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Charge distribution from SKPM images

Physical chemistry chemical physics : PCCP, 2017, Vol.19 (40), p.27299-27304

2017

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Localized charge imaging with scanning Kelvin probe microscopy

Nanotechnology, 2017-01, Vol.28 (2), p.025703-025703

2017

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Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

Physical review. B, 2020-02, Vol.101 (7), Article 075432

2020

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Face-Selective Etching of ZnO during Attachment of Dyes

Journal of physical chemistry. C, 2013-09, Vol.117 (36), p.18414-18422

2013

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Enhancing dynamic scanning force microscopy in air: as close as possible

Nanotechnology, 2009-02, Vol.20 (8), p.085707-085707

2009

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Facets evolution and surface electrical properties of nonpolar m-plane ZnO thin films

Applied physics letters, 2006-06, Vol.88 (26)

2006

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Engineered Planar Defects Embedded in Opals

Advanced materials (Weinheim), 2004-02, Vol.16 (4), p.341-345

2004

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Surface characterization of P3OT thin films by variable temperature scanning force microscopy

Synthetic metals, 2011-08, Vol.161 (15), p.1651-1659

2011

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Optical study of the full photonic band gap in silicon inverse opals

Applied physics letters, 2002-12, Vol.81 (26), p.4925-4927

2002

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Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films

Applied physics. A, Materials science & processing, 2007-07, Vol.88 (1), p.77-82

2007

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Nanoscale surface photovoltage of organic semiconductors with two pass Kelvin probe microscopy

Nanotechnology, 2011-09, Vol.22 (37), p.375704-1-8

2011

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Thermal frequency noise in dynamic scanning force microscopy

Journal of applied physics, 2011-01, Vol.109 (2), p.024310-024310-10

2011

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Response to the "Comment on 'Thermal frequency noise in dynamic scanning force microscopy'" [J. Appl. Phys. 110, 036107 (2011)]

Journal of applied physics, 2011-08, Vol.110 (3), p.036108-036108-2

2011

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TEM-assisted dynamic scanning force microscope imaging of (001) antigorite: Surfaces and steps on a modulated silicate

The American mineralogist, 2010-05, Vol.95 (5-6), p.673-685

2010

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Modification of the Natural Photonic Bandgap of Synthetic Opals via Infilling with Crystalline InP

Advanced functional materials, 2005-03, Vol.15 (3), p.411-417

2005

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Electronic and structural properties of poly-(3-octylthiophene) and graphitic nanoparticle blends

European physical journal. Applied physics, 2007-03, Vol.37 (3), p.283-286

2007

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Wavelength dependence of nanoscale photodegradation in poly(3-octylthiophene) thin films

Polymer degradation and stability, 2011-07, Vol.96 (7), p.1279-1285

2011

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Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

Ultramicroscopy, 2010-06, Vol.110 (7), p.789-800

2010

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Surface potential domains on lamellar P3OT structures

Nanotechnology, 2008-02, Vol.19 (6), p.065709-065709 (6)

2008

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Optical study of the pseudogap in thickness and orientation controlled artificial opals

Physical review. B, Condensed matter, 2003-09, Vol.68 (11), Article 115109

2003

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Charging of highly resistive granular metal films

Physical review. B, 2017-05, Vol.95 (20), p.205427, Article 205427

2017

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Photobleaching of MEH-PPV thin films: Correlation between optical properties and the nanoscale surface photovoltage

Solar energy materials and solar cells, 2013-10, Vol.117, p.15-21

2013

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Polarity effects on ZnO films grown along the nonpolar [11 20] direction

Physical review letters, 2005-11, Vol.95 (22), p.226105.1-226105.4, Article 226105

2005

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Exploring the structure and electronic properties of individual hybrid GO/rGO flakes

Applied surface science, 2024-01, Vol.642, p.158611, Article 158611

2024

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The Role of Intermolecular and Molecule−Substrate Interactions in the Stability of Alkanethiol Nonsaturated Phases on Au(111)

Journal of the American Chemical Society, 2004-01, Vol.126 (1), p.385-395

2004

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Charge distribution from SKPM images

Localized charge imaging with scanning Kelvin probe microscopy

Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

Face-Selective Etching of ZnO during Attachment of Dyes

Enhancing dynamic scanning force microscopy in air: as close as possible

Facets evolution and surface electrical properties of nonpolar m-plane ZnO thin films

Engineered Planar Defects Embedded in Opals

Surface characterization of P3OT thin films by variable temperature scanning force microscopy

Optical study of the full photonic band gap in silicon inverse opals

Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films

Nanoscale surface photovoltage of organic semiconductors with two pass Kelvin probe microscopy

Thermal frequency noise in dynamic scanning force microscopy

Response to the "Comment on 'Thermal frequency noise in dynamic scanning force microscopy'" [J. Appl. Phys. 110, 036107 (2011)]

TEM-assisted dynamic scanning force microscope imaging of (001) antigorite: Surfaces and steps on a modulated silicate

Modification of the Natural Photonic Bandgap of Synthetic Opals via Infilling with Crystalline InP

Electronic and structural properties of poly-(3-octylthiophene) and graphitic nanoparticle blends

Wavelength dependence of nanoscale photodegradation in poly(3-octylthiophene) thin films

Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

Surface potential domains on lamellar P3OT structures

Optical study of the pseudogap in thickness and orientation controlled artificial opals

Charging of highly resistive granular metal films

Photobleaching of MEH-PPV thin films: Correlation between optical properties and the nanoscale surface photovoltage

Polarity effects on ZnO films grown along the nonpolar [11 20] direction

Exploring the structure and electronic properties of individual hybrid GO/rGO flakes

The Role of Intermolecular and Molecule−Substrate Interactions in the Stability of Alkanethiol Nonsaturated Phases on Au(111)

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