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Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

Ultramicroscopy, 2001-04, Vol.87 (3), p.97-104

2001

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Chemical and biological integration of a mouldable bioactive ceramic material capable of forming apatite in vivo in teeth

Biomaterials, 2004-06, Vol.25 (14), p.2781-2787

2004

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Microscopy Study of Intergranular Stress Corrosion Cracking of X-52 Line Pipe Steel

Corrosion (Houston, Tex.), 2006-04, Vol.62 (4), p.316-322

2006

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Characterisation of smooth fine-grained diamond coatings on titanium alloy by TEM/EELS, Raman spectroscopy and X-ray diffraction

Diamond and related materials, 2002-08, Vol.11 (8), p.1544-1551

2002

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Applications of focused ion beam microscopy to materials science specimens

Micron (Oxford, England : 1993), 1999-06, Vol.30 (3), p.277-288

Phaneuf, M.W

1999

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A novel tool for high-resolution transmission electron microscopy of intact interfaces between bone and metallic implants

Journal of biomedical materials research, 2006-07, Vol.78A (1), p.20-24

2006

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TEM study of nanopores and the embrittlement of CVD nickel foam

Materials science and technology, 2004-11, Vol.20 (11), p.1421-1426

2004

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Application of focused ion beam (FIB) microscopy to the study of crack profiles

Fatigue & fracture of engineering materials & structures, 1999-03, Vol.22 (3), p.251-256

1999

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Imaging damage evolution in a small particle metal matrix composite

Journal of microscopy (Oxford), 1999-11, Vol.196 (2), p.146-154

1999

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Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.620-621

2008

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High Resolution FIB as a General Materials Science Tool

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.492-493

1998

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“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.566-567

2002

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Microstructural Analysis of Lead-Induced Transgranular SCC of Alloy 690 in PbO + 10% NaOH Solution

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.644-645

2008

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Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1114-1115

2004

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Extraction of second phases from magnesium and aluminum alloys for analytical electron microscopy

Microscopy research and technique, 1994-08, Vol.28 (5), p.422-426

1994

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Site-specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel- Based Alloys Using the FIB “Plan-View Lift-Out” Technique

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.1266-1267

2002

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Focused ion beam and transmission electron microscopy method for root cause analysis of InP ridge laser devices

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2004-05, Vol.22 (3), p.930-934

2004

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Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1140-1141

2004

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Transmittance of a bioceramic dental restorative material based on calcium aluminate

Journal of biomedical materials research, 2004-04, Vol.69B (1), p.94-98

2004

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Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM

Micron (Oxford, England : 1993), 1999-04, Vol.30 (2), p.109-119

1999

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Understanding Complex Microstructures With High-Resolution Microanalysis in the Transmission Electron Microscope

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.338-339

2002

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Contributions of Microscopy to Advanced Industrial Materials and Processing

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.188-189

2002

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Focused Ion Beam Sample Preparation of Non-Semiconductor Materials

MRS proceedings, 1997, Vol.480, Article 39

1997

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Microstructure of a Stellite/Steel Clad Interface

Microscopy and microanalysis, 2005-08, Vol.11 (S02), p.2014-2015

2005

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Direct observation of amorphous and nanocrystalline phases in commercial galvannealed steel sheet

Scripta metallurgica et materialia, 1994-07, Vol.31 (1), p.1-4

1994

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Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

Chemical and biological integration of a mouldable bioactive ceramic material capable of forming apatite in vivo in teeth

Microscopy Study of Intergranular Stress Corrosion Cracking of X-52 Line Pipe Steel

Characterisation of smooth fine-grained diamond coatings on titanium alloy by TEM/EELS, Raman spectroscopy and X-ray diffraction

Applications of focused ion beam microscopy to materials science specimens

A novel tool for high-resolution transmission electron microscopy of intact interfaces between bone and metallic implants

TEM study of nanopores and the embrittlement of CVD nickel foam

Application of focused ion beam (FIB) microscopy to the study of crack profiles

Imaging damage evolution in a small particle metal matrix composite

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector

High Resolution FIB as a General Materials Science Tool

“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

Microstructural Analysis of Lead-Induced Transgranular SCC of Alloy 690 in PbO + 10% NaOH Solution

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum

Extraction of second phases from magnesium and aluminum alloys for analytical electron microscopy

Site-specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel- Based Alloys Using the FIB “Plan-View Lift-Out” Technique

Focused ion beam and transmission electron microscopy method for root cause analysis of InP ridge laser devices

Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques

Transmittance of a bioceramic dental restorative material based on calcium aluminate

Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM

Understanding Complex Microstructures With High-Resolution Microanalysis in the Transmission Electron Microscope

Contributions of Microscopy to Advanced Industrial Materials and Processing

Focused Ion Beam Sample Preparation of Non-Semiconductor Materials

Microstructure of a Stellite/Steel Clad Interface

Direct observation of amorphous and nanocrystalline phases in commercial galvannealed steel sheet

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