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Applied Geo-Eye Imagery and GIS for Estimating Crop Production Based On Land Suitability in Karangasem Regency, Bali

IOP conference series. Earth and environmental science, 2018-06, Vol.165 (1), p.12025

2018

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Hyaluronic Acid Rectal Spacer Stability during Radiation Therapy for Localized Prostate Cancer: An Intercontinental Study

International journal of radiation oncology, biology, physics, 2023-10, Vol.117 (2), p.e420-e420

2023

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G196(P) Evaluation of a paediatric consultant-led telephone advice service for general practitioners

Archives of disease in childhood, 2016-04, Vol.101 (Suppl 1), p.A104-A105

2016

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In-line defect sampling methodology in yield management: an integrated framework

IEEE transactions on semiconductor manufacturing, 1996-11, Vol.9 (4), p.506-517

1996

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Fabless-foundry partnership: models and analysis of coordination issues

IEEE transactions on semiconductor manufacturing, 1999-02, Vol.12 (1), p.44-52

1999

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In-line yield prediction methodologies using patterned wafer inspection information

IEEE transactions on semiconductor manufacturing, 1998-02, Vol.11 (1), p.40-47

1998

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Effects of defect propagation/growth on in-line defect-based yield prediction

IEEE transactions on semiconductor manufacturing, 1998-11, Vol.11 (4), p.546-551

1998

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Optimal Control of a Single Stage Production System Subject to Random Process Shifts

Operations research, 1997-09, Vol.45 (5), p.713-724

1997

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The prognostic value of percent positive biopsies in intermediate to high risk prostate cancer treated with brachytherapy and supplemental beam radiotherapy

Journal of clinical oncology, 2006-06, Vol.24 (18_suppl), p.4645-4645

2006

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HEAD AND NECK CANCER PATIENT SIMILARITY BASED ON ANATOMICAL STRUCTURAL GEOMETRY

2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 2007, p.1140-1143

2007

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Cost effective reticle quality management strategies in wafer fabs

10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295), 1999, p.254-258

1999

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Optimized sample planning for wafer defect inspection

1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314), 1999, p.43-46

1999

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Critical dimension sample planning for sub-0.25 micron processes

10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295), 1999, p.139-142

1999

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Challenging the paradigm of monitor reduction to achieve lower product costs

10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295), 1999, p.420-425

1999

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Predictive yield modeling for reconfigurable memory circuits

IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168), 1998, p.1-6

1998

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Development Of An Optimal Sampling Strategy For Wafer Inspection

International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM, 1994, p.143-146

1994

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Comprehensive cost-effective photo defect monitoring strategy

2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203), 2001, p.67-70

2001

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Prevalence, Management, and Risk Factors of Asthma Among School-Age Children in Yogyakarta, Indonesia

Journal of asthma and allergy, 2023-01, Vol.16, p.23-32

2023

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Puree sweet potato substitution in wet noodle processing

Journal of physics. Conference series, 2021-04, Vol.1869 (1), p.12061

2021

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Quality and speed trade-offs in manufacturing systems

Proceedings 1992 IEEE International Conference on Robotics and Automation, 1992, p.1145-1149 vol.2

1992

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The new challenge of partial oxidation of methane over Fe2O3/NaY and Fe3O4/NaY heterogeneous catalysts

Heliyon, 2021-11, Vol.7 (11), p.e08305-e08305, Article e08305

2021

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The impact of lot-to-lot and wafer-to-wafer variations on SPC

1997 2nd International Workshop on Statistical Metrology, 1997, p.110-112

1997

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Effects of defect propagation/growth on in-line defect based yield prediction

1997 2nd International Workshop on Statistical Metrology, 1997, p.44-47

1997

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The impact of lot-to-lot and wafer-to-wafer variations on SPC

1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023), 1997, p.P69-P72

1997

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Applied Geo-Eye Imagery and GIS for Estimating Crop Production Based On Land Suitability in Karangasem Regency, Bali

Hyaluronic Acid Rectal Spacer Stability during Radiation Therapy for Localized Prostate Cancer: An Intercontinental Study

G196(P) Evaluation of a paediatric consultant-led telephone advice service for general practitioners

In-line defect sampling methodology in yield management: an integrated framework

Fabless-foundry partnership: models and analysis of coordination issues

In-line yield prediction methodologies using patterned wafer inspection information

Effects of defect propagation/growth on in-line defect-based yield prediction

Optimal Control of a Single Stage Production System Subject to Random Process Shifts

The prognostic value of percent positive biopsies in intermediate to high risk prostate cancer treated with brachytherapy and supplemental beam radiotherapy

HEAD AND NECK CANCER PATIENT SIMILARITY BASED ON ANATOMICAL STRUCTURAL GEOMETRY

Cost effective reticle quality management strategies in wafer fabs

Optimized sample planning for wafer defect inspection

Critical dimension sample planning for sub-0.25 micron processes

Challenging the paradigm of monitor reduction to achieve lower product costs

Predictive yield modeling for reconfigurable memory circuits

Development Of An Optimal Sampling Strategy For Wafer Inspection

Comprehensive cost-effective photo defect monitoring strategy

Prevalence, Management, and Risk Factors of Asthma Among School-Age Children in Yogyakarta, Indonesia

A human-airway-on-a-chip for the rapid identification of candidate antiviral therapeutics and prophylactics

Puree sweet potato substitution in wet noodle processing

Quality and speed trade-offs in manufacturing systems

The new challenge of partial oxidation of methane over Fe2O3/NaY and Fe3O4/NaY heterogeneous catalysts

The impact of lot-to-lot and wafer-to-wafer variations on SPC

Effects of defect propagation/growth on in-line defect based yield prediction

The impact of lot-to-lot and wafer-to-wafer variations on SPC

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