Sortiert nach
2015 IEEE International Test Conference (ITC), 2015, p.1-9
2015
Link zum Volltext
Annual ACM IEEE Design Automation Conference: Proceedings of the 38th conference on Design automation, 2001, p.65-70
2001
- Link zum Volltext
Proceedings - International Test Conference, 1997, p.236-245
1997
- Link zum Volltext
Journal of electronic testing, 1998-12, Vol.13 (3), p.239-257
1998
Link zum Volltext
IEEE design and test, 2016-12, Vol.33 (6), p.31-37
2016
- Link zum Volltext
2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID), 2019, p.106-111
2019
- Link zum Volltext
2023 IEEE International Test Conference India (ITC India), 2023, p.1-6
2023
Link zum Volltext
2016 IEEE 25th North Atlantic Test Workshop (NATW), 2016, p.34-37
2016
Link zum Volltext
2019 IEEE International Test Conference India (ITC India), 2019, p.1-5
2019
Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Engineering
- Engineering, Electrical & Electronic
- Built-In Self-Test
- Computer Science
- Circuit Faults
- Design For Testability
- Manufacturing
- Circuit Synthesis
- Circuit Testing
- Compaction
- Computer Science, Hardware & Architecture
- Delay
- Integrated Circuits
- Pins
- Random Access Memory
- Test Synthesis
- Testing
- Application Specific Integrated Circuits
Kollektion
Zeitschrift / Serie