UB Paderborn / Katalog / Suche / in CDI

1 – 19 von 19

Sortiert nach

Electron-Phonon Mass Enhancement in Thermoelectricity

Physical review letters, 1976-01, Vol.36 (20), p.1211-1214

1976

Volltextzugriff (PDF)

Theory of elastic wave scattering: applications of the method of optimal truncation

Journal of applied physics, 1985-08, Vol.58 (3), p.1102-1115

1985

Volltextzugriff (PDF)

Gauge-independent statistical mechanics of free electrons in a magnetic field

Physical review. B, Condensed matter, 1978-01, Vol.17 (1), p.249-253

Opsal, Jon L.

1978

Volltextzugriff (PDF)

Improved calculations of Kapitza resistance: Combined effects of phonon attenuation and impedance matching on Kapitza resistance

Physical review. A, General physics, 1974-01, Vol.9 (5), p.2227-2235

1974

Volltextzugriff (PDF)

Sublimation and Vapor Pressure of Ar 36

Physical review. B, Solid state, 1973-05, Vol.7 (10), p.4682-4686

1973

Volltextzugriff (PDF)

Temperature-dependent magnetoresistance of pure aluminum and dilute Al-Ga and Al-Mg alloys

Physical review. B, Solid state, 1976-01, Vol.13 (2), p.574-582

1976

Volltextzugriff (PDF)

Nondestructive analysis of ultrashallow junctions using thermal wave technology

Review of Scientific Instruments, 2003-01, Vol.74 (1), p.586-588

2003

Volltextzugriff (PDF)

Simultaneous determination of ultra-shallow junction depth and abruptness using thermal wave technique

Review of scientific instruments, 2004-06, Vol.75 (6), p.2144-2148

2004

Volltextzugriff (PDF)

Study of low energy implants for ultrashallow junctions using thermal wave and optical techniques

Review of Scientific Instruments, 2003-01, Vol.74 (1), p.563-565

2003

Volltextzugriff (PDF)

Detection of thermal waves through optical reflectance

Applied physics letters, 1985-06, Vol.46 (11), p.1013-1015

1985

Volltextzugriff (PDF)

A photothermal method of simultaneous determination of ultra-shallow junction depth and abruptness

MRS proceedings, 2004, Vol.810, Article C11.7

2004

Volltextzugriff (PDF)

Beam profile reflectometry : a new technique for dielectric film measurements

Applied physics letters, 1992-03, Vol.60 (11), p.1301-1303

1992

Volltextzugriff (PDF)

Thickness and Topography of Dielectric Dual-Sidewall Spacers on Metal Gate of DRAM Extracted by Spectroscopic Ellipsometry

2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 2007, p.272-277

2007

Volltextzugriff (PDF)

Temporal behavior of modulated optical reflectance in silicon

Journal of applied physics, 1987, Vol.61 (1), p.240-248

1987

Volltextzugriff (PDF)

Multiparameter measurements of thin films using beam-profile reflectometry

Journal of applied physics, 1993-06, Vol.73 (11), p.7035-7040

1993

Volltextzugriff (PDF)

Thin-film thickness measurements with thermal waves

Applied physics letters, 1983-01, Vol.43 (2), p.166-168

1983

Volltextzugriff (PDF)

Detection of thermal waves through modulated optical transmittance and modulated optical scattering

Journal of applied physics, 1986-02, Vol.59 (4), p.1392-1394

1986

Volltextzugriff (PDF)

Comment on ‘‘Spatially resolved defect mapping in semiconductors using laser-modulated thermoreflectance’’ [Appl. Phys. Lett. 4 7 , 1336 (1985)]

Applied physics letters, 1986-08, Vol.49 (5), p.301-301

1986

Volltextzugriff (PDF)

Relaxation of ion implant damage in silicon wafers at room temperature measured by thermal waves and double implant sheet resistance

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1987, Vol.21 (1), p.554-558

1987

Volltextzugriff (PDF)

1 – 19 von 19

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(15)
Mit Volltextzugriff
(18)

Publikationsform

Artikel
(17)
Tagungsberichte
(2)

Sprache

Englisch
(19)
Japanisch
(4)

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Electron-Phonon Mass Enhancement in Thermoelectricity

Theory of elastic wave scattering: applications of the method of optimal truncation

Gauge-independent statistical mechanics of free electrons in a magnetic field

Improved calculations of Kapitza resistance: Combined effects of phonon attenuation and impedance matching on Kapitza resistance

Sublimation and Vapor Pressure of Ar 36

Temperature-dependent magnetoresistance of pure aluminum and dilute Al-Ga and Al-Mg alloys

Nondestructive analysis of ultrashallow junctions using thermal wave technology

Simultaneous determination of ultra-shallow junction depth and abruptness using thermal wave technique

Study of low energy implants for ultrashallow junctions using thermal wave and optical techniques

Detection of thermal waves through optical reflectance

A photothermal method of simultaneous determination of ultra-shallow junction depth and abruptness

Beam profile reflectometry : a new technique for dielectric film measurements

Thickness and Topography of Dielectric Dual-Sidewall Spacers on Metal Gate of DRAM Extracted by Spectroscopic Ellipsometry

Temporal behavior of modulated optical reflectance in silicon

Multiparameter measurements of thin films using beam-profile reflectometry

Thin-film thickness measurements with thermal waves

Detection of thermal waves through modulated optical transmittance and modulated optical scattering

Comment on ‘‘Spatially resolved defect mapping in semiconductors using laser-modulated thermoreflectance’’ [Appl. Phys. Lett. 4 7 , 1336 (1985)]

Relaxation of ion implant damage in silicon wafers at room temperature measured by thermal waves and double implant sheet resistance

Suchergebnisse filtern