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Grain refining mechanism in the Al/Al–Ti–B system

Acta materialia, 2015-02, Vol.84, p.292-304

2015

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On central focusing for contrast optimization in direct electron ptychography of thick samples

Ultramicroscopy, 2024-02, Vol.256, p.113879-113879, Article 113879

2024

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Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures

Nature communications, 2016-08, Vol.7 (1), p.12532-8, Article 12532

2016

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Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications

Ultramicroscopy, 2022-03, Vol.233, p.113423-113423, Article 113423

2022

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Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning

Nature communications, 2015-06, Vol.6 (1), p.7266-7266, Article 7266

2015

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Ferromagnetic order controlled by the magnetic interface of LaNiO3/La2/3Ca1/3MnO3 superlattices

Scientific reports, 2023-03, Vol.13 (1), p.3847-3847, Article 3847

2023

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Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Ultramicroscopy, 2013-10, Vol.133, p.109-119

2013

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Misfit accommodation in oxide thin film heterostructures

Acta materialia, 2013-05, Vol.61 (8), p.2725-2733

2013

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Tailoring Interface Structure in Highly Strained YSZ/STO Heterostructures

Advanced materials (Weinheim), 2011-11, Vol.23 (44), p.5268-5274

2011

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Structure evolution of h.c.p./c.c.p. metal oxide interfaces in solid‐state reactions

Acta crystallographica. Section A, Foundations and advances, 2018-09, Vol.74 (5), p.466-480

2018

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S-Te Interdiffusion within Grains and Grain Boundaries in CdTe Solar Cells

IEEE journal of photovoltaics, 2014-11, Vol.4 (6), p.1636-1643

2014

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Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn(4+)-Rich Antiphase Boundaries

Nanoscale research letters, 2015-12, Vol.10 (1), p.407-407

2015

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Formation of pre-silicide layers below Ni1−xPtxSi/Si interfaces

Acta materialia, 2013-04, Vol.61 (7), p.2481-2488

2013

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Epitaxial growth and enhanced conductivity of an IT-SOFC cathode based on a complex perovskite superstructure with six distinct cation sites

Chemical science (Cambridge), 2013-05, Vol.4 (6), p.2403

2013

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Microstructural Characterization of Manganese Oxides Supercapacitors based on Liquid-phase Exfoliated for Energy Storage Applications

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1530-1531

2013

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Dislocation core structures in (0001) InGaN

Journal of applied physics, 2016-03, Vol.119 (10)

2016

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Dislocation core structures in Si-doped GaN

Applied physics letters, 2015-12, Vol.107 (24)

2015

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Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn4+-Rich Antiphase Boundaries

Nanoscale research letters, 2015-10, Vol.10 (1), Article 407

2015

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Dynamics and White Light Emission from CdSe Nanocrystals

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1830-1831

2012

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Interpreting atomic-resolution spectroscopic images

Physical review. B, Condensed matter and materials physics, 2007-08, Vol.76 (6), Article 064303

2007

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Probing the core-shell-shell structure of CdSe/CdTe/CdS type II quantum dots for solar cell applications

Journal of physics. Conference series, 2014-01, Vol.522 (1), p.12069-4

2014

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Insights Into Energy Materials Through Aberration-Corrected STEM

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1354-1355

2012

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Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.344-345

2012

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Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

Applied physics letters, 2022-08, Vol.121 (8)

2022

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Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.436-437

2017

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Grain refining mechanism in the Al/Al–Ti–B system

On central focusing for contrast optimization in direct electron ptychography of thick samples

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures

Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications

Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning

Ferromagnetic order controlled by the magnetic interface of LaNiO3/La2/3Ca1/3MnO3 superlattices

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Misfit accommodation in oxide thin film heterostructures

Tailoring Interface Structure in Highly Strained YSZ/STO Heterostructures

Structure evolution of h.c.p./c.c.p. metal oxide interfaces in solid‐state reactions

S-Te Interdiffusion within Grains and Grain Boundaries in CdTe Solar Cells

Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn(4+)-Rich Antiphase Boundaries

Formation of pre-silicide layers below Ni1−xPtxSi/Si interfaces

Epitaxial growth and enhanced conductivity of an IT-SOFC cathode based on a complex perovskite superstructure with six distinct cation sites

Microstructural Characterization of Manganese Oxides Supercapacitors based on Liquid-phase Exfoliated for Energy Storage Applications

Dislocation core structures in (0001) InGaN

Dislocation core structures in Si-doped GaN

Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn4+-Rich Antiphase Boundaries

Dynamics and White Light Emission from CdSe Nanocrystals

Interpreting atomic-resolution spectroscopic images

Probing the core-shell-shell structure of CdSe/CdTe/CdS type II quantum dots for solar cell applications

Insights Into Energy Materials Through Aberration-Corrected STEM

Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface

Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope

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