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Methods of Coherent X-Ray Diffraction Imaging

Crystallography reports, 2021-11, Vol.66 (6), p.867-882

2021

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Erratum to:Methods of Coherent X-Ray Diffraction Imaging

Crystallography reports, 2022, Vol.67 (2), p.311-311

2022

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Synchrotron radiation diffraction in a single crystal of paratellurite investigated with a new experimental scheme

Journal of synchrotron radiation, 2020-03, Vol.27 (2), p.378-385

2020

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Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses

Nanobiotechnology Reports (Online), 2023-12, Vol.18 (Suppl 1), p.S210-S216

2023

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Fine Structure of Diffraction Losses in Single-Crystal X-Ray Lenses

Crystallography reports, 2022-12, Vol.67 (6), p.838-844

2022

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Comparative X-ray Diffractometry of the Defect Structure of ZnO Epitaxial Films Deposited by Magnetron Sputtering on C-Plane Al2O3 Substrates in Inhomogeneous Electric Field

Crystallography reports, 2023-04, Vol.68 (2), p.195-202

2023

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Development of X-ray Methods for Studying Protein Planar Systems on a Liquid Surface Using Synchrotron Radiation

Crystallography reports, 2023-02, Vol.68 (1), p.97-103

2023

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A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

Crystallography reports, 2023-02, Vol.68 (1), p.1-6

2023

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X-ray Diffraction Analysis and Electron Microscopy of the Carbon Fiber Structure

Crystallography reports, 2019, Vol.64 (1), p.1-5

2019

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X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer

Crystallography reports, 2022-06, Vol.67 (3), p.317-322

2022

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Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique

Crystallography reports, 2019-07, Vol.64 (4), p.545-552

2019

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Development of methods for ultrasonic scanning of X-ray wavelength

Crystallography reports, 2017-11, Vol.62 (6), p.831-836

2017

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X-Ray Reflectometry Study of the State of the Surface Layer of Polished Silicon Substrates Depending on the Methods of Their Cleaning

Surface investigation, x-ray, synchrotron and neutron techniques, 2021-09, Vol.15 (5), p.927-933

2021

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New Approach for Time-Resolved Reciprocal Space Mapping with Adaptive X-Ray Optics

Surface investigation, x-ray, synchrotron and neutron techniques, 2020-07, Vol.14 (4), p.756-761

2020

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Measurement of rocking curves of crystals using an acoustically tunable monochromator

Crystallography reports, 2015-03, Vol.60 (2), p.167-171

2015

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Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation

Crystallography reports, 2019, Vol.64 (1), p.24-29

2019

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Modification of the Langmuir–Schaefer method for fabrication of ordered protein films

Crystallography reports, 2017-07, Vol.62 (4), p.632-638

2017

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Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd3Ga3Al2O12:Ce Crystals

Surface investigation, x-ray, synchrotron and neutron techniques, 2020-07, Vol.14 (4), p.655-659

2020

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Fabrication of Multilayer Films on the Basis of Lysozyme Protein and Precipitant (Iodide and Potassium) Ions on a Silicon Substrate by the Modified Langmuir–Schaefer Method

Crystallography reports, 2018-09, Vol.63 (5), p.719-723

2018

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X-ray and synchrotron methods in studies of cultural heritage sites

Crystallography reports, 2016-09, Vol.61 (5), p.703-717

2016

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Multiple-Wave Interaction of X-Rays in a Paratellurite Crystal under Excitation of Ultrasonic Vibrations

Surface investigation, x-ray, synchrotron and neutron techniques, 2019-07, Vol.13 (4), p.570-577

2019

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X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well

Crystallography reports, 2017-05, Vol.62 (3), p.355-363

2017

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Study of the specific features of single-crystal boron microstructure

Crystallography reports, 2017-09, Vol.62 (5), p.692-702

2017

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Growth of crystalline ZnO films on the nitridated (0001) sapphire surface

Crystallography reports, 2015-07, Vol.60 (4), p.565-569

2015

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Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data

Crystallography reports, 2020-11, Vol.65 (6), p.827-831

2020

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Methods of Coherent X-Ray Diffraction Imaging

Erratum to:Methods of Coherent X-Ray Diffraction Imaging

Synchrotron radiation diffraction in a single crystal of paratellurite investigated with a new experimental scheme

Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses

Fine Structure of Diffraction Losses in Single-Crystal X-Ray Lenses

Comparative X-ray Diffractometry of the Defect Structure of ZnO Epitaxial Films Deposited by Magnetron Sputtering on C-Plane Al2O3 Substrates in Inhomogeneous Electric Field

Development of X-ray Methods for Studying Protein Planar Systems on a Liquid Surface Using Synchrotron Radiation

A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

X-ray Diffraction Analysis and Electron Microscopy of the Carbon Fiber Structure

X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer

Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique

Development of methods for ultrasonic scanning of X-ray wavelength

X-Ray Reflectometry Study of the State of the Surface Layer of Polished Silicon Substrates Depending on the Methods of Their Cleaning

New Approach for Time-Resolved Reciprocal Space Mapping with Adaptive X-Ray Optics

Measurement of rocking curves of crystals using an acoustically tunable monochromator

Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation

Modification of the Langmuir–Schaefer method for fabrication of ordered protein films

Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd3Ga3Al2O12:Ce Crystals

Fabrication of Multilayer Films on the Basis of Lysozyme Protein and Precipitant (Iodide and Potassium) Ions on a Silicon Substrate by the Modified Langmuir–Schaefer Method

X-ray and synchrotron methods in studies of cultural heritage sites

Multiple-Wave Interaction of X-Rays in a Paratellurite Crystal under Excitation of Ultrasonic Vibrations

X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well

Study of the specific features of single-crystal boron microstructure

Growth of crystalline ZnO films on the nitridated (0001) sapphire surface

Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data

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