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2000 IEEE International Symposium on Compound Semiconductors. Proceedings of the IEEE Twenty-Seventh International Symposium on Compound Semiconductors (Cat. No.00TH8498), 2000, p.179-184

2000

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Single event functional interrupt (SEFI) sensitivity in microcircuits

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294), 1997, p.311-318

1997

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IEEE_Xplore

The SEU in pulse width modulation controllers with soft start and shutdown circuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference, 1997, p.73-79

1997

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IEEE_Xplore

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Promising Technologies for Liquid Radwaste Management in the Nuclear Industry

Experience of Operating an Integrated Selective-Sorption Liquid-Radwaste Reprocessing Plant at SRC Zvezdochka

Tests of membrane-sorption decontamination of the reservoir cascade of the Techa river

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Simulation of electron tunneling in HEMT devices

Single event functional interrupt (SEFI) sensitivity in microcircuits

The SEU in pulse width modulation controllers with soft start and shutdown circuits

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