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Review of scientific instruments, 2013-07, Vol.84 (7), p.073103-073103
2013
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Scientific reports, 2013, Vol.3 (1), p.1410-1410, Article 1410
2013
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Physical review letters, 2014-04, Vol.112 (14), p.143902-143902, Article 143902
2014
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Physical review. A, 2016-06, Vol.93 (6), Article 061402
2016
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2010-05, Vol.268 (10), p.1692-1700
2010
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Applied physics. B, Lasers and optics, 2010-09, Vol.100 (3), p.461-469
2010
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29th International Conference on Photonic, Electronic, and Atomic Collisions (ICPEAC),Toledo, Spain,2015-07-22 - 2015-07-28, 2015, Vol.635 (11), p.112079
2015
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Journal of microscopy (Oxford), 2012-08, Vol.247 (2), p.196-201
2012
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Scientific reports, 2020-02, Vol.10 (1), p.2884-2884, Article 2884
2020
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Optica, 2015-06, Vol.2 (6), p.563
2015
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CLEO: 2013, 2013, p.1-2
- Arnold, C. L.
- Brizuela, F.
- Borot, A.
- Calegari, F.
- Charalambidis, D.
- Cowan, T.
- Diveki, Z.
- Dombi, P.
- Fulop, J. A.
- Hebling, J.
- Heyl, C. M.
- L'Huillier, A.
- Jaroszynski, D.
- Johnsson, P.
- Malka, V.
- Kalashnikov, M.
- Kaluza, M.
- Lopez-Martens, R.
- Nisoli, M.
- Osvay, K.
- Paulus, G.
- Quere, F.
- Racz, E.
- Rouzee, A.
- Rudawski, P.
- Spindloe, C.
- Tolley, M.
- Tzallas, P.
- Vrakking, M.
2013
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2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC, 2013, p.1-1
2013
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The Journal of infectious diseases, 2002-06, Vol.185 (12), p.1709-1716
2002
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Materials letters, 2011-12, Vol.65 (23), p.3540-3543
2011
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Microelectronics and reliability, 2017-03, Vol.70, p.41-48
2017
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PNAS nexus, 2023-08, Vol.2 (8), p.pgad267-pgad267
2023
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Journal of applied physics, 2005-02, Vol.97 (4)
2005
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Microelectronics and reliability, 2012-11, Vol.52 (11), p.2542-2546
2012
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Applied physics letters, 2013-07, Vol.103 (2)
2013
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Defects in Semiconductors, 2015, p.1-2
2015
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Journal of applied physics, 2005-01, Vol.97 (4), p.043713-043713-7
2005
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