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Extraction of device S‐parameters within board by using a TRL de‐embedding technique

Microwave and optical technology letters, 2018-11, Vol.60 (11), p.2647-2651

2018

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Analytical extraction of the noise sources characteristics of a bipolar transistor

International journal of numerical modelling, 2015, p.1-3

2015

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New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism

IEEE transactions on microwave theory and techniques, 2008-09, Vol.56 (9), p.2136-2142

2008

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CAD-Oriented Model of a Coplanar Line on a Silicon Substrate Including Eddy-Current Effects and Skin Effect

IEEE transactions on microwave theory and techniques, 2008-03, Vol.56 (3), p.663-670

2008

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Bonding-Wire-Geometric-Profile-Dependent Model for Mutual Coupling Between Two Bonding Wires on a Glass Substrate

IEEE transactions on components, packaging, and manufacturing technology (2011), 2015-01, Vol.5 (1), p.119-127

2015

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SiGe heterojunction bipolar phototransistor for optics–microwaves interfacing

International journal of microwave and wireless technologies, 2011-12, Vol.3 (6), p.633-636

2011

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Analytic description, measurements, and modeling of 3D-embedded silicon inductance for High-Performance Hybrid Systems Applications

International journal of microwave and wireless technologies, 2013-08, Vol.5 (4), p.463-476

2013

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Experimental characterization of packaged switch devices for RF and millimeter-Wave applications

2016 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2016, p.47-50

2016

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A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements

IEEE transactions on instrumentation and measurement, 2008-02, Vol.57 (2), p.261-267

2008

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A FULLY INTEGRATED MULTIBAND CMOS 0.35 μM LNA FOR IEEE802.16 STANDARD

Journal of circuits, systems, and computers, 2013-02, Vol.22 (2), p.1250088

2013

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A new 3D-PICS High density Integrated Passive Device with substrate noise reduction by localized P+ guard rings: Characterization and modeling

2014 International Symposium on Electromagnetic Compatibility, 2014, p.1022-1025

2014

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Mesure du facteur et des paramètres de bruit aux radiofréquences

Mesures et tests électroniques, 2012-06

PASQUET, Daniel

2012

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New extraction method of an equivalent circuit for an inductor in BiCMOS technology including lossy effects

International journal of microwave and wireless technologies, 2010-12, Vol.2 (6), p.523-530

2010

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Applied TRL Calibration Method to Differential Devices Embedded in a Test Board

2019 IEEE Radio and Wireless Symposium (RWS), 2019, p.1-4

2019

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Measurement of the moisture content with a cylindrical resonating cavity in TM010 mode

IEEE transactions on instrumentation and measurement, 2000-10, Vol.49 (5), p.1023

2000

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Theoretical comparison between calibration standards using straight and bended CPW's

2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), 2017, p.150-153

2017

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Variation of the Intrinsic parameters of the transistor with its gate width

Electronics letters, 2000-07, Vol.36 (15), p.1323-1325

2000

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Evaluation of the Error due to Bended CPW Lines used in a Calibration Process

2017 Mediterranean Microwave Symposium (MMS), 2017, p.1-3

2017

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The Planar Approach to a 12 Al0.12Ga0.88N/GaN Based Double Barrier HBV

Frequenz, 2007-01, Vol.61 (11-12)

2007

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Evaluation of substrate's characteristics from the relation between wave and characteristic impedances for a CPW

2018 22nd International Microwave and Radar Conference (MIKON), 2018, p.656-659

2018

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Improved noise parameters measurement for high frequency devices

2013 11th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services (TELSIKS), 2013, Vol.1, p.161-169

2013

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Determination of wave noise sources using spectral parametric modeling

IEEE transactions on microwave theory and techniques, 1997-12, Vol.45 (12), p.2461-2467

1997

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The Combline Filter

VHF / UHF Filters and Multicouplers, 2013, p.97-128

2013

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Channel Multiplexing

VHF / UHF Filters and Multicouplers, 2013, p.129-156

2013

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Reminders and General Points

VHF / UHF Filters and Multicouplers, 2013, p.1-10

2013

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Extraction of device S‐parameters within board by using a TRL de‐embedding technique

Analytical extraction of the noise sources characteristics of a bipolar transistor

New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism

CAD-Oriented Model of a Coplanar Line on a Silicon Substrate Including Eddy-Current Effects and Skin Effect

Bonding-Wire-Geometric-Profile-Dependent Model for Mutual Coupling Between Two Bonding Wires on a Glass Substrate

SiGe heterojunction bipolar phototransistor for optics–microwaves interfacing

Analytic description, measurements, and modeling of 3D-embedded silicon inductance for High-Performance Hybrid Systems Applications

Experimental characterization of packaged switch devices for RF and millimeter-Wave applications

A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements

A FULLY INTEGRATED MULTIBAND CMOS 0.35 μM LNA FOR IEEE802.16 STANDARD

A new 3D-PICS High density Integrated Passive Device with substrate noise reduction by localized P+ guard rings: Characterization and modeling

Mesure du facteur et des paramètres de bruit aux radiofréquences

New extraction method of an equivalent circuit for an inductor in BiCMOS technology including lossy effects

Applied TRL Calibration Method to Differential Devices Embedded in a Test Board

Measurement of the moisture content with a cylindrical resonating cavity in TM010 mode

Theoretical comparison between calibration standards using straight and bended CPW's

Variation of the Intrinsic parameters of the transistor with its gate width

Evaluation of the Error due to Bended CPW Lines used in a Calibration Process

The Planar Approach to a 12 Al0.12Ga0.88N/GaN Based Double Barrier HBV

Evaluation of substrate's characteristics from the relation between wave and characteristic impedances for a CPW

Improved noise parameters measurement for high frequency devices

Determination of wave noise sources using spectral parametric modeling

The Combline Filter

Channel Multiplexing

Reminders and General Points

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