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Fundamental properties of intrinsic gettering of iron in a silicon wafer

Journal of applied physics, 1992-08, Vol.72 (3), p.895-898

1992

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Intrinsic Gettering of Iron Impurities in Silicon Wafers

Japanese Journal of Applied Physics, 1991-12, Vol.30 (12S), p.3580

1991

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Hydrogen effects on oxygen precipitation in Czochralski silicon crystals

Journal of applied physics, 1993-07, Vol.74 (2), p.913-916

1993

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Degradation of metal-oxide-semiconductor devices caused by iron impurities on the silicon wafer surface

Journal of applied physics, 1987-12, Vol.62 (12), p.4933-4935

1987

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A Czochralski Silicon Growth Technique which Reduces Carbon to the Order of 1014 per Cubic Centimeter

Journal of the Electrochemical Society, 1994-08, Vol.141 (8), p.2216-2220

1994

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Catastrophic breakdown in silicon oxides: the effect of Fe impurities at the SiO2-Si interface

Journal of applied physics, 1987-09, Vol.62 (5), p.1960-1963

1987

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Rhabdomyolysis after Infection and Taking a Cold Medicine in a Patient Who was Susceptible to Malignant Hyperthermia

Internal Medicine, 1998, Vol.37(2), pp.169-173

1998

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New carbon related defects formed in nitrogen rich Czochralski silicon crystals

Applied physics letters, 1991-10, Vol.59 (15), p.1890-1892

1991

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Lowering Blood Glucose Concentrations with the Antilipemic Drug Bezafibrate in Moderately Controlled NIDDM

Journal of the Japan Diabetes Society, 1994/01/30, Vol.37(1), pp.17-22

Ohsawa, Akira

1994

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NL10 defects formed in Czochralski silicon crystals

Journal of applied physics, 1990-03, Vol.67 (5), p.2462-2465

1990

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Cytomegalovirus Mononucleosis with Mixed Cryoglobulinemia Presenting Transient Pseudothrombocytopenia

Internal Medicine, 1993, Vol.32(7), pp.598-601

1993

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Reflection electron microscopy observation of the Si-SiO2 interface

Journal of applied physics, 1988-04, Vol.63 (8), p.2637-2640

1988

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Silicon surface roughness-structural observation by reflection electron microscopy

Applied physics letters, 1986-03, Vol.48 (12), p.779-781

1986

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Influence of carbon and oxygen on donor formation at 700 °C in Czochralski-grown silicon

Journal of applied physics, 1982-08, Vol.53 (8), p.5733-5737

1982

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Studies on alpha-fetoprotein produced by renal cell carcinoma

Cancer, 1989-02, Vol.63 (3), p.544-549

1989

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Small-angle neutron scattering from oxygen precipitates in Czochralski-grown silicon crystals

Japanese Journal of Applied Physics, 1987, Vol.26 (1), p.106-111

1987

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Ultraclean technique for silicon wafer surfaces with HNO3-HF systems

Japanese journal of applied physics, 1988, Vol.27 (11), p.L2210-L2212

1988

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Metal Impurities near the SiO2 ‐ Si Interface

Journal of the Electrochemical Society, 1984-12, Vol.131 (12), p.2964-2969

1984

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Cytomegalic Inclusion Disease Presenting Acute Intrahepatic Cholestasis

Internal Medicine, 1992, Vol.31(12), pp.1376-1380

1992

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Modern Developments in Electrocoating Technologies

Journal of Japan Oil Chemists' Society, 1985, Vol.34 (2), p.91-101

OHSAWA, Akira

1985

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Mechanical strength of silicon crystals with oxygen and/or germanium impurities

Applied physics letters, 1992-03, Vol.60 (10), p.1184-1186

1992

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Behavior of Fe Impurity during HCl Oxidation

Journal of the Electrochemical Society, 1995-10, Vol.142 (10), p.3486-3492

1995

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Application of Oligomer to Coating Materials

Journal of Japan Oil Chemists' Society, 1979, Vol.28 (3), p.166-173

OHSAWA, Akira

1979

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Mechanical strength of silicon crystals with oxygen and boron impurities

Applied physics letters, 1991-06, Vol.58 (23), p.2634-2635

1991

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Mechanical strength of Czochralski silicon crystals with carbon concentrations at and below 1015 cm-3

Journal of applied physics, 1993, Vol.73 (1), p.112-117

1993

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Fundamental properties of intrinsic gettering of iron in a silicon wafer

Intrinsic Gettering of Iron Impurities in Silicon Wafers

Hydrogen effects on oxygen precipitation in Czochralski silicon crystals

Degradation of metal-oxide-semiconductor devices caused by iron impurities on the silicon wafer surface

A Czochralski Silicon Growth Technique which Reduces Carbon to the Order of 1014 per Cubic Centimeter

Catastrophic breakdown in silicon oxides: the effect of Fe impurities at the SiO2-Si interface

Rhabdomyolysis after Infection and Taking a Cold Medicine in a Patient Who was Susceptible to Malignant Hyperthermia

New carbon related defects formed in nitrogen rich Czochralski silicon crystals

Lowering Blood Glucose Concentrations with the Antilipemic Drug Bezafibrate in Moderately Controlled NIDDM

NL10 defects formed in Czochralski silicon crystals

Cytomegalovirus Mononucleosis with Mixed Cryoglobulinemia Presenting Transient Pseudothrombocytopenia

Reflection electron microscopy observation of the Si-SiO2 interface

Silicon surface roughness-structural observation by reflection electron microscopy

Influence of carbon and oxygen on donor formation at 700 °C in Czochralski-grown silicon

Studies on alpha-fetoprotein produced by renal cell carcinoma

Small-angle neutron scattering from oxygen precipitates in Czochralski-grown silicon crystals

Ultraclean technique for silicon wafer surfaces with HNO3-HF systems

Metal Impurities near the SiO2 ‐ Si Interface

Cytomegalic Inclusion Disease Presenting Acute Intrahepatic Cholestasis

Modern Developments in Electrocoating Technologies

Mechanical strength of silicon crystals with oxygen and/or germanium impurities

Behavior of Fe Impurity during HCl Oxidation

Application of Oligomer to Coating Materials

Mechanical strength of silicon crystals with oxygen and boron impurities

Mechanical strength of Czochralski silicon crystals with carbon concentrations at and below 1015 cm-3

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