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Evaluation of practical sensitivity and useful ion yield for uranium detection by secondary ion mass spectrometry

Journal of analytical atomic spectrometry, 2004, Vol.19 (2), p.203-208

2004

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Spatially multidimensional secondary ion mass spectrometry analysis

Analytica Chimica Acta, 1994-10, Vol.297 (1), p.197-230

Rüdenauer, F.G.

1994

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Pulsed operation of a liquid metal ion source

Applied Physics A Solids and Surfaces, 1988-10, Vol.47 (2), p.167-169

1988

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Formation of droplets on Si surfaces bombarded by In from a capillary type liquid metal ion source

Vacuum, 1985-01, Vol.35 (8), p.315-320

1985

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Comparison of secondary ion yield data from amorphous and polycrystalline iron-based alloys

Analytical chemistry (Washington), 1982-02, Vol.54 (2), p.290-294

1982

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EFSA—a new evaluation method of the depth resolution in depth profiling of multilayer structures

Vacuum, 1985-12, Vol.35 (12), p.523-526

1985

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On the use of the saha-eggert equation for quantitative sims analysis using argon primary ions

Surface science, 1976-01, Vol.54 (3), p.553-560

1976

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A thin-film bolometer for particle current measurements

Journal of physics. E, Scientific instruments, 1986-02, Vol.19 (2), p.119-123

1986

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Results on a UHV–Ion Microprobe for Surface and Trace Analysis

Japanese Journal of Applied Physics, 1974-01, Vol.13 (S1), p.383

1974

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The state of the metal film covering the needle of a liquid metal indium ion source

Vacuum, 1994-09, Vol.45 (9), p.973-976

1994

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Use of electron beam techniques to study ion deposition in secondary ion mass spectrometry sputter craters

Journal of applied physics, 1985-01, Vol.57 (8), p.2727-2732

1985

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High Resolution Scanning Electron Microscopy

Vacuum, 1974-05, Vol.24 (5), p.199-208

Rudenauer, F G

1974

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Spatially multidimensional SIMS analysis

Surface and interface analysis, 1984-06, Vol.6 (3), p.132-139

Rüdenauer, F. G.

1984

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Localized ion beam induced deposition of Al‐containing layers

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1988-09, Vol.6 (5), p.1542-1547

1988

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Spatially multidimensional SIMS analysis

Surface and interface analysis, 1984, Vol.63 (3), p.132-139

RUDENAUER, F. G

1984

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Sputter Redeposition as a Limit to Spatially Three-Dimensional SIMS Microanalysis

Ultramicroscopy, 1986-08, Vol.24 (2-3), p.115-123

1986

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The binary alloy system Au/Pd; a SIMS study

Spectrochimica acta. Part B: Atomic spectroscopy, 1982, Vol.37 (9), p.797-808

1982

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Multidimensional image acquisition and processing in surface analysis

Fresenius' Zeitschrift für analytische Chemie, 1989-01, Vol.333 (4-5), p.308-311

Rüdenauer, F. G.

1989

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Mass and energy spectra of a capillary-type indium liquid-metal ion source

International journal of mass spectrometry and ion processes, 1987-07, Vol.77 (1), p.63-74

1987

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Influence of Flash-Lamp Annealing on the Diffusion Behaviour of Ion Implanted Boron Profiles

January 16, 2022, Vol.81, Number 1, p.247-252

2022

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Evaluation of a liquid metal ion source for secondary ion mass spectrometry

Nuclear instruments and methods in physics research, 1983-01, Vol.218 (1), p.303-306

1983

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A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys

International journal of mass spectrometry and ion physics, 1975-01, Vol.18 (2), p.111-127

1975

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Quantitative evaluation of SIMS-spectra using Saha-Eggert type equations

Vacuum, 1976, Vol.26 (12), p.537-543

1976

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Spatially multidimensional secondary ion mass spectrometry analysis: Analysis of thin films, interfaces and surfaces

Analytica chimica acta, 1994, Vol.297 (1-2), p.197-230

RÜDENAUER, F. G

1994

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Fabrication of submicron deep ultraviolet masks by ion microprojection

Applied physics letters, 1985, Vol.47 (12), p.1358-1360

1985

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Evaluation of practical sensitivity and useful ion yield for uranium detection by secondary ion mass spectrometry

Spatially multidimensional secondary ion mass spectrometry analysis

Pulsed operation of a liquid metal ion source

Formation of droplets on Si surfaces bombarded by In from a capillary type liquid metal ion source

Comparison of secondary ion yield data from amorphous and polycrystalline iron-based alloys

EFSA—a new evaluation method of the depth resolution in depth profiling of multilayer structures

On the use of the saha-eggert equation for quantitative sims analysis using argon primary ions

A thin-film bolometer for particle current measurements

Results on a UHV–Ion Microprobe for Surface and Trace Analysis

The state of the metal film covering the needle of a liquid metal indium ion source

Use of electron beam techniques to study ion deposition in secondary ion mass spectrometry sputter craters

High Resolution Scanning Electron Microscopy

Spatially multidimensional SIMS analysis

Localized ion beam induced deposition of Al‐containing layers

Spatially multidimensional SIMS analysis

Sputter Redeposition as a Limit to Spatially Three-Dimensional SIMS Microanalysis

The binary alloy system Au/Pd; a SIMS study

Multidimensional image acquisition and processing in surface analysis

Mass and energy spectra of a capillary-type indium liquid-metal ion source

Influence of Flash-Lamp Annealing on the Diffusion Behaviour of Ion Implanted Boron Profiles

Evaluation of a liquid metal ion source for secondary ion mass spectrometry

A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys

Quantitative evaluation of SIMS-spectra using Saha-Eggert type equations

Spatially multidimensional secondary ion mass spectrometry analysis: Analysis of thin films, interfaces and surfaces

Fabrication of submicron deep ultraviolet masks by ion microprojection

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