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Gradient of nanomechanical properties in the interphase of cellulose nanocrystal composites

Composites science and technology, 2012-01, Vol.72 (2), p.314-319

2012

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Hybrid pixel detection and software automation streamlining electron diffraction experiments

Acta crystallographica. Section A, Foundations and advances, 2021-07, Vol.77 (a1), p.a310-a310

Pakzad, Anahita

2021

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Size effects on the nanomechanical properties of cellulose I nanocrystals

Journal of materials research, 2012-02, Vol.27 (3), p.528-536

2012

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Continuous electron diffraction tomography with Gatan electron counting cameras and Latitude D

Acta crystallographica. Section A, Foundations and advances, 2023-07, Vol.79 (a1), p.a123-a123

2023

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Automated Continuous Diffraction Tomography with Gatan Direct Detection Electron Counting Cameras: Advantages and Best Practices for Data Acquisition

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.1048-1049

2023

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Results Before Lunch: Capturing and Processing In Situ 5D STEM

Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)

2024

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3D-stacked Strained SiGe/Ge Gate-All-Around (GAA) Structure Fabricated by 3D Ge Condensation

2019 Device Research Conference (DRC), 2019, p.249-250

2019

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Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.168-169

2018

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Continuous 4D STEM Recording and Visualization for In-situ Experiments

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.271-271

2023

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An IR Filter for in situ STEM-EDS Heating and Multimodal STEM Experiments in DigitalMicrograph

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.1834-1834

2023

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The Performance of Detectors for Diffraction-Based Studies in (S)TEM

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.3192-3193

2022

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Nanoscale Insights into the Thermal Phase Behavior of All-Inorganic Halide Perovskites by In Situ 4D STEM

Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)

2024

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Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.1718-1719

2019

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Using py4DSTEM in GMS: Hybrid Open-Source, Commercial-Freeware Methods for Analyzing 4D STEM Datasets

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1352-1354

2021

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Live Mapping of Crystalline Regions During in-situ Heating (TEM and STEM)

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.2688-2690

2021

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Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1000-1002

2021

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Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2226-2228

2022

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Growth mode control for direct-gap core/shell Ge/GeSn nanowire light emission

Materials today (Kidlington, England), 2020-11, Vol.40, p.101-113

2020

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Structure analysis of metal-chalcophosphate layered systems using micro-ED

Acta crystallographica. Section A, Foundations and advances, 2022-07, Vol.78 (a1), p.a102-a102

2022

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Structure and Strain Relaxation of GaN Nanorods Grown on Homoepitaxial Surface via Controlling Irregular Mask

Journal of physical chemistry. C, 2019-02, Vol.123 (5), p.3172-3179

2019

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Assessing the Structure-property Relationship in Enamel at the Nanoscale Using 4D-STEM

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.1484-1486

2020

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Applications of Phase-Contrast STEM as Dose Efficient Method for High-resolution Imaging of Soft Materials

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.2158-2160

2020

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Strain and Sn distribution in Ge/Ge 1−x Sn x Core-Shell Nanowires

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.2146-2147

2019

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Strain and Sn distribution in Ge/Ge1−xSnx Core-Shell Nanowires

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.2146-2147

2019

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Application of High Speed Cameras for 4D Data Collection in S/TEM

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.254-255

2016

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Gradient of nanomechanical properties in the interphase of cellulose nanocrystal composites

Hybrid pixel detection and software automation streamlining electron diffraction experiments

Size effects on the nanomechanical properties of cellulose I nanocrystals

Continuous electron diffraction tomography with Gatan electron counting cameras and Latitude D

Automated Continuous Diffraction Tomography with Gatan Direct Detection Electron Counting Cameras: Advantages and Best Practices for Data Acquisition

Results Before Lunch: Capturing and Processing In Situ 5D STEM

3D-stacked Strained SiGe/Ge Gate-All-Around (GAA) Structure Fabricated by 3D Ge Condensation

Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

Continuous 4D STEM Recording and Visualization for In-situ Experiments

An IR Filter for in situ STEM-EDS Heating and Multimodal STEM Experiments in DigitalMicrograph

The Performance of Detectors for Diffraction-Based Studies in (S)TEM

Nanoscale Insights into the Thermal Phase Behavior of All-Inorganic Halide Perovskites by In Situ 4D STEM

Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples

Using py4DSTEM in GMS: Hybrid Open-Source, Commercial-Freeware Methods for Analyzing 4D STEM Datasets

Live Mapping of Crystalline Regions During in-situ Heating (TEM and STEM)

Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Growth mode control for direct-gap core/shell Ge/GeSn nanowire light emission

Structure analysis of metal-chalcophosphate layered systems using micro-ED

Structure and Strain Relaxation of GaN Nanorods Grown on Homoepitaxial Surface via Controlling Irregular Mask

Assessing the Structure-property Relationship in Enamel at the Nanoscale Using 4D-STEM

Applications of Phase-Contrast STEM as Dose Efficient Method for High-resolution Imaging of Soft Materials

Strain and Sn distribution in Ge/Ge 1−x Sn x Core-Shell Nanowires

Strain and Sn distribution in Ge/Ge1−xSnx Core-Shell Nanowires

Application of High Speed Cameras for 4D Data Collection in S/TEM

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