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Data acquisition for medical devices

IOP conference series. Materials Science and Engineering, 2020-07, Vol.898 (1), p.12027

2020

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One-sided weighted integral approximation of characteristic functions of intervals by polynomials on a closed interval

Proceedings of the Steklov Institute of Mathematics, 2017-07, Vol.297 (Suppl 1), p.11-18

2017

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The structural aspects of non-crystalline SiO2 films on silicon: a review

Journal of non-crystalline solids, 2003-10, Vol.328 (1-3), p.48-63

2003

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Nuclear reaction analysis of hydrogen in the buried SiO2 layer of Si/SiO2/Si structures

Journal of non-crystalline solids, 2001-12, Vol.296 (1-2), p.143-145

2001

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Structural Rearrangement of SiO2 Films during Their Growth and Annealing

Journal of the Electrochemical Society, 1999-06, Vol.146 (6), p.2225-2228

Revesz, A. G.

1999

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Delsarte’s extremal problem and packing on locally compact Abelian groups

Annali della Scuola normale superiore di Pisa, Classe di scienze, 2023-01, p.1007-1052

2023

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Oxygen Vacancies in SiO2 Layers on Si Produced at High Temperature

Journal of the Electrochemical Society, 1998-09, Vol.145 (9), p.3157-3160

1998

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On the Extremal Rays of the Cone of Positive, Positive Definite Functions

The Journal of fourier analysis and applications, 2009-08, Vol.15 (4), p.561-582

2009

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MR imaging of the knee: expanded classification and pitfalls to interpretation of meniscal tears

Radiographics, 1993-05, Vol.13 (3), p.489-500

1993

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Data acquisition for medical devices

Annals of the Oradea University: Fascicle Management and Technological Engineering, 2020-07, Vol.XXIX (XIX), 2020/1 (1)

2020

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Effects of heat treatments in inert ambients on Si/SiO2 structures

Journal of non-crystalline solids, 1999-09, Vol.254 (1-3), p.47-56

1999

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Osteochondritis dissecans: analysis of mechanical stability with radiography, scintigraphy, and MR imaging

Radiology, 1987-12, Vol.165 (3), p.775-780

1987

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Photoluminescence spectra of SIMOX buried oxide layers prepared under various conditions

Microelectronic engineering, 1999, Vol.48 (1), p.335-338

1999

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Die Formenwelt des Tastsinnes: Erster Band Grundlegung der Haptik und der Blindenpsychologie

Révész, G.

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Conspicuity and uncertainty in the radiographic detection of lesions

Radiology, 1985-03, Vol.154 (3), p.625-628

Revesz, G

1985

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Confinement Phenomena in Buried Oxides of SIMOX Structures as Affected by Processing

Journal of the Electrochemical Society, 1996-02, Vol.143 (2), p.695-700

1996

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Electron spin resonance of defects in silicon-on-insulator structures formed by oxygen implantation : influence of γ irradiation

Journal of applied physics, 1991, Vol.69 (1), p.175-181

1991

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The Simultaneous Analysis of Metal-EDTA Complexes and Inorganic Anions by Suppressed Ion Chromatography

Journal of chromatographic science, 1996-06, Vol.34 (6), p.291-299

1996

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Irradiation-induced ESR active defects in SIMOX structures

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1990-12, Vol.37 (6), p.2008-2012

1990

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Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy

Applied surface science, 2002-06, Vol.194 (1-4), p.101-105

2002

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Bulk Electrical Conduction in the Buried Oxide of SIMOX Structures

Journal of the Electrochemical Society, 1993-11, Vol.140 (11), p.3222-3229

1993

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Deuterium interactions with ion-implanted SiO2 layers in silicon

Journal of applied physics, 1993-03, Vol.73 (5), p.2196-2206

1993

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Trap Generation in Buried Oxides of Silicon‐on‐Insulator Structures by Vacuum Ultraviolet Radiation

Journal of the Electrochemical Society, 1997-02, Vol.144 (2), p.749-753

1997

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Die Formenwelt des Tastsinnes: Erster Band Grundlegung der Haptik und der Blindenpsychologie

Révész, Géza

1, 1938

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Structural and Strain‐Related Effects during Growth of SiO2 Films on Silicon

Journal of the Electrochemical Society, 1987-08, Vol.134 (8), p.2020-2027

1987

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Data acquisition for medical devices

One-sided weighted integral approximation of characteristic functions of intervals by polynomials on a closed interval

The structural aspects of non-crystalline SiO2 films on silicon: a review

Nuclear reaction analysis of hydrogen in the buried SiO2 layer of Si/SiO2/Si structures

Structural Rearrangement of SiO2 Films during Their Growth and Annealing

Delsarte’s extremal problem and packing on locally compact Abelian groups

Oxygen Vacancies in SiO2 Layers on Si Produced at High Temperature

On the Extremal Rays of the Cone of Positive, Positive Definite Functions

MR imaging of the knee: expanded classification and pitfalls to interpretation of meniscal tears

Data acquisition for medical devices

Effects of heat treatments in inert ambients on Si/SiO2 structures

Osteochondritis dissecans: analysis of mechanical stability with radiography, scintigraphy, and MR imaging

Photoluminescence spectra of SIMOX buried oxide layers prepared under various conditions

Die Formenwelt des Tastsinnes: Erster Band Grundlegung der Haptik und der Blindenpsychologie

Conspicuity and uncertainty in the radiographic detection of lesions

Confinement Phenomena in Buried Oxides of SIMOX Structures as Affected by Processing

Electron spin resonance of defects in silicon-on-insulator structures formed by oxygen implantation : influence of γ irradiation

The Simultaneous Analysis of Metal-EDTA Complexes and Inorganic Anions by Suppressed Ion Chromatography

Irradiation-induced ESR active defects in SIMOX structures

Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy

Bulk Electrical Conduction in the Buried Oxide of SIMOX Structures

Deuterium interactions with ion-implanted SiO2 layers in silicon

Trap Generation in Buried Oxides of Silicon‐on‐Insulator Structures by Vacuum Ultraviolet Radiation

Die Formenwelt des Tastsinnes: Erster Band Grundlegung der Haptik und der Blindenpsychologie

Structural and Strain‐Related Effects during Growth of SiO2 Films on Silicon

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