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Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Ultramicroscopy, 2019-01, Vol.196, p.54-57

Özgür Özer, H.

2019

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Densification of a polymer glass under high-pressure shear flow

Physical review. B, 2022-08, Vol.106 (6), Article L060103

2022

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Distribution of shallow NV centers in diamond revealed by photoluminescence spectroscopy and nanomachining

Carbon (New York), 2020-10, Vol.167, p.114-121

2020

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Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

Review of scientific instruments, 2017-01, Vol.88 (1)

2017

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Room Temperature Mechanical Thinning and Imprinting of Solid Films

Nano letters, 2007-02, Vol.7 (2), p.357-362

2007

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Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO 2 (110)

MRS proceedings, 2011, Vol.1318, Article mrsf10-1318-vv09-01

2011

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Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

Beilstein journal of nanotechnology, 2018, Vol.9 (1), p.2953-2959

2018

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Poly(glycidyl methacrylate) modified cellulose nanocrystals and their PBAT-based nanocomposites

International journal of biological macromolecules, 2023-12, Vol.253, p.126851, Article 126851

2023

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Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy

Applied physics letters, 2007-03, Vol.90 (13)

2007

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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Applied surface science, 2009-12, Vol.256 (5), p.1299-1303

2009

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Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO2 (110)

MRS proceedings, 2011, Vol.1318 (1)

2011

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Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences, 2001-05, Vol.457 (2009), p.1161-1174

2001

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Energy dissipation in atomic force microscopy and atomic loss processes

Physical review letters, 2001-12, Vol.87 (26), p.265502-265502, Article 265502

2001

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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Applied physics letters, 2001-09, Vol.79 (12), p.1915-1917

2001

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Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Applied surface science, 2003-03, Vol.210 (1), p.12-17

2003

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Direct measurement of molecular stiffness and damping in confined water layers

Physical review. B, Condensed matter and materials physics, 2004-08, Vol.70 (5), p.054114.1-054114.8, Article 054114

2004

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Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Applied surface science, 2002-03, Vol.188 (3), p.301-305

2002

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Dissipation Imaging with Low Amplitude off-Resonance Atomic Force Microscopy

Japanese Journal of Applied Physics, 2005-07, Vol.44 (7S), p.5325

2005

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Local force gradients on Si(111) during simultaneous scanningtunneling/atomic force microscopy

Applied physics letters, 2007-03, Vol.90 (13), p.133110-133110-3

2007

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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Applied surface science, 2010, Vol.256 (5), p.1299-1303

2010

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Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2×1)

Solid state communications, 2002-12, Vol.124 (12), p.469-472

2002

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Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 x 1): Festschrift in honour of Professor Salim Ciraci

Solid state communications, 2002, Vol.124 (12), p.469-472

2002

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Nanomechanics Using an Ultra-Small Amplitude AFM

MRS proceedings, 2000, Vol.649, Article Q9.2

2000

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Noncontact lateral-force gradient measurement on Si ( 111 ) - 7 × 7 surface with small-amplitude off-resonance atomic force microscopy

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2009-03, Vol.27 (2), p.1001-1005

2009

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Atomic Scale Investigation of Clean and Epi-Grown Si(001) Surfaces Using Scanning Tunneling Microscopy

Özer, H Özgür

1996

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Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Densification of a polymer glass under high-pressure shear flow

Distribution of shallow NV centers in diamond revealed by photoluminescence spectroscopy and nanomachining

Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

Room Temperature Mechanical Thinning and Imprinting of Solid Films

Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO 2 (110)

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

Poly(glycidyl methacrylate) modified cellulose nanocrystals and their PBAT-based nanocomposites

Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO2 (110)

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Energy dissipation in atomic force microscopy and atomic loss processes

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Direct measurement of molecular stiffness and damping in confined water layers

Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Dissipation Imaging with Low Amplitude off-Resonance Atomic Force Microscopy

Local force gradients on Si(111) during simultaneous scanningtunneling/atomic force microscopy

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2×1)

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 x 1): Festschrift in honour of Professor Salim Ciraci

Nanomechanics Using an Ultra-Small Amplitude AFM

Noncontact lateral-force gradient measurement on Si ( 111 ) - 7 × 7 surface with small-amplitude off-resonance atomic force microscopy

Atomic Scale Investigation of Clean and Epi-Grown Si(001) Surfaces Using Scanning Tunneling Microscopy

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