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IEEE transactions on electron devices, 1998-04, Vol.45 (4), p.904-911
1998
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IEEE transactions on electron devices, 1998-02, Vol.45 (2), p.472-481
1998
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1218-1223
2013
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Solid-state electronics, 2012-12, Vol.78, p.151-155
2012
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2021 Symposium on VLSI Technology, 2021, p.1-2
- Weber, O.
- Pigot, C.
- Berthelon, R.
- Gandolfo, A.
- Mattavelli, P.
- Jasse, J.
- Samanni, G.
- Gomiero, E.
- Richard, E.
- Grenier, J. C.
- Ranica, R.
- Chouteau, S.
- Beneyton, R.
- Duclaux, B.
- Beylier, C.
- Pelissier, D.
- Gallon, C.
- Toulouse, C.
- Jenny, C.
- Croisy, M.
- Borowiak, C.
- Haendler, S.
- Ogier, J.L.
- Batail, E.
- Gilibert, F.
- Boivin, P.
- Turgis, D.
- Conte, A.
- Disegni, F.
- Redaelli, A.
- Annunziata, R.
- Cappelletti, P.
- Piazza, F.
- Ferreira, P.
- Arnaud, F.
2021
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Electronics letters, 2010-11, Vol.46 (23), p.1568-1569
2010
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Microelectronics and reliability, 2008-03, Vol.48 (3), p.335-341
2008
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Microelectronics and reliability, 2008, Vol.48 (3), p.335-341
2008
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2014 International Semiconductor Conference (CAS), 2014, p.197-200
2014
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Microelectronics and reliability, 2007-09, Vol.47 (9-11), p.1322-1329
2007
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Microelectronics and reliability, 2007-09, Vol.47 (9), p.1322-1329
2007
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Solid-state electronics, 2008-10, Vol.52 (10), p.1550-1554
2008
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Microelectronics and reliability, 2007-09, Vol.47 (9), p.1609-1613
2007
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2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.18.4.1-18.4.4
- Arnaud, F.
- Zuliani, P.
- Reynard, J.P.
- Gandolfo, A.
- Disegni, F.
- Mattavelli, P.
- Gomiero, E.
- Samanni, G.
- Jahan, C.
- Berthelon, R.
- Weber, O.
- Richard, E.
- Barral, V.
- Villaret, A.
- Kohler, S.
- Grenier, J.C.
- Ranica, R.
- Gallon, C.
- Souhaite, A.
- Ristoiu, D.
- Favennec, L.
- Caubet, V.
- Delmedico, S.
- Cherault, N.
- Beneyton, R.
- Chouteau, S.
- Sassoulas, P.O.
- Vernhet, A.
- Le Friec, Y.
- Domengie, F.
- Scotti, L.
- Pacelli, D.
- Ogier, J.L.
- Boucard, F.
- Lagrasta, S.
- Benoit, D.
- Clement, L.
- Boivin, P.
- Ferreira, P.
- Annunziata, R.
- Cappelletti, P.
2018
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.12-15
2008
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Microelectronics and reliability, 1996-11, Vol.36 (11-12), p.1651-1654
1996
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2009 International Semiconductor Device Research Symposium, 2009, p.1-2
2009
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ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference, 1995, p.299-302
1995
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2007 International Semiconductor Device Research Symposium, 2007, p.1-2
2007
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Proceedings of International Reliability Physics Symposium, 1996, p.44-54
1996
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Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1996, p.1651-1654
1996
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International Electron Devices Meeting. Technical Digest, 1996, p.327-330
1996
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Frontiers in cellular neuroscience, 2019-06, Vol.13, p.260-260
2019
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Biotechnology progress, 2011-01, Vol.27 (1), p.181-190
2011
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The Lancet (British edition), 1983-12, Vol.322 (8363), p.1363-1364
1983
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