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SPAD Smart Pixel for Time-of-Flight and Time-Correlated Single-Photon Counting Measurements

IEEE photonics journal, 2012-06, Vol.4 (3), p.795-804

2012

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First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry—a promising approach for new detector development and scientific instrumentation

Journal of instrumentation, 2017-11, Vol.12 (11), p.P11013-P11013

2017

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Artificial intelligence (AI) and value co-creation in B2B sales: Activities, actors and resources

Australasian marketing journal, 2021-08, Vol.29 (3), p.243-251

2021

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Ti/Ni(80%)Cr(20%) Thin-Film Resistor With a Nearly Zero Temperature Coefficient of Resistance for Integration in a Standard CMOS Process

IEEE electron device letters, 2008-03, Vol.29 (3), p.212-214

2008

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Die drei Beiträge zur Qualität der Medizin

Gesundheitsökonomie & Qualitätsmanagement, 2011-12, Vol.16 (6), p.369-374

Paschen, U.

2011

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Characterization of embedded MgO/ferromagnet contacts for spin injection in silicon

Journal of applied physics, 2008-03, Vol.103 (6), p.063709-063709-5

2008

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Evaluation of Schottky and MgO-based tunnelling diodes with different ferromagnets for spin injection in n-Si

Journal of physics. D, Applied physics, 2009-07, Vol.42 (14), p.145114-145114 (9)

2009

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Reliability Investigations up to 350°C of Gate Oxide Capacitors Realized in a Silicon-on-Insulator CMOS Technology

Journal of microelectronics and electronic packaging, 2013-10, Vol.10 (4), p.150-154

2013

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Magnetic properties of embedded ferromagnetic contacts to silicon for spin injection

Journal of physics. D, Applied physics, 2009-04, Vol.42 (8), p.085004

2009

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High Temperature Characterization up to 450°C of MOSFETs and Basic Circuits Realized in a Silicon-on-Insulator (SOI) CMOS Technology

Journal of microelectronics and electronic packaging, 2013-04, Vol.10 (2), p.67-72

2013

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Aufbau eines Qualitätsmanagementsystems nach DIN EN ISO 9001:2000 in einer radiologischen Universitätsklinik

RöFo : Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebende Verfahren, 2003-02, Vol.175 (2), p.176-182

2003

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Coupling of Monte Carlo sputter simulation and feature-scale profile simulation and application to the simulation of back etching of an intermetal dielectric

2010 International Conference on Simulation of Semiconductor Processes and Devices, 2010, p.53-56

2010

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Light switched Plasma Charging Damage protection device allowing high field characterization

2009 Proceedings of the European Solid State Device Research Conference, 2009, p.181-184

2009

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A novel tactile sensor system for heavy-load applications based on an integrated capacitive pressure sensor

Sensors and actuators. A, Physical, 1998-06, Vol.68 (1), p.294-298

1998

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Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results

IEEE transactions on electron devices, 2011-08, Vol.58 (8), p.2227-2234

2011

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Low-noise and large-area CMOS SPADs with timing response free from slow tails

2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2012, p.230-233

2012

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Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450°C

Journal of microelectronics and electronic packaging, 2016-01, Vol.13 (1), p.33-37

2016

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Quantum Efficiency Determination of a Novel CMOS Design for Fast Imaging Applications in the Extreme Ultraviolet

IEEE transactions on electron devices, 2012-03, Vol.59 (3), p.846-849

2012

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Introduction of a quality management system compliant with DIN EN ISO 9001:2000 into a university department of nuclear medicine

Nuclear medicine, 2001-11, Vol.40 (6), p.228-238

2001

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Evidence for hole traps at the amorphous silicon/amorphous silicon–germanium heterostructure interface

Applied physics letters, 1997-01, Vol.70 (4), p.499-501

1997

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CMOS photodiodes for narrow linewidth applications

2011 IEEE SENSORS Proceedings, 2011, p.1600-1603

2011

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Qualitätsmanagement - immer noch ein aktuelles Thema?

Urologe. Ausgabe B, 2002-10, Vol.42 (5), p.437-440

Paschen, U.

2002

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Pair-breaking mechanisms in Nb/Gd/Nb films

Physica. B, Condensed matter, 1994-02, Vol.194, p.2403-2404

1994

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MAGNETOOPTIC MEASUREMENTS ON Gd/Nb/Gd SANDWICHES

International journal of modern physics. B, Condensed matter physics, statistical physics, applied physics, 1993-01, Vol.7 (1n03), p.500-503

1993

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Capacitance Characterization of Amorphous Silicon/Amorphous Silicon Germanium Heterostructures

MRS proceedings, 1996, Vol.420, Article 209

1996

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SPAD Smart Pixel for Time-of-Flight and Time-Correlated Single-Photon Counting Measurements

First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry—a promising approach for new detector development and scientific instrumentation

Artificial intelligence (AI) and value co-creation in B2B sales: Activities, actors and resources

Ti/Ni(80%)Cr(20%) Thin-Film Resistor With a Nearly Zero Temperature Coefficient of Resistance for Integration in a Standard CMOS Process

Die drei Beiträge zur Qualität der Medizin

Characterization of embedded MgO/ferromagnet contacts for spin injection in silicon

Evaluation of Schottky and MgO-based tunnelling diodes with different ferromagnets for spin injection in n-Si

Reliability Investigations up to 350°C of Gate Oxide Capacitors Realized in a Silicon-on-Insulator CMOS Technology

Magnetic properties of embedded ferromagnetic contacts to silicon for spin injection

High Temperature Characterization up to 450°C of MOSFETs and Basic Circuits Realized in a Silicon-on-Insulator (SOI) CMOS Technology

Aufbau eines Qualitätsmanagementsystems nach DIN EN ISO 9001:2000 in einer radiologischen Universitätsklinik

Coupling of Monte Carlo sputter simulation and feature-scale profile simulation and application to the simulation of back etching of an intermetal dielectric

Light switched Plasma Charging Damage protection device allowing high field characterization

A novel tactile sensor system for heavy-load applications based on an integrated capacitive pressure sensor

Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results

Low-noise and large-area CMOS SPADs with timing response free from slow tails

Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450°C

Quantum Efficiency Determination of a Novel CMOS Design for Fast Imaging Applications in the Extreme Ultraviolet

Introduction of a quality management system compliant with DIN EN ISO 9001:2000 into a university department of nuclear medicine

Evidence for hole traps at the amorphous silicon/amorphous silicon–germanium heterostructure interface

CMOS photodiodes for narrow linewidth applications

Qualitätsmanagement - immer noch ein aktuelles Thema?

Pair-breaking mechanisms in Nb/Gd/Nb films

MAGNETOOPTIC MEASUREMENTS ON Gd/Nb/Gd SANDWICHES

Capacitance Characterization of Amorphous Silicon/Amorphous Silicon Germanium Heterostructures

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