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Multilayered mirrors based on La/B4C(B9C) for X-ray range near anomalous dispersion of boron (λ≈6.7nm)
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-05, Vol.603 (1-2), p.80-82
2009
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Refined thermal stability of Cr/Sc multilayers with Si(Be) barrier layers
Applied surface science, 2023-02, Vol.611, p.155743, Article 155743
2023
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Increasing the thermal stability of a Cr/Sc multilayer by nitriding
Applied surface science, 2024-01, Vol.644, p.158791, Article 158791
2024
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Effect of annealing on layer intermixing in nanoscale Cr/Ti multilayers depending on the period value
Applied surface science, 2024-11, Vol.672, p.160839, Article 160839
2024
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Highly reflective Mo/Be/Si multilayer mirrors with zero stress values for 13.5 nm wavelength
Thin solid films, 2023-10, Vol.782, p.140044, Article 140044
2023
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Layer intermixing in ultrathin Cr/Be layered system and impact of barrier layers on interface region
Applied surface science, 2021-12, Vol.570, p.151114, Article 151114
2021
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X-ray photoelectron studies of near surface oxidation and plasmon excitation in spatially confined bi- and tri- layers periodic multilayer mirrors
Thin solid films, 2021-01, Vol.717, p.138449, Article 138449
2021
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Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17 nm wavelength
Thin solid films, 2017-06, Vol.631, p.106-111
2017
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Phase-microstructure of Mo/Si nanoscale multilayer and intermetallic compound formation in interfaces
Intermetallics, 2020-10, Vol.125, p.106872, Article 106872
2020
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High-performance facility and techniques for high-precision machining of optical components by ion beams
Precision engineering, 2017-04, Vol.48, p.338-346
2017
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Effect of ion beam etching on the surface roughness of bare and silicon covered beryllium films
Surface & coatings technology, 2017-02, Vol.311, p.351-356
2017
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Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques
Thin solid films, 2013-07, Vol.540, p.96-105
2013
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Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17nm wavelength
Thin solid films, 2017-06, Vol.631, p.106-111
2017
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Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures
Thin solid films, 2018-09, Vol.661, p.65-70
2018
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Measurements of the absolute intensities of spectral lines of Kr, Ar, and O ions in the wavelength range of 10 – 18 nm under pulsed laser excitation
Quantum electronics (Woodbury, N.Y.), 2021-08, Vol.51 (8), p.700-707
2021
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The role of ultra-thin carbon barrier layers for fabrication of La/B4C interferential mirrors: Study by time-of-flight secondary ion mass spectrometry and high-resolution transmission electron microscopy
Thin solid films, 2015-02, Vol.577, p.11-16
2015
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Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources
Quantum electronics (Woodbury, N.Y.), 2020-04, Vol.50 (4), p.401-407
2020
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Comparison of approaches in the manufacture of broadband mirrors for the EUV range: aperiodic and stack structures
Quantum electronics (Woodbury, N.Y.), 2019-04, Vol.49 (4), p.380-385
2019
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Lasing efficiency of krypton ions in the (8 - 14)-nm band upon pulsed laser excitation
Quantum electronics (Woodbury, N.Y.), 2020-04, Vol.50 (4), p.408-413
2020
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Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5-50 nm: description and testing results
Quantum electronics (Woodbury, N.Y.), 2017-05, Vol.47 (4), p.385-392
2017
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Optical Elements: Effect of structural defects of aperiodic multilayer mirrors on the properties of reflected (sub)femtosecond pulses
Quantum electronics (Woodbury, N.Y.), 2017-05, Vol.47 (4), p.378-384
2017
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X-ray optical system for imaging laser plumes with a spatial resolution of up to
Quantum electronics (Woodbury, N.Y.), 2016-04, Vol.46 (4), p.347-352
2016
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Effect of roughness, deterministic and random errors in film thickness on the reflecting properties of aperiodic mirrors for the EUV range
Quantum electronics (Woodbury, N.Y.), 2016-01, Vol.46 (5), p.406-413
2016
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Manufacturing of XEUV mirrors with a sub-nanometer surface shape accuracy
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-05, Vol.603 (1), p.62-65
2009
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Multilayered mirrors based on La/B 4C(B 9C) for X-ray range near anomalous dispersion of boron ( λ≈6.7 nm)
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009, Vol.603 (1), p.80-82
2009
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