Sortiert nach
IEEE journal of solid-state circuits, 2008-01, Vol.43 (1), p.150-162
- LEE, Kwang-Jin
- CHO, Beak-Hyung
- PARK, Mu-Hui
- RO, Yu-Hwan
- CHOI, Joon-Yong
- KIM, Ki-Sung
- KIM, Young-Ran
- SHIN, In-Cheol
- LIM, Ki-Won
- CHO, Ho-Keun
- CHOI, Chang-Han
- CHUNG, Won-Ryul
- CHO, Woo-Yeong
- KIM, Du-Eung
- YOON, Yong-Jin
- YU, Kwang-Suk
- JEONG, Gi-Tae
- JEONG, Hong-Sik
- KWAK, Choong-Keun
- KIM, Chang-Hyun
- KIM, Kinam
- KANG, Sangbeom
- CHOI, Byung-Gil
- OH, Hyung-Rok
- LEE, Chang-Soo
- KIM, Hye-Jin
- PARK, Joon-Min
- QI WANG
2008
- Link zum Volltext
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2017, 17(3), 75, pp.363-369
2017
Link zum Volltext
2012 IEEE International Solid-State Circuits Conference, 2012, p.46-48
- Youngdon Choi
- Ickhyun Song
- Mu-Hui Park
- Hoeju Chung
- Sanghoan Chang
- Beakhyoung Cho
- Jinyoung Kim
- Younghoon Oh
- Duckmin Kwon
- Jung Sunwoo
- Junho Shin
- Yoohwan Rho
- Changsoo Lee
- Min Gu Kang
- Jaeyun Lee
- Yongjin Kwon
- Soehee Kim
- Jaehwan Kim
- Yong-Jun Lee
- Qi Wang
- Sooho Cha
- Sujin Ahn
- Horii, Hideki
- Jaewook Lee
- Kisung Kim
- Hansung Joo
- Kwangjin Lee
- Yeong-Taek Lee
- Jeihwan Yoo
- Jeong, G.
2012
- Link zum Volltext
IEEE journal of solid-state circuits, 2007, Vol.42 (1), p.210-218
2007
Link zum Volltext
2011 IEEE International Solid-State Circuits Conference, 2011, p.500-502
- Hoeju Chung
- Byung Hoon Jeong
- ByungJun Min
- Youngdon Choi
- Beak-Hyung Cho
- Junho Shin
- Jinyoung Kim
- Jung Sunwoo
- Joon-min Park
- Qi Wang
- Yong-jun Lee
- Sooho Cha
- Dukmin Kwon
- Sangtae Kim
- Sunghoon Kim
- Yoohwan Rho
- Mu-Hui Park
- Jaewhan Kim
- Ickhyun Song
- Sunghyun Jun
- Jaewook Lee
- KiSeung Kim
- Ki-won Lim
- Won-ryul Chung
- ChangHan Choi
- HoGeun Cho
- Inchul Shin
- Woochul Jun
- Seokwon Hwang
- Ki-Whan Song
- KwangJin Lee
- Sang-whan Chang
- Woo-Yeong Cho
- Jei-Hwan Yoo
- Young-Hyun Jun
2011
- Link zum Volltext
Journal of semiconductor technology and science, 2017, Vol.17 (3), p.363-369
2017
Link zum Volltext
IEEE journal of solid-state circuits, 2007-01, Vol.42 (1), p.210-218
2007
- Link zum Volltext
2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 2007, p.472-616
- Lee, Kwang-Jin
- Cho, Beak-Hyung
- Cho, Woo-Yeong
- Kang, Sangbeom
- Choi, Byung-Gil
- Oh, Hyung-Rok
- Lee, Chang-Soo
- Kim, Hye-Jin
- Park, Joon-Min
- Wang, Qi
- Park, Mu-Hui
- Ro, Yu-Hwan
- Choi, Joon-Yong
- Kim, Ki-Sung
- Kim, Young-Ran
- Shin, In-Cheol
- Lim, Ki-Won
- Cho, Ho-Keun
- Choi, Chang-Han
- Chung, Won-Ryul
- Kim, Du-Eung
- Yu, Kwang-Suk
- Jeong, Gi-Tae
- Jeong, Hong-Sik
- Kwak, Choong-Keun
- Kim, Chang-Hyun
- Kim, Kinam
2007
- Link zum Volltext
2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers, 2006, p.487-496
2006
- Link zum Volltext
Journal of international medical research, 2018-03, Vol.46 (3), p.1109-1120
2018
Link zum Volltext
Journal of anesthesia, 2017-12, Vol.31 (6), p.869-877
2017
Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
- Phase Change Random Access Memory
- Science & Technology
- Charge Pumps
- Voltage
- Charge Pump
- Circuits
- Cmos Technology
- Engineering
- Engineering, Electrical & Electronic
- Nonvolatile Memory
- Phase-Change Memory
- Random Access Memory
- Technology
- Applied Sciences
- Bandwidth
- Burst-Read
- Design. Technologies. Operation Analysis. Testing
- Diodes
- Electronics
- Endurance
Kollektion