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Total ionizing dose effects in bipolar devices and circuits

IEEE transactions on nuclear science, 2003-06, Vol.50 (3), p.539-551

Pease, R.L.

2003

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IEEE_Xplore

Structural Basis of Plasticity in T Cell Receptor Recognition of a Self Peptide-MHC Antigen

Science (American Association for the Advancement of Science), 1998-02, Vol.279 (5354), p.1166-1172

1998

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Immunomodulation using the recombinant monoclonal human B7‐DC cross‐linking antibody rHIgM12

Clinical and experimental immunology, 2006-02, Vol.143 (2), p.314-321

2006

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From Displacement Damage to ELDRS: Fifty Years of Bipolar Transistor Radiation Effects at the NSREC

IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1731-1739

2013

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IEEE_Xplore

Gene splicing by overlap extension: tailor-made genes using the polymerase chain reaction

BioTechniques, 1990-05, Vol.8 (5), p.528

1990

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Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.1871-1883

1994

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IEEE_Xplore

Analytical model for proton radiation effects in bipolar devices

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2643-2649

2002

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IEEE_Xplore

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3649-3654

2006

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IEEE_Xplore

Modeling Total-Dose Effects for a Low-Dropout Voltage Regulator

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3223-3231

2006

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IEEE_Xplore

Preservation of motor function by inhibition of CD8+ virus peptide‐specific T cells in Theiler's virus infection

The FASEB journal, 2001-12, Vol.15 (14), p.1-22

2001

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Humoral autoimmunity as a mediator of CNS repair

Trends in Neurosciences, 2001-11, Vol.24 (11), p.S39-S44

2001

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Site-directed mutagenesis by overlap extension using the polymerase chain reaction

Gene, 1989-04, Vol.77 (1), p.51-59

1989

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Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.1913-1919

2007

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IEEE_Xplore

Assessment of gated sweep technique for total dose and dose rate analysis in bipolar oxides

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3723-3729

2004

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IEEE_Xplore

Engineering hybrid genes without the use of restriction enzymes: gene splicing by overlap extension

Gene, 1989-04, Vol.77 (1), p.61-68

1989

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Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs

IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.2539-2545

2000

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IEEE_Xplore

The role of parasitic elements in the single-event transient response of linear circuits

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.3115-3120

2002

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IEEE_Xplore

Dependence of total dose response of bipolar linear microcircuits on applied dose rate

IEEE transactions on nuclear science, 1994-12, Vol.41 (6), p.2544-2549

1994

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IEEE_Xplore

Charge separation for bipolar transistors

IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1276-1285

1993

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IEEE_Xplore

Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.1989-2000

1997

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IEEE_Xplore

Subbandgap laser-induced single event effects: carrier generation via two-photon absorption

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.3002-3008

2002

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IEEE_Xplore

Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3326-3333

2009

Link zum Volltext
IEEE_Xplore

Response of advanced bipolar processes to ionizing radiation

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1342-1351

1991

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IEEE_Xplore

Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3196-3202

2009

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IEEE_Xplore

Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

IEEE transactions on nuclear science, 2002-06, Vol.49 (3), p.1502-1508

2002

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IEEE_Xplore

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Total ionizing dose effects in bipolar devices and circuits

Structural Basis of Plasticity in T Cell Receptor Recognition of a Self Peptide-MHC Antigen

Immunomodulation using the recombinant monoclonal human B7‐DC cross‐linking antibody rHIgM12

From Displacement Damage to ELDRS: Fifty Years of Bipolar Transistor Radiation Effects at the NSREC

Gene splicing by overlap extension: tailor-made genes using the polymerase chain reaction

Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates

Analytical model for proton radiation effects in bipolar devices

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

Modeling Total-Dose Effects for a Low-Dropout Voltage Regulator

Preservation of motor function by inhibition of CD8+ virus peptide‐specific T cells in Theiler's virus infection

Humoral autoimmunity as a mediator of CNS repair

Site-directed mutagenesis by overlap extension using the polymerase chain reaction

Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

Assessment of gated sweep technique for total dose and dose rate analysis in bipolar oxides

Engineering hybrid genes without the use of restriction enzymes: gene splicing by overlap extension

Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs

The role of parasitic elements in the single-event transient response of linear circuits

Dependence of total dose response of bipolar linear microcircuits on applied dose rate

Charge separation for bipolar transistors

Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

Subbandgap laser-induced single event effects: carrier generation via two-photon absorption

Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits

Response of advanced bipolar processes to ionizing radiation

Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies

Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

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