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IEEE electron device letters, 2006-07, Vol.27 (7), p.609-611
2006
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Microelectronics and reliability, 2006-09, Vol.46 (9), p.1603-1607
2006
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2010 Symposium on VLSI Technology, 2010, p.27-28
2010
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Microelectronics and reliability, 2001-04, Vol.41 (4), p.543-551
2001
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2006 43rd ACM/IEEE Design Automation Conference, 2006, p.193-198
2006
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.388-397
2005
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Microelectronics and reliability, 2000-01, Vol.40 (1), p.37-47
2000
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Microelectronics and reliability, 2001-07, Vol.41 (7), p.973-975
2001
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Microelectronics and reliability, 2005-12, Vol.45 (12), p.1835-1841
2005
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Second Edition., 2011
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2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320), 2002, p.393-403
2002
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2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2009, Vol.49 (12), p.6A.1-1-6A.1-10
2009
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2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.217-220
2007
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Thin solid films, 1997-11, Vol.310 (1), p.19-23
1997
Link zum Volltext
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296), 1999, p.82-87
1999
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2008 IEEE International Reliability Physics Symposium, 2008, p.126-131
2008
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IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest, 2005, p.64-67
- Steegen, A.
- Mo, R.
- Mann, R.
- Sun, M.-C.
- Eller, M.
- Leake, G.
- Vietzke, D.
- Tilke, A.
- Guarin, F.
- Fischer, A.
- Pompl, T.
- Massey, G.
- Vayshenker, A.
- Tan, W.L.
- Ebert, A.
- Lin, W.
- Gao, W.
- Lian, J.
- Kim, J.-P.
- Wrschka, P.
- Yang, J.-H.
- Ajmera, A.
- Knoefler, R.
- Teh, Y.-W.
- Jamin, F.
- Park, J.E.
- Hooper, K.
- Griffin, C.
- Nguyen, P.
- Klee, V.
- Ku, V.
- Baiocco, C.
- Johnson, G.
- Tai, L.
- Benedict, J.
- Scheer, S.
- Zhuang, H.
- Ramanchandran, V.
- Matusiewicz, G.
- Lin, Y.-H.
- Siew, Y.K.
- Zhang, F.
- Leong, L.S.
- Liew, S.L.
- Park, K.C.
- Lee, K.-W.
- Hong, D.H.
- Choi, S.-M.
- Kaltalioglu, E.
- Kim, S.O.
- Naujok, M.
- Sherony, M.
- Cowley, A.
- Thomas, A.
- Sudijohno, J.
- Schiml, T.
- Ku, J.-H.
- Yang, I.
2005
- Link zum Volltext
IEEE transactions on device and materials reliability, 2004-06, Vol.4 (2), p.263-267
2004
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30th European Solid-State Device Research Conference, 2000, p.292-295
2000
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2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.655-656
2006
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30th European Solid-State Device Research Conference, 2000, p.132-135
2000
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2006 Electrical Overstress/Electrostatic Discharge Symposium, 2006, p.285-294
2006
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Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC, 2004, p.15-16 vol.1
2004
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2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059), 2000, p.40-47
2000
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2006 International Electron Devices Meeting, 2006, p.1-4
2006
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