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Room temperature, single mode emission from two-section coupled cavity InGaAs/AlGaAs/GaAs quantum cascade laser

Journal of applied physics, 2015-10, Vol.118 (13)

2015

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Nanometer scale patterning of GaN using nanoimprint lithography and Inductively Coupled Plasma etching

Microelectronic engineering, 2015-02, Vol.133, p.129-133

2015

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Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-04, Vol.348, p.106-110

2015

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Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

Journal of microscopy (Oxford), 2010-03, Vol.237 (3), p.304-307

2010

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Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements

Applied physics letters, 2008-07, Vol.93 (4)

2008

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Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure

Microelectronics and reliability, 2019-08, Vol.99, p.113-118

2019

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Measurement of Magnetic Field Distorting the Electron Beam Direction in Scanning Electron Microscope

IEEE transactions on instrumentation and measurement, 2009-01, Vol.58 (1), p.173-179

2009

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Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

Journal of microscopy (Oxford), 2010-03, Vol.237 (3), p.325-328

2010

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Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.89-92

2006

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New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

Journal of microscopy (Oxford), 2009-11, Vol.236 (2), p.137-142

2009

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Buried amorphous‐layer impact on dislocation densities in silicon

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.104-107

2006

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Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

Archives of metallurgy and materials, 2013-01, Vol.58 (2), p.413-417

2013

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Dependence of Tin Whisker Growth on Copper and Oxygen Content on the Surface of Tin-Rich Lead Free Alloys

Acta physica Polonica, A, 2013-02, Vol.123 (2), p.430-431

2013

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Impact of resistance on cathodoluminescence and its applicationfor layer sheet-resistance measurements

Applied physics letters, 2008-07, Vol.93 (4), p.041109-041109-3

2008

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Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements

Acta physica Polonica, A, 2014-04, Vol.125 (4), p.1027-1032

2014

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Resistance and sheet resistance measurements using electron beam induced current

Applied physics letters, 2006-12, Vol.89 (24), p.241919-241919-3

2006

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ZnO nanostructures by atomic layer deposition method

Journal of physics. Conference series, 2009-01, Vol.146 (1), p.012017

2009

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In situ electron beam induced current measurements of the local thickness in semiconductor devices

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.86-88

2006

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Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology

Acta physica Polonica, A, 2009-12, Vol.116 (Supplement), p.S-45-S-47

2009

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Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current

Acta physica Polonica, A, 2009-12, Vol.116 (Supplement), p.S-86-S-88

2009

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Fabrication and properties of GaN-based lasers

Journal of crystal growth, 2008-08, Vol.310 (17), p.3979-3982

2008

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What is new in nitride laser diodes reliability studies

Physica status solidi. C, 2009-06, Vol.6 (S2), p.S881-S884

2009

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The design methodology for the verification of hybrid dynamical systems

2011 IEEE 10th International Conference on Cybernetic Intelligent Systems (CIS), 2011, p.133-138

2011

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The design methodology for hybrid system verification

2010 IEEE 9th International Conference on Cyberntic Intelligent Systems, 2010, p.1-6

2010

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Quantitative Measurement of Electromagnetic Distortions in Scanning Electron Microscope (SEM)

2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 2007, p.1-4

2007

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Room temperature, single mode emission from two-section coupled cavity InGaAs/AlGaAs/GaAs quantum cascade laser

Nanometer scale patterning of GaN using nanoimprint lithography and Inductively Coupled Plasma etching

Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements

Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure

Measurement of Magnetic Field Distorting the Electron Beam Direction in Scanning Electron Microscope

Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods

New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

Buried amorphous‐layer impact on dislocation densities in silicon

Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

Dependence of Tin Whisker Growth on Copper and Oxygen Content on the Surface of Tin-Rich Lead Free Alloys

Impact of resistance on cathodoluminescence and its applicationfor layer sheet-resistance measurements

Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements

Resistance and sheet resistance measurements using electron beam induced current

ZnO nanostructures by atomic layer deposition method

In situ electron beam induced current measurements of the local thickness in semiconductor devices

Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology

Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current

Fabrication and properties of GaN-based lasers

What is new in nitride laser diodes reliability studies

The design methodology for the verification of hybrid dynamical systems

The design methodology for hybrid system verification

Quantitative Measurement of Electromagnetic Distortions in Scanning Electron Microscope (SEM)

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