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IEEE journal of solid-state circuits, 2010-04, Vol.45 (4), p.817-829
2010
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Proceedings of the 26th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, 2021, p.600-615
- Ranganathan, Parthasarathy
- Stodolsky, Daniel
- Calow, Jeff
- Dorfman, Jeremy
- Guevara, Marisabel
- Smullen IV, Clinton Wills
- Kuusela, Aki
- Balasubramanian, Raghu
- Bhatia, Sandeep
- Chauhan, Prakash
- Cheung, Anna
- Chong, In Suk
- Dasharathi, Niranjani
- Feng, Jia
- Fosco, Brian
- Foss, Samuel
- Gelb, Ben
- Gwin, Sara J.
- Hase, Yoshiaki
- He, Da-ke
- Ho, C. Richard
- Huffman Jr, Roy W.
- Indupalli, Elisha
- Jayaram, Indira
- Kongetira, Poonacha
- Kyaw, Cho Mon
- Laursen, Aaron
- Li, Yuan
- Lou, Fong
- Lucke, Kyle A.
- Maaninen, JP
- Macias, Ramon
- Mahony, Maire
- Munday, David Alexander
- Muroor, Srikanth
- Penukonda, Narayana
- Perkins-Argueta, Eric
- Persaud, Devin
- Ramirez, Alex
- Rautio, Ville-Mikko
- Ripley, Yolanda
- Salek, Amir
- Sekar, Sathish
- Sokolov, Sergey N.
- Springer, Rob
- Stark, Don
- Tan, Mercedes
- Wachsler, Mark S.
- Walton, Andrew C.
- Wickeraad, David A.
- Wijaya, Alvin
- Wu, Hon Kwan
2021
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2010 IEEE International Conference on Integrated Circuit Design and Technology, 2010, p.142-145
2010
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2009 Symposium on VLSI Circuits, 2009, p.108-109
2009
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- Aging
- Human Computer Interaction
- Monitoring
- Semiconductor Device Measurement
- Dielectric Breakdown
- Frequency Measurement
- Hot Carrier Injection
- Science & Technology
- Silicon
- Stress Measurement
- Technology
- Applied Sciences
- Automation
- Bias Temperature Instability
- Circuit Properties
- Circuit Reliability
- Circuits
- Computer Science
- Computer Science, Hardware & Architecture
- Computer Science, Software Engineering
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