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Atomic-scale age resolution of planetary events

Nature communications, 2017-05, Vol.8 (1), p.15597-15597, Article 15597

2017

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Evolution of tip shape during field evaporation of complex multilayer structures

Journal of microscopy (Oxford), 2011-03, Vol.241 (3), p.225-233

2011

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Composition profiling of GaAs/AlGaAs quantum dots grown by droplet epitaxy

Applied physics letters, 2014-10, Vol.105 (15)

2014

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Wide-Field-of-View Atom Probe Reconstruction

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.292-293

2009

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Toward atom probe tomography of microelectronic devices

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012030-4

2011

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X-ray structural studies of poly(3-alkylthiophenes): an example of an inverse comb

Macromolecules, 1992-08, Vol.25 (17), p.4364-4372

1992

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Evidence of a Novel Side Chain Structure in Regioregular Poly(3-alkylthiophenes)

Macromolecules, 1996-05, Vol.29 (10), p.3654-3656

1996

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Atom probe tomography of nanoscale electronic materials

MRS bulletin, 2016-01, Vol.41 (1), p.30-34

2016

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Encapsulation method for atom probe tomography analysis of nanoparticles

Ultramicroscopy, 2015-12, Vol.159, p.420-426

2015

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Improvements in planar feature reconstructions in atom probe tomography

Journal of microscopy (Oxford), 2011-07, Vol.243 (1), p.15-30

2011

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Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography

Ultramicroscopy, 2011-05, Vol.111 (6), p.506-511

2011

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Atom probe tomography analysis of poly(3-alkylthiophene)s

Journal of microscopy (Oxford), 2010-02, Vol.237 (2), p.155-167

2010

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Diffraction Line-Shape Analysis of Poly(3-dodecylthiophene): A Study of Layer Disorder through the Liquid Crystalline Polymer Transition

Macromolecules, 1999-06, Vol.32 (12), p.4000-4009

1999

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Analysis of implanted silicon dopant profiles

Ultramicroscopy, 2013-09, Vol.132, p.179-185

2013

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Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography

Journal of microscopy (Oxford), 2012-09, Vol.247 (3), p.288-299

2012

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Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography

Nanotechnology, 2012-06, Vol.23 (21), p.215704-215704

2012

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Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography

Journal of microscopy (Oxford), 2010-08, Vol.239 (2), p.92-98

2010

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Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.859-860

2015

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Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.843-844

2015

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Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.702-703

2016

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Manganese diffusion in annealed magnetic tunnel junctions with MgO tunnel barriers

Scripta materialia, 2011-04, Vol.64 (7), p.673-676

2011

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Evolution of Microstructure in the Liquid and Crystal Directions in a Quenched Block Copolymer Melt

Macromolecules, 1998-11, Vol.31 (22), p.7668-7675

1998

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Correlative Analysis in the Semiconductor Industry

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.2502-2503

2019

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Measurement of Detection Efficiency in Atom Probe Tomography

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1160-1161

2014

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Correlative Compositional Analysis of Fiber-Optic Nanoparticles

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.994-995

2014

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Atomic-scale age resolution of planetary events

Evolution of tip shape during field evaporation of complex multilayer structures

Composition profiling of GaAs/AlGaAs quantum dots grown by droplet epitaxy

Wide-Field-of-View Atom Probe Reconstruction

Toward atom probe tomography of microelectronic devices

X-ray structural studies of poly(3-alkylthiophenes): an example of an inverse comb

Evidence of a Novel Side Chain Structure in Regioregular Poly(3-alkylthiophenes)

Atom probe tomography of nanoscale electronic materials

Encapsulation method for atom probe tomography analysis of nanoparticles

Improvements in planar feature reconstructions in atom probe tomography

Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography

Atom probe tomography analysis of poly(3-alkylthiophene)s

Diffraction Line-Shape Analysis of Poly(3-dodecylthiophene): A Study of Layer Disorder through the Liquid Crystalline Polymer Transition

Analysis of implanted silicon dopant profiles

Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography

Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography

Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography

Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

Manganese diffusion in annealed magnetic tunnel junctions with MgO tunnel barriers

Evolution of Microstructure in the Liquid and Crystal Directions in a Quenched Block Copolymer Melt

Correlative Analysis in the Semiconductor Industry

Measurement of Detection Efficiency in Atom Probe Tomography

Correlative Compositional Analysis of Fiber-Optic Nanoparticles

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