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Mechanism for correlation in a coherent electron beam

Microscopy, 2019-04, Vol.68 (2), p.133-143

2019

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Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

Applied physics letters, 2015-02, Vol.106 (7)

2015

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Two-electron interference in a coherent beam

Microscopy, 2013-06, Vol.62 Suppl 1 (suppl 1), p.S119-S129

2013

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Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1865-1866

2015

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A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and Visualization of Topological Quantum Phenomena

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.262-263

Osakabe, Nobuyuki

2014

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Information transfer of 25.5 nm-1 in a 1-MV field-emission transmission electron microscope

Microscopy, 2016-08, Vol.65 (4), p.378-382

2016

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Special Issue: "Tribute to Akira Tonomura". Foreword

Microscopy, 2013-06, Vol.62 Suppl 1, p.S1-S1

2013

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A1Development of an Aberration corrected 1.2-MV Holography Electron Microscope

Microscopy, 2015-11, Vol.64 (suppl 1), p.i8-i8

2015

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Electron Microscopy Study on Magnetic Flux Lines in Superconductors: Memorial to Akira Tonomura

IEEE transactions on applied superconductivity, 2013-02, Vol.23 (1), p.8000507-8000507

2013

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Development of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1597-1598

2015

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Magnetic field observation of a single flux quantum by electron-holographic interferometry

Physical review letters, 1989-05, Vol.62 (21), p.2519-2522

1989

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Observation of surfaces by reflection electron holography

Microscopy research and technique, 1992-02, Vol.20 (4), p.457-462

Osakabe, Nobuyuki

1992

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Experimental confirmation of Aharonov-Bohm effect using a toroidal magnetic field confined by a superconductor

Physical review. A, General physics, 1986-08, Vol.34 (2), p.815-822

1986

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Fast and precise electron counting system for the observation of quantum mechanical electron intensity correlation

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1995-11, Vol.365 (2), p.585-587

1995

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Observation of Aharonov-Bohm Effect by Electron Holography

Physical review letters, 1982-01, Vol.48 (21), p.1443-1446

1982

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Observation of surface undulation due to single-atomic shear of a dislocation by reflection-electron holography

Physical review letters, 1989-06, Vol.62 (25), p.2969-2972

1989

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Sensitivity-enhanced electron-holographic interferometry and thickness-measurement applications at atomic scale

Physical review letters, 1985-01, Vol.54 (1), p.60-62

1985

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Morphology and structure of biogenic magnetite particles

Nature (London), 1983-03, Vol.302 (5907), p.411-412

1983

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Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopy

Surface science, 1981-01, Vol.102 (2), p.424-442

1981

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Electron holographic interference micrograph of a single magnetic-domain particle

Japanese Journal of Applied Physics, 1995, Vol.34 (6A), p.3294-3297

1995

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Evidence for Aharonov-Bohm effect with magnetic field completely shielded from electron wave

Physical review letters, 1986-02, Vol.56 (8), p.792-795

1986

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Observation of atomic steps by reflection electron holography

Japanese Journal of Applied Physics, 1988-09, Vol.27 (9), p.L1772-L1774

1988

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Observation of recorded magnetization pattern by electron holography

Applied physics letters, 1983-04, Vol.42 (8), p.746-748

1983

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Feasibility of observing two-electron interference

Physical review. A, Atomic, molecular, and optical physics, 1998-04, Vol.57 (4), p.2781-2785

1998

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Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon Surfaces

Japanese Journal of Applied Physics, 1980-01, Vol.19 (6), p.L309

1980

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Mechanism for correlation in a coherent electron beam

Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

Two-electron interference in a coherent beam

Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and Visualization of Topological Quantum Phenomena

Information transfer of 25.5 nm-1 in a 1-MV field-emission transmission electron microscope

Special Issue: "Tribute to Akira Tonomura". Foreword

A1Development of an Aberration corrected 1.2-MV Holography Electron Microscope

Electron Microscopy Study on Magnetic Flux Lines in Superconductors: Memorial to Akira Tonomura

Development of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Magnetic field observation of a single flux quantum by electron-holographic interferometry

Observation of surfaces by reflection electron holography

Experimental confirmation of Aharonov-Bohm effect using a toroidal magnetic field confined by a superconductor

Fast and precise electron counting system for the observation of quantum mechanical electron intensity correlation

Observation of Aharonov-Bohm Effect by Electron Holography

Observation of surface undulation due to single-atomic shear of a dislocation by reflection-electron holography

Sensitivity-enhanced electron-holographic interferometry and thickness-measurement applications at atomic scale

Morphology and structure of biogenic magnetite particles

Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopy

Electron holographic interference micrograph of a single magnetic-domain particle

Evidence for Aharonov-Bohm effect with magnetic field completely shielded from electron wave

Observation of atomic steps by reflection electron holography

Observation of recorded magnetization pattern by electron holography

Feasibility of observing two-electron interference

Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon Surfaces

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