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Raman Spectroscopy as a Morphological Probe for TiO2 Aerogels

The journal of physical chemistry. B, 1997-04, Vol.101 (14), p.2730-2734

1997

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Thermal conductivity of GaN films: Effects of impurities and dislocations

Journal of applied physics, 2002-09, Vol.92 (5), p.2534-2539

2002

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Effect of dislocations on thermal conductivity of GaN layers

Applied physics letters, 2001-12, Vol.79 (26), p.4316-4318

2001

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Modulation spectroscopy of semiconductors: bulk/thin film, microstructures, surfaces/interfaces and devices

Materials science & engineering. R, Reports : a review journal, 1993-10, Vol.10 (7), p.xv,275-xvi,374

1993

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Study of semiconductor surfaces and interfaces using electromodulation

Surface and interface analysis, 2001-10, Vol.31 (10), p.938-953

Pollak, Fred H.

2001

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Band offset determination of Zn0.53Cd0.47Se/Zn0.29Cd0.24Mg0.47Se

Applied physics letters, 2003-09, Vol.83 (10), p.1995-1997

2003

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Thermal conductivity of fully and partially coalesced lateral epitaxial overgrown GaN/sapphire (0001) by scanning thermal microscopy

Applied physics letters, 2000-09, Vol.77 (10), p.1464-1466

2000

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High spatial resolution thermal conductivity of bulk ZnO (0001)

Journal of applied physics, 2002-01, Vol.91 (2), p.890-892

2002

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High spatial resolution thermal conductivity and Raman spectroscopy investigation of hydride vapor phase epitaxy grown n-GaN/sapphire (0001): Doping dependence

Journal of applied physics, 2000-09, Vol.88 (6), p.3295-3300

2000

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Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III–V semiconductor device structures

Materials science & engineering. B, Solid-state materials for advanced technology, 2001-03, Vol.80 (1), p.178-183

Pollak, Fred H.

2001

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High spatial resolution thermal conductivity of lateral epitaxial overgrown GaN/sapphire (0001) using a scanning thermal microscope

Applied physics letters, 1999-08, Vol.75 (9), p.1240-1242

1999

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Determination of the thermal conductivity of diamond-like nanocomposite films using a scanning thermal microscope

Applied physics letters, 1998-09, Vol.73 (13), p.1802-1804

1998

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A new offset technique for suppression of spurious signals in photoreflectance spectra

Review of scientific instruments, 1994-06, Vol.65 (6), p.1988-1992

1994

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Optical constants of Ga1−xInxAsySb1−y lattice matched to GaSb (001): Experiment and modeling

Journal of applied physics, 2000-02, Vol.87 (4), p.1780-1787

2000

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Spectral ellipsometry of GaSb: Experiment and modeling

Physical review. B, Condensed matter, 1999-09, Vol.60 (11), p.8105-8110

1999

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Band-to-band transitions and free exciton states in low-symmetry crystalline GaTe

Solid state communications, 1997-04, Vol.102 (1), p.17-21

1997

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Piezoreflectance and photoreflectance study of GaAs/AlGaAs digital alloy compositional graded structures

Journal of applied physics, 1996-01, Vol.79 (1), p.460-466

1996

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Composition and temperature dependence of the direct band GaP of GaAs1-xNx (0≤x≤0.0232) using contactless electroreflectance

Journal of electronic materials, 1998-05, Vol.27 (5), p.484-487

1998

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Generalized Franz-Keldysh theory of electromodulation

Physical review. B, Condensed matter, 1990-10, Vol.42 (11), p.7097-7102

1990

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Optical properties of CdTe1−xSx (0⩽x⩽1): Experiment and modeling

Journal of applied physics, 1999-05, Vol.85 (10), p.7418-7425

1999

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Surface photovoltage spectroscopy, photoreflectance, and reflectivity characterization of an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser including temperature dependence

Applied physics letters, 2000-07, Vol.77 (1), p.37-39

2000

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Optical constants of In0.53Ga0.47As/InP: Experiment and modeling

Journal of applied physics, 2002-11, Vol.92 (10), p.5878-5885

2002

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Raman scattering in alloy semiconductors: Spatial correlation model

Physical review letters, 1984-01, Vol.52 (20), p.1822-1825

1984

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Contactless electroreflectance study of a vertically coupled quantum dot-based InAs/GaAs laser structure

Applied physics letters, 1997-06, Vol.70 (25), p.3329-3331

1997

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Novel contactless mode of electroreflectance

Applied physics letters, 1991-10, Vol.59 (18), p.2305-2307

1991

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Raman Spectroscopy as a Morphological Probe for TiO2 Aerogels

Thermal conductivity of GaN films: Effects of impurities and dislocations

Effect of dislocations on thermal conductivity of GaN layers

Modulation spectroscopy of semiconductors: bulk/thin film, microstructures, surfaces/interfaces and devices

Study of semiconductor surfaces and interfaces using electromodulation

Band offset determination of Zn0.53Cd0.47Se/Zn0.29Cd0.24Mg0.47Se

Thermal conductivity of fully and partially coalesced lateral epitaxial overgrown GaN/sapphire (0001) by scanning thermal microscopy

High spatial resolution thermal conductivity of bulk ZnO (0001)

High spatial resolution thermal conductivity and Raman spectroscopy investigation of hydride vapor phase epitaxy grown n-GaN/sapphire (0001): Doping dependence

Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III–V semiconductor device structures

High spatial resolution thermal conductivity of lateral epitaxial overgrown GaN/sapphire (0001) using a scanning thermal microscope

Determination of the thermal conductivity of diamond-like nanocomposite films using a scanning thermal microscope

A new offset technique for suppression of spurious signals in photoreflectance spectra

Optical constants of Ga1−xInxAsySb1−y lattice matched to GaSb (001): Experiment and modeling

Spectral ellipsometry of GaSb: Experiment and modeling

Band-to-band transitions and free exciton states in low-symmetry crystalline GaTe

Piezoreflectance and photoreflectance study of GaAs/AlGaAs digital alloy compositional graded structures

Composition and temperature dependence of the direct band GaP of GaAs1-xNx (0≤x≤0.0232) using contactless electroreflectance

Generalized Franz-Keldysh theory of electromodulation

Optical properties of CdTe1−xSx (0⩽x⩽1): Experiment and modeling

Surface photovoltage spectroscopy, photoreflectance, and reflectivity characterization of an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser including temperature dependence

Optical constants of In0.53Ga0.47As/InP: Experiment and modeling

Raman scattering in alloy semiconductors: Spatial correlation model

Contactless electroreflectance study of a vertically coupled quantum dot-based InAs/GaAs laser structure

Novel contactless mode of electroreflectance

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