics letters, 2015-04, Vol.106 (14)

2015

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Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Microelectronic engineering, 2015-04, Vol.137, p.117-123

2015

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Silicide formation during reaction between Ni ultra-thin films and Si(001) substrates

Materials letters, 2014-02, Vol.116, p.139-142

2014

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In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN

Applied physics letters, 2010-02, Vol.96 (5), p.051911-051911-3

2010

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In situ x-ray study of the formation of defects in Ge islands on Si(001)

Applied physics letters, 2011-10, Vol.99 (16), p.161906-161906-3

2011

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X-Ray Probes for In Situ Studies of Interfaces

MRS bulletin, 2010-07, Vol.35 (7), p.504-513

2010

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Direct evidence of strain transfer for InAs island growth on compliant Si substrates

Applied physics letters, 2015-04, Vol.106 (15)

2015

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In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization

Micro and Nano Engineering, 2018-11, Vol.1, p.63-67

2018

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Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

The European physical journal. ST, Special topics, 2012-06, Vol.208

2012

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Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2012-08, Vol.284, p.58-63

2012

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3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented Nanocrystal

Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction study

Bragg coherent diffraction imaging of single 20 nm Pt particles at the ID01‐EBS beamline of ESRF

Evolution of Crystal Structure During the Initial Stages of ZnO Atomic Layer Deposition

In situ Bragg coherent X‐ray diffraction during tensile testing of an individual Au nanowire

Continuous and Collective Grain Rotation in Nanoscale Thin Films during Silicidation

Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements

Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(0 0 1) substrates

Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditions

Interfacial charge and strain effects on the ferroelectric behavior of epitaxial (001) PbTiO3 films on (110) DyScO3 substrates

In situ three-dimensional reciprocal-space mapping during mechanical deformation

Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy

Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements

Strain inhomogeneity in copper islands probed by coherent X-ray diffraction

Anomalous coherent diffraction of core-shell nano-objects: A methodology for determination of composition and strain fields

Through-silicon via-induced strain distribution in silicon interposer

Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Silicide formation during reaction between Ni ultra-thin films and Si(001) substrates

In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN

In situ x-ray study of the formation of defects in Ge islands on Si(001)

X-Ray Probes for In Situ Studies of Interfaces

Direct evidence of strain transfer for InAs island growth on compliant Si substrates

In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands

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