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Dynamics of annular bright field imaging in scanning transmission electron microscopy

Ultramicroscopy, 2010-06, Vol.110 (7), p.903-923

2010

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Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

Applied physics letters, 2009-11, Vol.95 (19), p.191913-191913-3

2009

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Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Ultramicroscopy, 2013-10, Vol.133, p.109-119

2013

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Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.164-165

2009

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Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEM

Micron (Oxford, England : 1993), 2012, Vol.43 (1), p.49-56

2012

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Defect structures in ZnO studied by high-resolution structural and spectroscopic imaging

Ultramicroscopy, 2013-04, Vol.127, p.76-84

2013

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Self-accommodation of B19′ martensite in Ti-Ni shape memory alloys - Part II. Characteristic interface structures between habit plane variants

Philosophical magazine (Abingdon, England), 2012-06, Vol.92 (17), p.2234-2246

2012

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The dissociation of the [a + c] dislocation in GaN

Philosophical magazine (Abingdon, England), 2013-09, Vol.93 (28-30), p.3925-3938

2013

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Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary

Ultramicroscopy, 2011-03, Vol.111 (4), p.285-289

2011

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Transmission electron microscopy of antiphase boundary-like structure of B19′ martensite in Ti–Ni shape memory alloy

Acta materialia, 2011, Vol.59 (1), p.133-140

2011

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Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

Physical review letters, 2014-09, Vol.113 (13), p.135503-135503, Article 135503

2014

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Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1223-1224

2015

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Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.495-496

2015

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Ferric iron in Al-bearing post-perovskite

Geophysical research letters, 2006-06, Vol.33 (12), p.L12S13-n/a

2006

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Development of a high-efficiency DF-STEM detector

Journal of physics. Conference series, 2014-01, Vol.522 (1), p.12050-4

2014

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Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.974-975

2012

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Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy

Journal of applied physics, 2010-06, Vol.107 (12)

2010

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Resolving 45 pm with 300 kV Aberration Corrected STEM

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.124-125

2014

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A dissociation mechanism for the [a+c] dislocation in GaN

Journal of physics. Conference series, 2014-06, Vol.522 (1), p.12037-4

2014

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Spherical aberration corrected STEM studies of Ge nanodots grown on Si(0 01) surfaces with an ultrathin SiO2 coverage

Applied surface science, 2008-09, Vol.254 (23), p.7569-7572

2008

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Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.66-67

2010

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High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound

Philosophical magazine letters, 2007-01, Vol.87 (1), p.59-64

2007

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Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1126-1127

2013

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The XtaLAB Synergy-ED: progress and latest results

Acta crystallographica. Section A, Foundations and advances, 2022-08, Vol.78 (a2), p.e626-e626

2022

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Improvement of shape memory characteristics by precipitation-hardening of TiPdNi alloys

Materials letters, 1998-02, Vol.34 (1), p.23-29

1998

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Dynamics of annular bright field imaging in scanning transmission electron microscopy

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEM

Defect structures in ZnO studied by high-resolution structural and spectroscopic imaging

Self-accommodation of B19′ martensite in Ti-Ni shape memory alloys - Part II. Characteristic interface structures between habit plane variants

The dissociation of the [a + c] dislocation in GaN

Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary

Transmission electron microscopy of antiphase boundary-like structure of B19′ martensite in Ti–Ni shape memory alloy

Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM

Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices

Ferric iron in Al-bearing post-perovskite

Development of a high-efficiency DF-STEM detector

Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy

Resolving 45 pm with 300 kV Aberration Corrected STEM

A dissociation mechanism for the [a+c] dislocation in GaN

Spherical aberration corrected STEM studies of Ge nanodots grown on Si(0 01) surfaces with an ultrathin SiO2 coverage

Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound

Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

The XtaLAB Synergy-ED: progress and latest results

Improvement of shape memory characteristics by precipitation-hardening of TiPdNi alloys

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