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Mössbauer Spectroscopical and Electron Microscopical Investigations of the Behaviour of Cobalt in Silicon

January 16, 2022, Vol.81, Number 1, p.273-280

2022

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Observations of Point Defects in Silicon by Means of Dark-Field Lattice Plane Imaging

May 16, 2021, Vol.71, Number 1, p.275-282

2021

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Jan Christiaan Smuts

Zeitschrift für Politik, 1940-01, Vol.30, p.113-116

Pasemann, M. E.

1940

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Graf Stefan Csáky

Zeitschrift für Politik, 1940-01, Vol.30, p.51-54

Pasemann, M. E.

1940

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Das deutsche Kolonialproblem in Zahlen

Zeitschrift für Politik, 1939-01, Vol.29 (1/2), p.144-151

Pasemann, M. E.

1939

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Deutsche Kolonialpioniere — ihr Lebensbild

Zeitschrift für Politik, 1939-01, Vol.29 (1/2), p.127-137

Pasemann, M. E.

1939

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Zeittafel zur deutschen Kolonialpolitik

Zeitschrift für Politik, 1939-01, Vol.29 (1/2), p.152-155

Pasemann, M. E.

1939

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Generation of radiation-induced defects at room temperature in silicon in a HVEM and their annihilation

Ultramicroscopy, 1982, Vol.7 (3), p.267-276

1982

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Identification of Small Defects in Silicon

Physica status solidi. A, Applied research, 1979-07, Vol.54 (1), p.179-188

1979

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Direct observation of the atomic structure of interfaces in the systems Si-SiO2 and Ge-GeO2

Journal of crystal growth, 1982-06, Vol.58 (1), p.288-289

1982

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Microdefects in silicon different from swirls

Physica status solidi. A, Applied research, 1979-06, Vol.53 (2), p.509-517

1979

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Metallographic and electron microscopical analysis of microdefects in Fz-silicon crystals

Crystal research and technology (1979), 1984, Vol.19 (7), p.991-997

1984

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Radiation induced defects in silicon at room temperature

Physica status solidi. A, Applied research, 1980-03, Vol.58 (1), p.K1-K3

1980

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Etch- and Transmission Electron Microscope Investigations of Microdefects in (001) LEC-GaP Substrates

Kristall und Technik, 1981, Vol.16 (9), p.1001-1006

1981

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Mössbauer Spectroscopical and Electron Microscopical Investigations of the Behaviour of Cobalt in Silicon

Physica status solidi. A, Applied research, 1984-01, Vol.81 (1), p.273-280

1984

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Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations

Physica status solidi. A, Applied research, 1983-05, Vol.77 (1), p.133-138

1983

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Analysis of rod-like defects in silicon and germanium by means of high-resolution electron microscopy

Physica status solidi. A, Applied research, 1983-11, Vol.80 (1), p.135-139

1983

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Observations of point defects in silicon by means of dark-field lattice plane imaging

Physica status solidi. A, Applied research, 1982-05, Vol.71 (1), p.275-281

1982

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The influence of the residual impurities (C, O) on the crystal structure of GaAs

Physica status solidi. A, Applied research, 1981-11, Vol.68 (1), p.261-267

1981

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Radiation induced defects in silicon at room temperature

Physica status solidi. A, Applied research, 1980-03, Vol.58 (1), p.K1-K3

1980

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Electron microscopic investigations of precipitates in Cu-doped ZnTe

Physica status solidi. A, Applied research, 1979-12, Vol.56 (2), p.679-685

1979

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Direct observation of ordered Guinier-Preston zones in an AlZnMg alloy

Materials science and engineering, 1981-01, Vol.48 (2), p.267-269

1981

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TEM-Untersuchungen von Gitterfehlern in ZnSiP2-Einkristallen

Kristall und Technik, 1973, Vol.8 (10), p.1141-1151

1973

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Superdislocations in the chalcopyrite structure

Physica status solidi. A, Applied research, 1974-03, Vol.22 (1), p.K1-K2

1974

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The influence of the residual impurities (C, O) on the crystal structure of GaAs

Physica status solidi. A, Applied research, 1981-11, Vol.68 (1), p.261-267

1981

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Mössbauer Spectroscopical and Electron Microscopical Investigations of the Behaviour of Cobalt in Silicon

Observations of Point Defects in Silicon by Means of Dark-Field Lattice Plane Imaging

Jan Christiaan Smuts

Graf Stefan Csáky

Das deutsche Kolonialproblem in Zahlen

Deutsche Kolonialpioniere — ihr Lebensbild

Zeittafel zur deutschen Kolonialpolitik

Generation of radiation-induced defects at room temperature in silicon in a HVEM and their annihilation

Identification of Small Defects in Silicon

Direct observation of the atomic structure of interfaces in the systems Si-SiO2 and Ge-GeO2

Microdefects in silicon different from swirls

Metallographic and electron microscopical analysis of microdefects in Fz-silicon crystals

Radiation induced defects in silicon at room temperature

Etch- and Transmission Electron Microscope Investigations of Microdefects in (001) LEC-GaP Substrates

Mössbauer Spectroscopical and Electron Microscopical Investigations of the Behaviour of Cobalt in Silicon

Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations

Analysis of rod-like defects in silicon and germanium by means of high-resolution electron microscopy

Observations of point defects in silicon by means of dark-field lattice plane imaging

The influence of the residual impurities (C, O) on the crystal structure of GaAs

Radiation induced defects in silicon at room temperature

Electron microscopic investigations of precipitates in Cu-doped ZnTe

Direct observation of ordered Guinier-Preston zones in an AlZnMg alloy

TEM-Untersuchungen von Gitterfehlern in ZnSiP2-Einkristallen

Superdislocations in the chalcopyrite structure

The influence of the residual impurities (C, O) on the crystal structure of GaAs

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