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Semiconductors (Woodbury, N.Y.), 2022-03, Vol.56 (3), p.223-229
2022
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Semiconductors (Woodbury, N.Y.), 2019-04, Vol.53 (4), p.493-498
2019
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Semiconductors (Woodbury, N.Y.), 2018-10, Vol.52 (10), p.1341-1348
2018
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Semiconductors (Woodbury, N.Y.), 2022-03, Vol.56 (3), p.215-222
2022
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Measurement techniques, 2023-02, Vol.65 (11), p.793-802
2023
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Measurement techniques, 2022-08, Vol.65 (5), p.330-338
2022
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Measurement techniques, 2021-05, Vol.64 (2), p.86-93
2021
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Applied physics letters, 2024-02, Vol.124 (6)
2024
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IOP conference series. Earth and environmental science, 2020-04, Vol.459 (6), p.62027
2020
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Physical review. B, 2018-03, Vol.97 (12), Article 125426
2018
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Journal of physics. D, Applied physics, 2021-06, Vol.54 (22), p.225101
2021
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Physica status solidi. C, 2013-08, Vol.10 (7-8), p.1172-1175
2013
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Measurement techniques, 2024, Vol.66 (10), p.765-775
2024
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Plasma physics reports, 2016-11, Vol.42 (11), p.1037-1046
2016
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Sensors and actuators. B, Chemical, 2018-05, Vol.261, p.566-571
2018
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Semiconductors (Woodbury, N.Y.), 2021-03, Vol.55 (3), p.289-295
2021
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Bulletin of the Russian Academy of Sciences. Physics, 2023-06, Vol.87 (6), p.760-764
2023
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IOP conference series. Materials Science and Engineering, 2020-11, Vol.962 (2), p.22037
2020
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Bulletin of the Russian Academy of Sciences. Physics, 2023-09, Vol.87 (9), p.1326-1331
2023
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Russian microelectronics, 2024, Vol.53 (2), p.135-146
2024
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Journal of physics. Conference series, 2021-12, Vol.2119 (1), p.12120
2021
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Russian engineering research, 2023, Vol.43 (1), p.107-110
2023
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Diamond and related materials, 2021-12, Vol.120, p.108675, Article 108675
2021
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IOP conference series. Materials Science and Engineering, 2020-03, Vol.775 (1), p.12121
2020
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IOP conference series. Materials Science and Engineering, 2019-12, Vol.687 (2), p.22015
2019
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