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Thermal effects induced lateral head shift of thermal flying height control perpendicular magnetic recording head

Journal of physics. D, Applied physics, 2010-01, Vol.43 (3), p.035001-035001

2010

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Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Solar energy materials and solar cells, 2011-09, Vol.95 (9), p.2632-2637

2011

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Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells

Solar energy materials and solar cells, 2015-02, Vol.133, p.143-147

2015

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Negative backside thermoreflectance modulation of microscale metal interconnects

Electronics letters, 2011-07, Vol.47 (14), p.821-822

2011

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Design considerations for refractive solid immersion lens: application to subsurface integrated circuit fault localization using laser induced techniques

Review of scientific instruments, 2009-01, Vol.80 (1), p.013703-013703

2009

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Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations

Microelectronics and reliability, 2009-09, Vol.49 (9), p.1165-1168

2009

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Near-field detection of photon emission from silicon with 30 nm spatial resolution

Microelectronics and reliability, 2008-08, Vol.48 (8), p.1285-1288

2008

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Determination of secondary electron yield from insulators due to a low-kV electron beam

Journal of applied physics, 1998-10, Vol.84 (8), p.4543-4548

1998

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Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics

IEEE transactions on electron devices, 1987-02, Vol.34 (2), p.286-293

1987

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Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy

2010 IEEE International Reliability Physics Symposium, 2010, p.271-276

2010

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SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

2010 IEEE International Reliability Physics Symposium, 2010, p.503-507

2010

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Ion beam induced charge microscopy studies of power diodes

Journal of physics. Condensed matter, 2004-01, Vol.16 (2), p.S57-S66

2004

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Failure analysis of integrated devices by scanning thermal microscopy (SThM)

Microelectronics and reliability, 1998-06, Vol.38 (6), p.957-961

1998

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Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.003686-003691

2010

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A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

IEEE transactions on electron devices, 1995-05, Vol.42 (5), p.963-968

1995

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True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide films

Applied physics letters, 1993-10, Vol.63 (16), p.2240-2242

1993

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Optical near-field probe with embedded gallium scattering center

Applied physics letters, 2009-06, Vol.94 (25), p.253108-253108-3

2009

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Negative backside thermoreflectance modulation of microscale metal interconnects

Electronics letters, 2011-07, Vol.47 (14), p.1-1

2011

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The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate

Journal of physics. D, Applied physics, 1999-07, Vol.32 (14), p.1563-1569

1999

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Characterization of electronic materials and devices by scanning near-field microscopy

Applied physics. A, Materials science & processing, 2007-06, Vol.87 (3), p.443-449

2007

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Accurate analytical method for the extraction of solar cell model parameters

Electronics letters, 1984-05, Vol.20 (10), p.406-408

1984

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Automatic Integrated Circuit Die Positioning in the Scanning Electron Microscope

Scanning, 2002-03, Vol.24 (2), p.86-91

2002

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Nondestructive Defect Characterization of Saw-Damage-Etched Multicrystalline Silicon Wafers Using Scanning Electron Acoustic Microscopy

IEEE journal of photovoltaics, 2013-01, Vol.3 (1), p.370-374

2013

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A robust focusing and astigmatism correction method for the scanning electron microscope-Part III: An improved technique

Scanning, 1998-08, Vol.20 (5), p.357-368

1998

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Single contact electron beam induced current technique for solar cell characterization

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0951-0955

2013

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Thermal effects induced lateral head shift of thermal flying height control perpendicular magnetic recording head

Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells

Negative backside thermoreflectance modulation of microscale metal interconnects

Design considerations for refractive solid immersion lens: application to subsurface integrated circuit fault localization using laser induced techniques

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations

Near-field detection of photon emission from silicon with 30 nm spatial resolution

Determination of secondary electron yield from insulators due to a low-kV electron beam

Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics

Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

Ion beam induced charge microscopy studies of power diodes

Failure analysis of integrated devices by scanning thermal microscopy (SThM)

Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance

A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide films

Optical near-field probe with embedded gallium scattering center

Negative backside thermoreflectance modulation of microscale metal interconnects

The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate

Characterization of electronic materials and devices by scanning near-field microscopy

Accurate analytical method for the extraction of solar cell model parameters

Automatic Integrated Circuit Die Positioning in the Scanning Electron Microscope

Nondestructive Defect Characterization of Saw-Damage-Etched Multicrystalline Silicon Wafers Using Scanning Electron Acoustic Microscopy

A robust focusing and astigmatism correction method for the scanning electron microscope-Part III: An improved technique

Single contact electron beam induced current technique for solar cell characterization

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