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Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure

Microelectronics and reliability, 2019-08, Vol.99, p.113-118

2019

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Temperature induced degradation mechanisms of AlInAs/InGaAs/InP quantum cascade lasers

Materials research express, 2018-01, Vol.5 (1), p.16204

2018

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New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

Journal of microscopy (Oxford), 2009-11, Vol.236 (2), p.137-142

2009

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Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

Archives of metallurgy and materials, 2013-01, Vol.58 (2), p.413-417

2013

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In situ electron beam induced current measurements of the local thickness in semiconductor devices

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.86-88

2006

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Nanometer scale patterning of GaN using nanoimprint lithography and Inductively Coupled Plasma etching

Microelectronic engineering, 2015-02, Vol.133, p.129-133

2015

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Resistance and sheet resistance measurements using electron beam induced current

Applied physics letters, 2006-12, Vol.89 (24), p.241919-241919-3

2006

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Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology

Acta physica Polonica, A, 2009-12, Vol.116 (Supplement), p.S-45-S-47

2009

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ZnO nanostructures by atomic layer deposition method

Journal of physics. Conference series, 2009-01, Vol.146 (1), p.012017

2009

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Room temperature, single mode emission from two-section coupled cavity InGaAs/AlGaAs/GaAs quantum cascade laser

Journal of applied physics, 2015-10, Vol.118 (13)

2015

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Electron Microscopy Studies of Non-Local Effects' Impact on Cathodoluminescence of Semiconductor Laser Structures

Materials transactions, 2011-03, Vol.52 (3), p.364-369

2011

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Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-04, Vol.348, p.106-110

2015

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Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.89-92

2006

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Zastosowanie zogniskowanej wiązki jonów (FIB) do tworzenia, modyfikacji i charakteryzacji struktur elektronicznych i fotonicznych

Elektronika, 2016-08, Vol.1 (8), p.66-70

Płuska, M.

2016

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Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

Journal of microscopy (Oxford), 2010-03, Vol.237 (3), p.304-307

2010

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Buried amorphous‐layer impact on dislocation densities in silicon

Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.104-107

2006

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Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements

Applied physics letters, 2008-07, Vol.93 (4)

2008

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Measurement of Magnetic Field Distorting the Electron Beam Direction in Scanning Electron Microscope

IEEE transactions on instrumentation and measurement, 2009-01, Vol.58 (1), p.173-179

2009

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Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

Journal of microscopy (Oxford), 2010-03, Vol.237 (3), p.325-328

2010

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Crucial Aspects of the Device Processing of Quantum Cascade Lasers

Terahertz (THz), Mid Infrared (MIR) and Near Infrared (NIR) Technologies for Protection of Critical Infrastructures Against Explosives and CBRN, p.45-60

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Dependence of Tin Whisker Growth on Copper and Oxygen Content on the Surface of Tin-Rich Lead Free Alloys

Acta physica Polonica, A, 2013-02, Vol.123 (2), p.430-431

2013

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Impact of resistance on cathodoluminescence and its applicationfor layer sheet-resistance measurements

Applied physics letters, 2008-07, Vol.93 (4), p.041109-041109-3

2008

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Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements

Acta physica Polonica, A, 2014-04, Vol.125 (4), p.1027-1032

2014

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Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current

Acta physica Polonica, A, 2009-12, Vol.116 (Supplement), p.S-86-S-88

2009

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Fabrication and properties of GaN-based lasers

Journal of crystal growth, 2008-08, Vol.310 (17), p.3979-3982

2008

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Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure

Temperature induced degradation mechanisms of AlInAs/InGaAs/InP quantum cascade lasers

New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

In situ electron beam induced current measurements of the local thickness in semiconductor devices

Nanometer scale patterning of GaN using nanoimprint lithography and Inductively Coupled Plasma etching

Resistance and sheet resistance measurements using electron beam induced current

Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology

ZnO nanostructures by atomic layer deposition method

Room temperature, single mode emission from two-section coupled cavity InGaAs/AlGaAs/GaAs quantum cascade laser

Electron Microscopy Studies of Non-Local Effects' Impact on Cathodoluminescence of Semiconductor Laser Structures

Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods

Zastosowanie zogniskowanej wiązki jonów (FIB) do tworzenia, modyfikacji i charakteryzacji struktur elektronicznych i fotonicznych

Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

Buried amorphous‐layer impact on dislocation densities in silicon

Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements

Measurement of Magnetic Field Distorting the Electron Beam Direction in Scanning Electron Microscope

Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

Crucial Aspects of the Device Processing of Quantum Cascade Lasers

Dependence of Tin Whisker Growth on Copper and Oxygen Content on the Surface of Tin-Rich Lead Free Alloys

Impact of resistance on cathodoluminescence and its applicationfor layer sheet-resistance measurements

Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements

Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current

Fabrication and properties of GaN-based lasers

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