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IEEE journal of solid-state circuits, 2008-01, Vol.43 (1), p.86-95
2008
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IEEE journal of solid-state circuits, 2009-04, Vol.44 (4), p.1216-1226
2009
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IEEE journal of solid-state circuits, 2005-06, Vol.40 (6), p.1377-1387
2005
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2010 IEEE International SOI Conference (SOI), 2010, p.1-2
2010
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1st, 2020
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IBM journal of research and development, 2018-03, p.1-1
2018
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2010 IEEE International SOI Conference (SOI), 2010, p.1-2
2010
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1st ed., 2018
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2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519), 2004, p.206-523 Vol.1
First edition, 2004
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Pathology, 2014-01, Vol.46 (1), p.41-45
- Nicholl, Jillian
- Waters, Wendy
- Mulley, John C.
- Suwalski, Shanna
- Brown, Sue
- Hull, Yvonne
- Barnett, Christopher
- Haan, Eric
- Thompson, Elizabeth M.
- Liebelt, Jan
- Mcgregor, Lesley
- Harbord, Michael G.
- Entwistle, John
- Munt, Chris
- White, Dierdre
- Chitti, Anthony
- Baulderstone, David
- Ketteridge, David
- Friend, Kathryn
- Bain, Sharon M.
- Sui, Y.u.
2014
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2012 IEEE International Conference on IC Design & Technology, 2012, p.1-4
2012
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2012 International Electron Devices Meeting, 2012, p.3.3.1-3.3.4
- Narasimha, S.
- Chang, P.
- Ortolland, C.
- Fried, D.
- Engbrecht, E.
- Nummy, K.
- Parries, P.
- Ando, T.
- Aquilino, M.
- Arnold, N.
- Bolam, R.
- Cai, J.
- Chudzik, M.
- Cipriany, B.
- Costrini, G.
- Dai, M.
- Dechene, J.
- DeWan, C.
- Engel, B.
- Gribelyuk, M.
- Guo, D.
- Han, G.
- Habib, N.
- Holt, J.
- Ioannou, D.
- Jagannathan, B.
- Jaeger, D.
- Johnson, J.
- Kong, W.
- Koshy, J.
- Krishnan, R.
- Kumar, A.
- Kumar, M.
- Lee, J.
- Li, X.
- Lin, C.
- Linder, B.
- Lucarini, S.
- Lustig, N.
- McLaughlin, P.
- Onishi, K.
- Ontalus, V.
- Robison, R.
- Sheraw, C.
- Stoker, M.
- Thomas, A.
- Wang, G.
- Wise, R.
- Zhuang, L.
- Freeman, G.
- Gill, J.
- Maciejewski, E.
- Malik, R.
- Norum, J.
- Agnello, P.
2012
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International Electron Devices Meeting. IEDM Technical Digest, 1997, p.45-48
1997
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2009 IEEE International Electron Devices Meeting (IEDM), 2009, p.1-4
2009
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2014 IEEE International Electron Devices Meeting, 2014, p.19.4.1-19.4.4
- Pei, C.
- Wang, G.
- Aquilino, M.
- Arnold, N.
- Chandra, B.
- Chang, W.
- Chen, X.
- Davies, W.
- Hawkins, K.
- Jaeger, D.
- Johnson, J. B.
- Kwon, O.-J
- Krishnasamy, R.
- Kong, W.
- Liu, J.
- Li, X.
- Messenger, B.
- Nelson, E.
- Nummy, K.
- Onishi, K.
- Poindexter, D.
- Rombawa, S.
- Sheraw, C.
- Tzou, T.
- Wang, X.
- Yin, M.
- Freeman, G.
- Kirahata, T.
- Maciejewski, E.
- Norum, J.
- Robson, N.
- Narasimha, S.
- Parries, P.
- Agnello, P.
- Malik, R.
- Iyer, S. S.
2014
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2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2008, p.97-98
2008
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2008 IEEE Symposium on VLSI Circuits, 2008, p.206-207
2008
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2010 International Electron Devices Meeting, 2010, p.27.5.1-27.5.4
- Butt, N
- Mcstay, K
- Cestero, A
- Ho, H
- Kong, W
- Fang, S
- Krishnan, R
- Khan, B
- Tessier, A
- Davies, W
- Lee, S
- Zhang, Y
- Johnson, J
- Rombawa, S
- Takalkar, R
- Blauberg, A
- Hawkins, K V
- Liu, J
- Rosenblatt, S
- Goyal, P
- Gupta, S
- Ervin, J
- Li, Z
- Galis, S
- Barth, J
- Yin, M
- Weaver, T
- Li, J H
- Narasimha, S
- Parries, P
- Henson, W K
- Robson, N
- Kirihata, T
- Chudzik, M
- Maciejewski, E
- Agnello, P
- Stiffler, S
- Iyer, S S
2010
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2004 IEEE International Conference on Multimedia and Expo, 2004, Vol.1, p.511-514 Vol.1
2004
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IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech), 2005, p.31-32
2005
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1992 Symposium on VLSI Technology Digest of Technical Papers, 1992, p.14-15
1992
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2006 International Electron Devices Meeting, 2006, p.1-4
- Wang, G.
- Cheng, K.
- Ho, H.
- Faltermeier, J.
- Kong, W.
- Kim, H.
- Cai, J.
- Tanner, C.
- McStay, K.
- Balasubramanyam, K.
- Pei, C.
- Ninomiya, L.
- Li, X.
- Winstel, K.
- Dobuzinsky, D.
- Naeem, M.
- Zhang, R.
- Deschner, R.
- Brodsky, M.J.
- Allen, S.
- Yates, J.
- Feng, Y.
- Marchetti, P.
- Norris, C.
- Casarotto, D.
- Benedict, J.
- Kniffm, A.
- Parise, D.
- Khan, B.
- Barth, J.
- Parries, P.
- Kirihata, T.
- Norum, J.
- Iyer, S.S.
2006
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1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453), 1999, p.251-254
1999
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