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Coherence and Inelastic Scattering in Electron Microscopy

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2762-2763

2022

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Latency Dose Formation In DMC By Inelastic Electron Scattering

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2216-2217

2022

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Growth of polycrystalline zinc phosphide thin films by reactive radio frequency magnetron sputtering

Thin solid films, 2015-09, Vol.591, p.32-38

2015

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Reaction routes for the synthesis of CuInSe2 using bilayer compound precursors

Progress in photovoltaics, 2012-08, Vol.20 (5), p.543-556

2012

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Towards a Quantitative Understanding in Electron Tomography

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.602-603

2009

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Performance of a Silicon-Drift Detector in 200kV TEM Environments

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.228-229

2009

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Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013-07, Vol.462-463, p.302-309

2013

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Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.1088-1089

2009

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Effect of growth conditions on microstructure of sputtered precursor for CuIn1-xGaxSe2 (CIGS) absorber layer deposited on stainless steel substrates

Thin solid films, 2018-11, Vol.665, p.36-45

2018

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Structures and properties of disordered boron carbide coatings generated by magnetron sputtering

Thin solid films, 1998-11, Vol.332 (1-2), p.80-86

1998

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Determination of multiple lattice parameters from convergent-beam electron diffraction patterns

Ultramicroscopy, 1993-05, Vol.50 (1), p.41-56

1993

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Barrier studies on porous silk semiconductor dielectric

Microelectronic engineering, 2003-11, Vol.70 (2), p.352-357

2003

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Network morphology of straight and polymer modified asphalt cements

Microscopy research and technique, 1997-09, Vol.38 (5), p.529-543

1997

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Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems

Microelectronic engineering, 2004-10, Vol.76 (1-4), p.46-51

2004

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Use of a Ruthenium-Containing Conjugated Polymer as a Photosensitizer in Photovoltaic Devices Fabricated by a Layer-by-Layer Deposition Process

Langmuir, 2006-03, Vol.22 (7), p.3368-3375

2006

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Reaction routes for the synthesis of CuInSe 2 using bilayer compound precursors

Progress in photovoltaics, 2012-08, Vol.20 (5), p.543-556

2012

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Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013, Vol.462-63, p.302-309

2013

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In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.874-875

2003

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Effect of potassium addition method on MoS(2) performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013-07, Vol.462-463, p.302-309

2013

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Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.130-131

2010

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Interface structure of a YBa2Cu3O7−x/N/YBa2Cu3O7−x superconductor/normal metal/superconductor Josephson junction using YBa2Cu2.79Co0.21O7−x as the normal barrier N

Journal of materials research, 1996-02, Vol.11 (2), p.281-287

1996

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Electron microscopy of high- T c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Micron (Oxford, England : 1993), 1999-10, Vol.30 (5), p.539-559

1999

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Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces

Microscopy research and technique, 1992-11, Vol.23 (3), p.230-238

1992

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Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier

Physica. C, Superconductivity, 1995-10, Vol.252 (3-4), p.348-360

1995

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The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.122-123

2010

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Coherence and Inelastic Scattering in Electron Microscopy

Latency Dose Formation In DMC By Inelastic Electron Scattering

Growth of polycrystalline zinc phosphide thin films by reactive radio frequency magnetron sputtering

Reaction routes for the synthesis of CuInSe2 using bilayer compound precursors

Towards a Quantitative Understanding in Electron Tomography

Performance of a Silicon-Drift Detector in 200kV TEM Environments

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

Effect of growth conditions on microstructure of sputtered precursor for CuIn1-xGaxSe2 (CIGS) absorber layer deposited on stainless steel substrates

Structures and properties of disordered boron carbide coatings generated by magnetron sputtering

Determination of multiple lattice parameters from convergent-beam electron diffraction patterns

Barrier studies on porous silk semiconductor dielectric

Network morphology of straight and polymer modified asphalt cements

Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems

Use of a Ruthenium-Containing Conjugated Polymer as a Photosensitizer in Photovoltaic Devices Fabricated by a Layer-by-Layer Deposition Process

Reaction routes for the synthesis of CuInSe 2 using bilayer compound precursors

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

Effect of potassium addition method on MoS(2) performance for the syngas to alcohol reaction

Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

Interface structure of a YBa2Cu3O7−x/N/YBa2Cu3O7−x superconductor/normal metal/superconductor Josephson junction using YBa2Cu2.79Co0.21O7−x as the normal barrier N

Electron microscopy of high- T c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces

Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier

The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

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