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Promising Thermoelectric Properties of Commercial PEDOT:PSS Materials and Their Bi2Te3 Powder Composites

ACS applied materials & interfaces, 2010-11, Vol.2 (11), p.3170-3178

2010

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Understanding the role of buried interface charges in a metal-oxide-semiconductor stack of Ti/Al2O3/Si using hard x-ray photoelectron spectroscopy

Applied physics letters, 2015-04, Vol.106 (17)

2015

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Light-induced anodisation of silicon for solar cell passivation

Journal of applied physics, 2013-11, Vol.114 (18)

2013

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Materials characterization and the evolution of materials

MRS bulletin, 2015-12, Vol.40 (12), p.1019-1034

2015

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Energy level alignment at organic semiconductor/metal interfaces:Effect of polar self-assembled monolayers at the interface

The Journal of chemical physics, 2008-02, Vol.128 (7), p.074705-074705-6

2008

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Quantification of trap state densities in GaAs heterostructures grown at varying rates using intensity-dependent time resolved photoluminescence

Applied physics letters, 2013-05, Vol.102 (18)

2013

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Surface cleaning procedures for thin films of indium gallium nitride grown on sapphire

Applied surface science, 2010-12, Vol.257 (5), p.1469-1472

2010

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Wet Etching and Surface Analysis of Chemically Treated InGaN Films

Journal of the Electrochemical Society, 2011, Vol.158 (6), p.D342

2011

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Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon

Journal of applied physics, 2000-02, Vol.87 (3), p.1322-1330

2000

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Nondestructive compositional depth profiling using variable-kinetic energy hard X-ray photoelectron spectroscopy and maximum entropy regularization

Surface and interface analysis, 2014-06, Vol.46 (6), p.407-417

2014

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Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2010-09, Vol.28 (5), p.1060-1072

2010

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Thin films and interfaces in microelectronics: composition and chemistry as function of depth

Progress in surface science, 2002-01, Vol.69 (4), p.125-163

2002

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Wet chemical cleaning of InP surfaces investigated by in situ and ex situ infrared spectroscopy

Journal of applied physics, 2003-08, Vol.94 (4), p.2707-2715

2003

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Corrosion of RoHS-Compliant Surface Finishes in Corrosive Mixed Flowing Gas Environments

Journal of electronic materials, 2012-03, Vol.41 (3), p.611-623

2012

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The Interaction of Vapor-Deposited Al Atoms with CO2H Groups at the Surface of a Self-Assembled Alkanethiolate Monolayer on Gold

The journal of physical chemistry. B, 2000-04, Vol.104 (14), p.3267-3273

2000

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Role of hydrogen bonding environment in a - Si : H films for c - Si surface passivation

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2008-07, Vol.26 (4), p.683-687

2008

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Chemical Effects of Methyl and Methyl Ester Groups on the Nucleation and Growth of Vapor-Deposited Aluminum Films

Journal of the American Chemical Society, 1999-09, Vol.121 (35), p.8052-8064

1999

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Nucleation and Growth of CdSe on ZnS Quantum Crystallite Seeds, and Vice Versa, in Inverse Micelle Media

Journal of the American Chemical Society, 1990-02, Vol.112 (4), p.1327-1332

1990

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An in-situ X-ray photoelectron study of the interaction between vapor-deposited Ti atoms and functional groups at the surfaces of self-assembled monolayers

Surface science, 1995-09, Vol.338 (1), p.300-312

1995

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Properties of high κ gate dielectrics Gd2O3 and Y2O3 for Si

Journal of applied physics, 2001-04, Vol.89 (7), p.3920-3927

2001

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Photoemission study of Zr- and Hf-silicates for use as high-κ oxides: Role of second nearest neighbors and interface charge

Applied physics letters, 2002-09, Vol.81 (10), p.1788-1790

2002

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Adsorption and Reaction of HfCl4 with H2O-Terminated Si(100)-2 × 1

Journal of physical chemistry. C, 2008-02, Vol.112 (6), p.1994-2003

2008

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TOF-SIMS Analysis of InGaN/GaN for Expected Doping Profiles

ECS journal of solid state science and technology, 2012-01, Vol.1 (4), p.P164-P168

2012

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The Role of Carbonyl Groups in the Photoluminescence of Poly(p-phenylenevinylene)

Chemistry of materials, 1994-09, Vol.6 (9), p.1563-1568

1994

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Reactivity and morphology of vapor-deposited Al/polymer interfaces for organic semiconductor devices

Journal of applied physics, 2008-02, Vol.103 (3)

2008

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Promising Thermoelectric Properties of Commercial PEDOT:PSS Materials and Their Bi2Te3 Powder Composites

Understanding the role of buried interface charges in a metal-oxide-semiconductor stack of Ti/Al2O3/Si using hard x-ray photoelectron spectroscopy

Light-induced anodisation of silicon for solar cell passivation

Materials characterization and the evolution of materials

Energy level alignment at organic semiconductor/metal interfaces:Effect of polar self-assembled monolayers at the interface

Quantification of trap state densities in GaAs heterostructures grown at varying rates using intensity-dependent time resolved photoluminescence

Surface cleaning procedures for thin films of indium gallium nitride grown on sapphire

Wet Etching and Surface Analysis of Chemically Treated InGaN Films

Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon

Nondestructive compositional depth profiling using variable-kinetic energy hard X-ray photoelectron spectroscopy and maximum entropy regularization

Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2

Thin films and interfaces in microelectronics: composition and chemistry as function of depth

Wet chemical cleaning of InP surfaces investigated by in situ and ex situ infrared spectroscopy

Corrosion of RoHS-Compliant Surface Finishes in Corrosive Mixed Flowing Gas Environments

The Interaction of Vapor-Deposited Al Atoms with CO2H Groups at the Surface of a Self-Assembled Alkanethiolate Monolayer on Gold

Role of hydrogen bonding environment in a - Si : H films for c - Si surface passivation

Chemical Effects of Methyl and Methyl Ester Groups on the Nucleation and Growth of Vapor-Deposited Aluminum Films

Nucleation and Growth of CdSe on ZnS Quantum Crystallite Seeds, and Vice Versa, in Inverse Micelle Media

An in-situ X-ray photoelectron study of the interaction between vapor-deposited Ti atoms and functional groups at the surfaces of self-assembled monolayers

Properties of high κ gate dielectrics Gd2O3 and Y2O3 for Si

Photoemission study of Zr- and Hf-silicates for use as high-κ oxides: Role of second nearest neighbors and interface charge

Adsorption and Reaction of HfCl4 with H2O-Terminated Si(100)-2 × 1

TOF-SIMS Analysis of InGaN/GaN for Expected Doping Profiles

The Role of Carbonyl Groups in the Photoluminescence of Poly(p-phenylenevinylene)

Reactivity and morphology of vapor-deposited Al/polymer interfaces for organic semiconductor devices

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