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IEEE transactions on computer-aided design of integrated circuits and systems, 2020-08, Vol.39 (8), p.1699-1710
2020
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IEEE transactions on computer-aided design of integrated circuits and systems, 2018-12, Vol.37 (12), p.3020-3030
2018
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2006 IEEE International Test Conference, 2006, p.1-10
2006
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2018 IEEE International Test Conference (ITC), 2018, p.1-9
2018
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2010 19th IEEE Asian Test Symposium, 2010, p.355-360
2010
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2006 15th Asian Test Symposium, 2006, p.139-146
2006
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IEEE transactions on computer-aided design of integrated circuits and systems, 2024-02, Vol.43 (2), p.1-1
2024
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IEEE transactions on computer-aided design of integrated circuits and systems, 2024-02, Vol.43 (2), p.442-455
2024
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IEEE transactions on computer-aided design of integrated circuits and systems, 2024-02, p.1-1
2024
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IEEE transactions on computer-aided design of integrated circuits and systems, 2023-09, Vol.42 (9), p.1-1
2023
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IEEE transactions on computer-aided design of integrated circuits and systems, 2023-11, Vol.42 (11), p.1-1
2023
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2008 17th Asian Test Symposium, 2008, p.329-336
2008
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IEEE transactions on computer-aided design of integrated circuits and systems, 2020-10, Vol.39 (10), p.2964-2975
2020
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IEEE transactions on computer-aided design of integrated circuits and systems, 2014-09, Vol.33 (9), p.1396-1409
2014
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IEEE transactions on very large scale integration (VLSI) systems, 2023-04, Vol.31 (4), p.1-10
2023
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IEEE transactions on computer-aided design of integrated circuits and systems, 2019-06, Vol.38 (6), p.1028-1041
2019
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IEEE transactions on computer-aided design of integrated circuits and systems, 2022-07, Vol.41 (7), p.2290-2300
2022
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IEEE transactions on very large scale integration (VLSI) systems, 2021-08, Vol.29 (8), p.1553-1566
2021
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IEEE transactions on computer-aided design of integrated circuits and systems, 2021-03, Vol.40 (3), p.584-597
2021
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IEEE transactions on very large scale integration (VLSI) systems, 2017-03, Vol.25 (3), p.1112-1125
2017
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2022 IEEE 40th VLSI Test Symposium (VTS), 2022, p.1-7
2022
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IEEE transactions on computer-aided design of integrated circuits and systems, 2004-05, Vol.23 (5), p.776-792
2004
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IEEE transactions on very large scale integration (VLSI) systems, 2021-01, Vol.29 (1), p.76-88
2021
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2022 IEEE International Test Conference (ITC), 2022, p.305-313
2022
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2022 IEEE International Test Conference (ITC), 2022, p.20-27
2022
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