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Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and Astigmatism Correction in Scanning Electron Microscopy

Scanning, 2023, Vol.2023, p.7305255-11

2023

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Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation

Scanning, 2021, Vol.2021, p.2226577-11

2021

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Support system for fine focusing and astigmatism correction using an auditory signal in scanning electron microscopy

Microscopy, 2017-06, Vol.66 (3), p.187-197

2017

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Special raster scanning for reduction of charging effects in scanning electron microscopy

Scanning, 2014-05, Vol.36 (3), p.327-333

2014

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Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images

Scanning, 2013-09, Vol.35 (5), p.292-301

2013

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Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

Scanning, 2020, Vol.2020, p.4979431-9

2020

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PM-18 Technology for fundamentally improving an extremely low-quality video signal used for fine focusing and astigmatism correction in scanning electron microscopy

Microscopy, 2019-11, Vol.68 (Supplement_1), p.i43-i43

2019

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PM-17 Noise removal for SEM images using a convolutional neural network

Microscopy, 2019-11, Vol.68 (Supplement_1), p.i43-i43

2019

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PM-16 Fast Scanning Method Applicable as a Standard Acquisition Mode for SEM

Microscopy, 2019-11, Vol.68 (Supplement_1), p.i42-i42

2019

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Special raster scanning for reduction of charging effects in scanning electron microscopy: SRS for Reduction of Charging Effects

Scanning, 2014-05, Vol.36 (3), p.327-333

2014

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Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images: Feature evaluation of complex hysteresis smoothing

Scanning, 2013-09, Vol.35 (5), p.292-301

2013

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Highly accurate SNR measurement using the covariance of two SEM images with the identical view

Scanning, 2012-01, Vol.34 (1), p.43-50

2012

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Digital image-processing technology useful for scanning electron microscopy and its practical applications

Advances in Imaging and Electron Physics, 2002, Vol.122, p.251,I-327,IV

Oho, Eisaku

2002

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Image restoration for TV-scan moving images acquired through a semiconductor backscattered electron detector

Scanning, 2009-11, Vol.31 (6), p.229-235

2009

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Metrics for focusing in extremely noisy scanning electron microscopy condition

Scanning, 2004-05, Vol.26 (3), p.115-121

2004

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Reduction in acquisition time of scanning electron microscopy image using complex hysteresis smoothing

Scanning, 2004-05, Vol.26 (3), p.140-146

Oho, Eisaku

2004

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New generation scanning electron microscopy technology based on the concept of active image processing

Scanning, 1997-10, Vol.19 (7), p.483-488

1997

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Quality Improvement of Environmental Secondary Electron Detector Signal Using Helium Gas in Variable Pressure Scanning Electron Microscopy

Scanning, 2007-09, Vol.29 (5), p.225-229

2007

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Mechanical scanning of the specimen in the scanning electron microscope

Scanning, 2004-09, Vol.26 (5), p.250-255

2004

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A method using an on‐line digital computer for the improvement of resolution of backscattered electron images

Journal of microscopy (Oxford), 1991-11, Vol.164 (2), p.143-152

1991

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An improved scanning method based on characteristics of the human visual system for scanning electron microscopy

Scanning, 2005-07, Vol.27 (4), p.170-175

2005

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Automatic contrast adjustment for detail recognition in SEM images using on-line digital image processing

Scanning, 1992, Vol.14 (6), p.335-344

Oho, Eisaku

1992

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Digital Image Processing Technology for Scanning Electron Microscopy

Advances in Imaging and Electron Physics, 1998, Vol.105, p.77,112a,112b,112c,112d,113-112,112a,112b,112c,112d,140

Oho, Eisaku

1998

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Strategies for optimum use of superposition diffractogram in scanning electron microscopy

Scanning, 2001-09, Vol.23 (5), p.351-356

2001

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Natural color scanning electron microscopy based on the frequency characteristics of the human visual system

Scanning, 2001-01, Vol.23 (1), p.24-31

2001

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Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and Astigmatism Correction in Scanning Electron Microscopy

Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation

Support system for fine focusing and astigmatism correction using an auditory signal in scanning electron microscopy

Special raster scanning for reduction of charging effects in scanning electron microscopy

Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images

Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

PM-18 Technology for fundamentally improving an extremely low-quality video signal used for fine focusing and astigmatism correction in scanning electron microscopy

PM-17 Noise removal for SEM images using a convolutional neural network

PM-16 Fast Scanning Method Applicable as a Standard Acquisition Mode for SEM

Special raster scanning for reduction of charging effects in scanning electron microscopy: SRS for Reduction of Charging Effects

Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images: Feature evaluation of complex hysteresis smoothing

Highly accurate SNR measurement using the covariance of two SEM images with the identical view

Digital image-processing technology useful for scanning electron microscopy and its practical applications

Image restoration for TV-scan moving images acquired through a semiconductor backscattered electron detector

Metrics for focusing in extremely noisy scanning electron microscopy condition

Reduction in acquisition time of scanning electron microscopy image using complex hysteresis smoothing

New generation scanning electron microscopy technology based on the concept of active image processing

Quality Improvement of Environmental Secondary Electron Detector Signal Using Helium Gas in Variable Pressure Scanning Electron Microscopy

Mechanical scanning of the specimen in the scanning electron microscope

A method using an on‐line digital computer for the improvement of resolution of backscattered electron images

An improved scanning method based on characteristics of the human visual system for scanning electron microscopy

Automatic contrast adjustment for detail recognition in SEM images using on-line digital image processing

Digital Image Processing Technology for Scanning Electron Microscopy

Strategies for optimum use of superposition diffractogram in scanning electron microscopy

Natural color scanning electron microscopy based on the frequency characteristics of the human visual system

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