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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2007-11, Vol.582 (1), p.193-195

2007

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Nested Neutron Microfocusing Optics on SNAP

Applied physics. A, Materials science & processing, 2010-03, Vol.99 (3)

2010

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Nested neutron microfocusing optics on SNAP : Emerging applications of neutron scattering in materials science and engineering

Applied physics. A, Materials science & processing, 2010, Vol.99 (3), p.635-639

2010

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Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction : 3D characterization and analysis of materials

Scripta materialia, 2006, Vol.55 (1), p.57-62

2006

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Reliability-limiting defects in AlGaN/GaN HEMTs

2011 International Reliability Physics Symposium, 2011, p.4E.4.1-4E.4.4

2011

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IEEE_Xplore

Atomic size effects in the energetics of CuAu alloys

Bulletin of the American Physical Society, 2004-03, Vol.49 (1), p.B17 5-B17 5

2004

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Variability of structural and electronic properties of bulk and monolayer Si2Te3

Radiation-Induced Defect Evolution and Electrical Degradation of AlGaN/GaN High-Electron-Mobility Transistors

Role of Fe impurity complexes in the degradation of GaN/AlGaN high-electron-mobility transistors

Prediction of Giant Thermoelectric Efficiency in Crystals with Interlaced Nanostructure

Dehydrogenation of defects and hot-electron degradation in GaN high-electron-mobility transistors

Memristive devices from ZnO nanowire bundles and meshes

Excess carbon in silicon carbide

The Role of Atomic Displacements in Ion-Induced Dielectric Breakdown

Surface Reactions and Defect Formation in Irradiated Graphene Devices

Theory of hot-carrier-induced phenomena in GaN high-electron-mobility transistors

Electrical-stress-induced degradation in AlGaN/GaN high electron mobility transistors grown under gallium-rich, nitrogen-rich, and ammonia-rich conditions

Nested neutron microfocusing optics on SNAP

Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction

Process Dependence of Proton-Induced Degradation in GaN HEMTs

Prediction of Giant Thermoelectric Efficiency in Crystals with Interlaced Nanostructure

Temperature-dependence and microscopic origin of low frequency 1/ f noise in GaN/AlGaN high electron mobility transistors

Mean-field approximations for the electronic states in disordered alloys

Physical Mechanisms Affecting the Reliability of GaN-based High Electron Mobility Transistors

Dehydrogenation of defects and hot-electron degradationin GaN high-electron-mobility transistors

Automated software for the recovery of the short range order parameters from diffuse X-ray scattering data

Nested Neutron Microfocusing Optics on SNAP

Nested neutron microfocusing optics on SNAP : Emerging applications of neutron scattering in materials science and engineering

Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction : 3D characterization and analysis of materials

Reliability-limiting defects in AlGaN/GaN HEMTs

Atomic size effects in the energetics of CuAu alloys

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