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IEEE electron device letters, 2012-09, Vol.33 (9), p.1225-1227
2012
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IEEE electron device letters, 2012-11, Vol.33 (11), p.1526-1528
2012
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IEEE transactions on electron devices, 2022-02, Vol.69 (2), p.669-674
2022
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IEEE transactions on electron devices, 2020-11, Vol.67 (11), p.4636-4640
2020
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IEEE transactions on electron devices, 2015-11, Vol.62 (11), p.3605-3612
2015
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IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1628-1633
2019
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Journal of physics. D, Applied physics, 2014-07, Vol.47 (29), p.1-10
2014
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IEEE transactions on electron devices, 2008-11, Vol.55 (11), p.2968-2976
2008
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Microelectronic engineering, 2005-06, Vol.80, p.378-385
2005
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IEEE transactions on electron devices, 2009-03, Vol.56 (3), p.420-430
2009
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Solid-state electronics, 2012-04, Vol.70, p.50-58
2012
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IEEE transactions on electron devices, 2009-03, Vol.56 (3), p.408-419
2009
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Solid-state electronics, 2009-05, Vol.53 (5), p.504-513
2009
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IEEE transactions on electron devices, 2009-06, Vol.56 (6), p.1191-1198
2009
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IEEE transactions on electron devices, 2005-08, Vol.52 (8), p.1772-1779
2005
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Solid-state electronics, 2013-06, Vol.84, p.179-184
2013
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2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T116-T117
2015
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IEEE electron device letters, 2005-05, Vol.26 (5), p.317-319
2005
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Solid-state electronics, 2014-07, Vol.97, p.45-51
2014
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Solid-state electronics, 2020-08, Vol.170, p.107820, Article 107820
2020
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Solid-state electronics, 2013-10, Vol.88, p.15-20
- Fenouillet-Beranger, C.
- Perreau, P.
- Benoist, T.
- Richier, C.
- Haendler, S.
- Pradelle, J.
- Bustos, J.
- Brun, P.
- Tosti, L.
- Weber, O.
- Andrieu, F.
- Orlando, B.
- Pellissier-Tanon, D.
- Abbate, F.
- Richard, C.
- Beneyton, R.
- Gregoire, M.
- Ducote, J.
- Gouraud, P.
- Margain, A.
- Borowiak, C.
- Bianchini, R.
- Planes, N.
- Gourvest, E.
- Bourdelle, K.K.
- Nguyen, B.Y.
- Poiroux, T.
- Skotnicki, T.
- Faynot, O.
- Boeuf, F.
2013
Link zum Volltext
Solid-state electronics, 2013-12, Vol.90, p.143-148
- Ben Akkez, Imed
- Fenouillet-Beranger, Claire
- Cros, Antoine
- Perreau, Pierre
- Haendler, Sébatien
- Weber, Olivier
- Andrieu, François
- Pellissier-Tanon, D.
- Abbate, F.
- Richard, C.
- Beneyton, R.
- Gouraud, P.
- Margain, A.
- Borowiak, C.
- Gourvest, E.
- Bourdelle, K.K.
- Nguyen, B.Y.
- Poiroux, T.
- Skotnicki, Thomas
- Faynot, Olivier
- Balestra, Francis
- Ghibaudo, Gérard
- Boeuf, Fréderic
2013
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Solid-state electronics, 2013-12, Vol.90, p.39-43
2013
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Evidences on the Physical Origin of the Unexpected Transport Degradation in Ultimate n-FDSOI Devices
2009
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Solid-state electronics, 2012-05, Vol.71, p.2-6
2012
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