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Chemistry of materials, 2017-03, Vol.29 (5), p.2024-2032
2017
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Optics express, 2013-12, Vol.21 (26), p.32623-32629
2013
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Nature communications, 2015-05, Vol.6 (1), p.7027-7027, Article 7027
2015
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Nano letters, 2013-11, Vol.13 (11), p.4999-5005
2013
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Langmuir, 2015-05, Vol.31 (18), p.5057-5062
2015
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Nano letters, 2015-10, Vol.15 (10), p.6475-6480
2015
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ACS nano, 2012-08, Vol.6 (8), p.6767-6775
2012
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Nano letters, 2012-02, Vol.12 (2), p.683-686
2012
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Applied physics letters, 2011-11, Vol.99 (19), p.191102-191102-3
2011
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ACS applied materials & interfaces, 2019-03, Vol.11 (9), p.9594-9599
2019
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ACS applied materials & interfaces, 2019-07, Vol.11 (29), p.26082-26092
2019
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Nano letters, 2011-05, Vol.11 (5), p.1881-1886
2011
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Journal of lightwave technology, 2011-05, Vol.29 (9), p.1367-1374
2011
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Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2016-01, Vol.34 (1)
2016
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Heliyon, 2024-02, Vol.10 (4), p.e26420-e26420, Article e26420
2024
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AIP advances, 2016-06, Vol.6 (6), p.065012-065012-8
2016
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Acta materialia, 2016-09, Vol.117, p.153-159
2016
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Applied physics letters, 2015-01, Vol.106 (1)
2015
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Journal of microelectromechanical systems, 2013-06, Vol.22 (3), p.768-778
2013
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Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2016-09, Vol.34 (5)
2016
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IEEE electron device letters, 2014-09, Vol.35 (9), p.912-914
2014
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Measurement of Young's modulus and residual stress of atomic layer deposited Al2O3 and Pt thin films
2017
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ACS applied materials & interfaces, 2016-07, Vol.8 (27), p.17599-17605
2016
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IEEE transactions on electron devices, 2014-07, Vol.61 (7), p.2398-2403
2014
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Sensors and actuators. B, Chemical, 2014-03, Vol.193, p.918-924
2014
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