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Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied physics letters, 2015-06, Vol.106 (25)

2015

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The effect of film thickness on Curie temperature distribution and magnetization reversal mechanism for granular L10 FePt films

Journal of physics. D, Applied physics, 2017-06, Vol.50 (28)

2017

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L10 FePt films with high TC capping layer for Heat Assisted Magnetic Recording (HAMR)

Journal of magnetism and magnetic materials, 2019-08, Vol.483, p.249-265

2019

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TEM Observation of Deformation under Nanoindentation in Single Crystal Ni-based Superalloys

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.2178-2179

2018

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HAADF imaging of the omega (ω) phase in a gum metal-related alloy

Philosophical magazine (Abingdon, England), 2014-09, Vol.94 (25), p.2900-2912

2014

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Transmission Electron Microscopy (TEM) Study of the Oxide Layers Formed on Fe-12Cr-4Al Ferritic Alloy in an Oxygenated Pb-Bi Environment at 800°C

JOM (1989), 2018-08, Vol.70 (8), p.1471-1477

2018

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Depth-resolved charge reconstruction at the LaNiO3/CaMnO3 interface

Physical review. B, 2018-10, Vol.98 (15), p.155103

2018

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In-situ Raman Spectroscopy in a TEM

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.394-395

2013

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L10 FePt films with high T capping layer for Heat Assisted Magnetic Recording (HAMR)

Journal of magnetism and magnetic materials, 2019-08, Vol.483, p.249-265

2019

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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1046-1047

2014

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The effect of film thickness on Curie temperature distribution and magnetization reversal mechanism for granular L1 0 FePt films

Journal of physics. D, Applied physics, 2017-07, Vol.50 (28), p.285003

2017

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Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy

Journal of microscopy (Oxford), 2016-01, Vol.261 (1), p.27-35

2016

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Multiscale analysis of nanoindentation-induced defect structures in gum metal

Acta materialia, 2018-06, Vol.151 (C), p.334-346

2018

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Exploring the structural and electronic properties of nanowires at their mechanical limits

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1520-1521

2017

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Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied physics letters, 2015-06, Vol.106 (25)

2015

Volltextzugriff (PDF)

Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1076-1077

2013

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Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied physics letters, 2015-06, Vol.106 (25)

2015

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Study of coherence strain of GP II zones in an aged aluminum composite

Journal of alloys and compounds, 2012-09, Vol.536, p.S159-S164

2012

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Study of coherence strain of GP II zones in an aged aluminum composite

Journal of alloys and compounds, 2012-09, Vol.536 (SUPPL.1), p.S159-S164

2012

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A nondamaging electron microscopy approach to map In distribution in InGaN light-emitting diodes

Journal of applied physics, 2010-09, Vol.108 (5), p.056103-056103-3

2010

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Correlating the structural, chemical, and optical properties at nanometer resolution

Journal of applied physics, 2010-01, Vol.107 (1), p.013501-013501-4

2010

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Strain mapping for advanced CMOS technologies

Crystal research and technology (1979), 2014-01, Vol.49 (1), p.38-42

2014

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Depth-resolved charge reconstruction at the LaNi O 3 / CaMn O 3 interface

Physical review. B, 2018-10, Vol.98 (15), Article 155103

2018

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Depth-resolved charge reconstruction at the LaNi O 3/CaMn O 3 interface

Physical review. B, 2018-10, Vol.98 (15)

2018

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Strain Mapping of 45 nm MOSFET by Dark-Field Inline Electron Holography

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.592-593

2010

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Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

The effect of film thickness on Curie temperature distribution and magnetization reversal mechanism for granular L10 FePt films

L10 FePt films with high TC capping layer for Heat Assisted Magnetic Recording (HAMR)

TEM Observation of Deformation under Nanoindentation in Single Crystal Ni-based Superalloys

HAADF imaging of the omega (ω) phase in a gum metal-related alloy

Transmission Electron Microscopy (TEM) Study of the Oxide Layers Formed on Fe-12Cr-4Al Ferritic Alloy in an Oxygenated Pb-Bi Environment at 800°C

Depth-resolved charge reconstruction at the LaNiO3/CaMnO3 interface

In-situ Raman Spectroscopy in a TEM

L10 FePt films with high T capping layer for Heat Assisted Magnetic Recording (HAMR)

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

The effect of film thickness on Curie temperature distribution and magnetization reversal mechanism for granular L1 0 FePt films

Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy

Multiscale analysis of nanoindentation-induced defect structures in gum metal

Exploring the structural and electronic properties of nanowires at their mechanical limits

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Study of coherence strain of GP II zones in an aged aluminum composite

Study of coherence strain of GP II zones in an aged aluminum composite

A nondamaging electron microscopy approach to map In distribution in InGaN light-emitting diodes

Correlating the structural, chemical, and optical properties at nanometer resolution

Strain mapping for advanced CMOS technologies

Depth-resolved charge reconstruction at the LaNi O 3 / CaMn O 3 interface

Depth-resolved charge reconstruction at the LaNi O 3/CaMn O 3 interface

Strain Mapping of 45 nm MOSFET by Dark-Field Inline Electron Holography

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