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Direct measurement of molecular stiffness and damping in confined water layers

Physical review. B, Condensed matter and materials physics, 2004-08, Vol.70 (5), p.054114.1-054114.8, Article 054114

2004

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Energy dissipation in atomic force microscopy and atomic loss processes

Physical review letters, 2001-12, Vol.87 (26), p.265502-265502, Article 265502

2001

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Indentation mechanics of Cu–Be quantified by an in situ transmission electron microscopy mechanical probe

Journal of materials research, 2005-10, Vol.20 (10), p.2726-2732

2005

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Size-dependent Phase Transformations During Point Loading of Silicon

Journal of materials research, 2000-08, Vol.15 (8), p.1754-1758

2000

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Influence of elastic strains on the mask ratio in glassy polymer nanoimprint

Applied physics letters, 2005-02, Vol.86 (8), p.081902-081902-3

2005

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Manipulation of atoms across a surface at room temperature

Nature (London), 2000-04, Vol.404 (6779), p.743-745

2000

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High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

Review of scientific instruments, 2003-08, Vol.74 (8), p.3656-3663

2003

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Direct mechanical measurement of interatomic potentials

Nature (London), 1996-11, Vol.384 (6606), p.247-249

1996

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Growth of Ge on Si(100) and Si(113) studied by STM

Surface science, 1992-04, Vol.265 (1), p.156-167

1992

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Nanoindentation creep of single-crystal tungsten and gallium arsenide

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1997-12, Vol.76 (6), p.1105-1118

1997

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Atomic force microscopy of local compliance at solid—liquid interfaces

Chemical physics letters, 1994-06, Vol.223 (4), p.336-340

1994

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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Applied physics letters, 2001-09, Vol.79 (12), p.1915-1917

2001

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Instrumented indentation testing for local characterisation of polymer properties after nanoimprint

Microelectronic engineering, 2005-03, Vol.78, p.618-624

2005

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The role of atomic size asperities in the mechanical deformation of nanocontacts

Applied physics letters, 1996-08, Vol.69 (7), p.907-909

1996

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Observation of a nanoscale chessboard superstructure in the Br–Cu(100) adsorbate system

Surface science, 2000-01, Vol.445 (1), p.L47-L52

2000

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Nanoindentation Studies in a Liquid Environment

Langmuir, 1996-09, Vol.12 (19), p.4583-4586

1996

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Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences, 2001-05, Vol.457 (2009), p.1161-1174

2001

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Effect of roughness on the measurement of nanohardness—a computer simulation study

Applied physics letters, 1997-08, Vol.71 (8), p.1059-1061

1997

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Surface science The insulator uncovered

Nature (London), 2001-11, Vol.414 (6859), p.27-29

2001

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Strain-rate sensitivity of hardness of nanocrystalline Ni75at.%Al25at.% alloy film

Journal of materials research, 2003-02, Vol.18 (2), p.382-386

2003

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The influence of mechanical stress on the dielectric breakdown field strength of thin SiO2 films

Applied physics letters, 1998-07, Vol.73 (2), p.172-174

1998

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Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Nanotechnology, 2004-02, Vol.15 (2), p.S5-S8

2004

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A density functional study of Br on Cu( [formula omitted]) at low coverages

Surface science, 2003-02, Vol.524 (1), p.141-147

2003

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The surface structure of SnO2(110)(4 × 1) revealed by scanning tunneling microscopy

Surface science, 1997-04, Vol.376 (1-3), p.367-373

1997

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Quantitative electrostatic force measurement in AFM

Applied surface science, 2000-04, Vol.157 (4), p.280-284

2000

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Direct measurement of molecular stiffness and damping in confined water layers

Energy dissipation in atomic force microscopy and atomic loss processes

Indentation mechanics of Cu–Be quantified by an in situ transmission electron microscopy mechanical probe

Size-dependent Phase Transformations During Point Loading of Silicon

Influence of elastic strains on the mask ratio in glassy polymer nanoimprint

Manipulation of atoms across a surface at room temperature

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

Direct mechanical measurement of interatomic potentials

Growth of Ge on Si(100) and Si(113) studied by STM

Nanoindentation creep of single-crystal tungsten and gallium arsenide

Atomic force microscopy of local compliance at solid—liquid interfaces

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Instrumented indentation testing for local characterisation of polymer properties after nanoimprint

The role of atomic size asperities in the mechanical deformation of nanocontacts

Observation of a nanoscale chessboard superstructure in the Br–Cu(100) adsorbate system

Nanoindentation Studies in a Liquid Environment

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Effect of roughness on the measurement of nanohardness—a computer simulation study

Surface science The insulator uncovered

Strain-rate sensitivity of hardness of nanocrystalline Ni75at.%Al25at.% alloy film

The influence of mechanical stress on the dielectric breakdown field strength of thin SiO2 films

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

A density functional study of Br on Cu( [formula omitted]) at low coverages

The surface structure of SnO2(110)(4 × 1) revealed by scanning tunneling microscopy

Quantitative electrostatic force measurement in AFM

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